Patents-Review.com
ClassID:

166148 ⎘

G01J2005/0074 - CPC Classification

Classification description:

Radiation pyrometry, e.g. infrared or optical thermometry having separate detection of emissivity

Recent Application in this class:
#1
20240337538
2024-10-10

Visual monitoring method for cross-section temperature fields and radiation characteristics of boiler furnaces by combining radiation images and spectra

 #2
20240244348
2024-07-18

INFRARED IMAGING DEVICE AND FIXED PATTERN NOISE DATA GENERATION METHOD

 #3
20240118139
2024-04-11

ESTIMATION OF THE TEMPERATURE OF A STEEL PRODUCT

 #4
20230392987
2023-12-07

EMISSIVITY INDEPENDENCE TUNING

 #5
20220176455
2022-06-09

Spectral emissivity and temperature measurements of metal powders during continuous processing in powder bed fusion additive manufacturing

 #6
20210396585
2021-12-23

Thermal quality mappings

 #7
20210293625
2021-09-23

Multi-spectral temperature measuring device based on adaptive emissivity model and temperature measuring method thereof

 #8
20210041299
2021-02-11

Characterizing tropospheric boundary layer thermodynamic and refractivity profiles utilizing selected waveband infrared observations

 #9
20200292390
2020-09-17

Apparatus and method for measuring the surface temperature of a substrate

 #10
20190234801
2019-08-01

Multispectral plasmonic thermal imaging device

 #11
20190234800
2019-08-01

Multispectral plasmonic thermal imaging device

 #12
20190226913
2019-07-25

Methods and systems for temperature measurement with machine learning algorithm

 #13
20190212203
2019-07-11

Cavity blackbody radiation source and method of making the same

 #14
20190212202
2019-07-11

Cavity blackbody radiation source and method of making the same

 #15
20190137341
2019-05-09

Multispectral plasmonic thermal imaging device

 #16
20190003897
2019-01-03

Infrared contrasting color emissivity measurement system

 #17
20180283957
2018-10-04

APPARATUS AND METHOD TO MEASURE TEMPERATURE OF 3D SEMICONDUCTOR STRUCTURES VIA LASER DIFFRACTION

 #18
20180253953
2018-09-06

Safety cooking device and method

 #19
20150010038
2015-01-08

Infrared contrasting color temperature measurement system

 #20
20140219312
2014-08-07

Temperature measurement device

 #21
20140008536
2014-01-09

Method for quantifying amorphous content in bulk metallic glass parts using thermal emissivity

 #22
20130120737
2013-05-16

Apparatus and method to measure temperature of 3D semiconductor structures via laser diffraction

 #23
20110235918
2011-09-29

Method for an IR-radiation—based temperature measurement and IR-radiation—based temperature measuring device

 #24
20100292951
2010-11-18

Method and system for measuring thermal radiation to determine temperature and emissivity of an object

 #25
20100256945
2010-10-07

Method and apparatus for determining the emissivity, area and temperature of an object

 #26
20100014555
2010-01-21

Method of measuring in situ differential emissivity and temperature

 #27
20070047615
2007-03-01

Method of measuring in situ differential emissivity and temperature