ClassID:

166120

G01J2004/001 - CPC Classification

Classification description:

Measuring polarisation of light Devices

Sub-classes:
Recent Application in this class:
#1
20230026636
2023-01-26

Polarization imaging device and method for polarization imaging

#2
20220397459
2022-12-15

Modified Rectangular Wave Polarization Control (MRWPC) System

#3
20220364924
2022-11-17

Method and electronic device for detecting wearing using polarization

#4
20220228914
2022-07-21

Polarimeter and method of determining a state of polarization of an incoming light beam

#5
20210333150
2021-10-28

Polarimetric imaging camera

#6
20210148811
2021-05-20

Systems and methods for detecting thermodynamic phase of clouds with optical polarization

#7
20210088799
2021-03-25

Micro-level polarization scanning and multispectral scanning within an optical objective

#8
20200292705
2020-09-17

Light line triangulation apparatus

#9
20200090329
2020-03-19

Method for imaging biological tissue using polarized Majorana photons

#10
20200064197
2020-02-27

Retardation profile for stress characterization of tubing

#11
20200025990
2020-01-23

Thin-film broadband and wide-angle devices for generating and sampling polarization states

#12
20190256902
2019-08-22

GENE SEQUENCING CHIP, DEVICE AND METHOD

#13
20190181950
2019-06-13

Polarization tracking device, optical receiving device, and polarization tracking method

#14
20190025196
2019-01-24

System for measuring transport properties of materials and related method

#15
20180283948
2018-10-04

Mitigating meniscus effects in vertically oriented circular dichroism spectrometery

#16
20170315050
2017-11-02

Cavity enhanced polarimeter and related methods

#17
20160320238
2016-11-03

Liveness authentication method and apparatus

#18
20160170110
2016-06-16

Thin-film broadband and wide-angle devices for generating and sampling polarization states

#19
20160154156
2016-06-02

Circular polarizing filter and application thereof

#20
20160153915
2016-06-02

Surface inspecting method

#21
20160153894
2016-06-02

Optical element rotation type Mueller-matrix ellipsometer and method for measuring Mueller-matrix of sample using the same

#22
20160061723
2016-03-03

Focused beam scatterometry apparatus and method

#23
20160003677
2016-01-07

Long wave infrared imaging polarimeter, and method of assembly

#24
20150323445
2015-11-12

Cavity enhanced polarimeter and related methods

#25
20150185135
2015-07-02

Method using laser ellipsometry for determining the quality of liquid product containing polyphenols

#26
20140332077
2014-11-13

SUB-WAVELENGTH STRUCTURES, DEVICES AND METHODS FOR LIGHT CONTROL IN MATERIAL COMPOSITES

#27
20130258336
2013-10-03

Optical device, particularly a polarimeter, for detecting inhomogeneities in a sample

#28
15330127
2018-08-14

Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of material deposited at or etched from a working electrode that preferrably comprises non-normal oriented nanofibers

#29
14757232
2018-07-17

Method of obtaining micrographs of transparent or semi-transparent specimens using anisotropic contrast