166142 ⎘
Calibration panel
#2Thermal quality mappings
#3Spatially estimating thermal emissivity
#4Characterizing tropospheric boundary layer thermodynamic and refractivity profiles utilizing selected waveband infrared observations
#5Method and apparatus for calibration of substrate temperature using pyrometer
#6High-accuracy contactless measurement method for measuring temperature of metal thermoforming mold
#7Thermal processing chamber with low temperature control
#8Method of measuring temperature of an object to be measured, dust temperature and dust concentration
#9Passive millimeter wave radiometer system for calibration of infrared cameras
#10Multispectral plasmonic thermal imaging device
#11Multispectral plasmonic thermal imaging device
#12Temperature measurement system for furnaces
#13Detector, correction method and calibration method of detector, detection apparatus and detection system
#14Multispectral plasmonic thermal imaging device
#15Substrate treatment method and substrate treatment apparatus
#16Measuring apparatus for the determination of a temperature of an object, the use thereof and method for the operation thereof, as well as thermotherapy device with such a measuring apparatus
#17Infrared contrasting color emissivity measurement system
#18Thermal cooling member with low temperature control
#19Safety cooking device and method
#20Temperature measurement system for furnaces
#21Radiosonde air temperature measurement correction system and method
#22Explosion-proof thermal imaging system
#23Method of measuring temperature of a heated part
#24Radiation thermometer and thermometry method
#25Method and device for contactlessly determining the temperature of a moving object having an unknown degree of emission
#26Technique for temperature measurement and calibration of semiconductor workpieces using infrared
#27Infrared contrasting color temperature measurement system
#28Temperature measurement device
#29Low temperature measurement and control using low temperature pyrometry
#30Method and apparatus for uniform microwave treatment of semiconductor wafers
#31Method and apparatus for controlled thermal processing
#32Method and system for measuring thermal radiation to determine temperature and emissivity of an object
#33Method and apparatus for determining the emissivity, area and temperature of an object
#34NON-CONTACT THERMAL IMAGING SYSTEM FOR HETEROGENEOUS COMPONENTS
#35Substrate temperature measurement by infrared transmission
#36Thermal imaging system and method