164244 ⎘
Instruments as specified in the subgroups and characterised by the use of optical measuring means; Interferometers; Speckle interferometers, i.e. for detecting changes in speckle pattern detecting deformation from original shape
DETERMINATION OF A CHANGE OF OBJECT'S SHAPE
#2CYLINDRIC DECOMPOSITION FOR EFFICIENT MITIGATION OF SUBSTRATE DEFORMATION WITH FILM DEPOSITION AND ION IMPLANTATION
#3DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD
#4COMPACT SHEAROGRAPHY SYSTEM WITH ADJUSTABLE SHEAR DISTANCE
#5DEFECT INSPECTION APPARATUS
#6Defect inspection device and defect inspection method
#7DETERMINATION OF A TUBE PRESSURE BY MEANS OF LASER INTERFEROMETRY AND APPARATUS HEREFOR
#8DETERMINATION OF A CHANGE OF OBJECT'S SHAPE
#9Displacement measurement device and defect detection device
#10Electronic speckle pattern interferometer (ESPI) for long-range measurement of displacement of materials within hazardous environments
#11Common lens transmitter for motion compensated illumination
#12Component heating sub-systems and methods for laser shearography testing systems
#13Vibration sensing system with wavelength encoding
#14System and method for use in depth characterization of objects
#15Defect detection method and defect detection device
#16Optical interferometry
#17Defect detection method and defect detection apparatus
#18Laser speckle interferometric system and method for mobile devices
#19Determining a propagation velocity for a surface wave
#20Method for photoacoustic tomograpy
#21Low coherence interferometric system for phase stepping shearography combined with 3D profilometry
#22Optical phase extraction system having phase compensation function of closed loop type and three-dimensional image extraction method thereof
#23INTERFEROMETRY-BASED STRESS ANALYSIS
#24Deformation measuring apparatus and deformation measuring method
#25Method and apparatus for detecting the deformation of objects