G01B9/02096 - CPC Classification Index

ClassID:

164245 ⎘

G01B9/02096 - CPC Classification

Classification description:

Instruments as specified in the subgroups and characterised by the use of optical measuring means; Interferometers; Speckle interferometers, i.e. for detecting changes in speckle pattern detecting a contour or curvature

Recent Application in this class:

20210356250

2021-11-18

Surface sensing probe and methods of use

20200025552

2020-01-23

Method and apparatus for remote sensing of objects utilizing radiation speckle

20190145755

2019-05-16

Measuring surface roughness

20180283847

2018-10-04

Vibration measurement device

20170350690

2017-12-07

Defect detection method and defect detection apparatus

20170138722

2017-05-18

Method and apparatus for remote sensing of objects utilizing radiation speckle

20140321734

2014-10-30

Method and apparatus for remote sensing and comparing utilizing radiation speckle

20130155414

2013-06-20

Measuring apparatus including multi-wavelength interferometer

20120044320

2012-02-23

High resolution 3-D holographic camera

#10

20110299064

2011-12-08

Deformation measuring apparatus and deformation measuring method

#11

20110242285

2011-10-06

Imaging system and method using partial-coherence speckle interference tomography

#12

20080154524

2008-06-26

Method and apparatus for remote sensing of objects utilizing radiation speckle

#13

15217396

2017-11-14

Shearogram generation algorithm for moving platform based shearography systems

#14

13593008

2016-01-12

Shearographic inspection system using a laser matrix