ClassID:

166300

G01J2009/0257 - CPC Classification

Classification description:

Measuring optical phase difference ; Determining degree of coherence; Measuring optical wavelength by interferometric methods multiple, e.g. Fabry Perot interferometer

Recent Application in this class:
#1
20250146881
2025-05-08

HIGH SPEED OPTICAL FREQUENCY MEASUREMENT DEVICE

#2
20250035490
2025-01-30

DISPERSION MEASUREMENT DEVICE AND METHOD BASED ON FRANSON SECOND-ORDER QUANTUM INTERFERENCE TECHNOLOGY

#3
20250012636
2025-01-09

ASCERTAINMENT OF A WAVEFRONT GRADIENT OF A LIGHT ON THE BASIS OF ANGLE-DEPENDENT TRANSMISSION

#4
20240044709
2024-02-08

LINEAR ARRAY SCANNING BRILLOUIN SCATTERING ELASTIC IMAGING DEVICE

#5
20230327402
2023-10-12

LASER SOURCE, LIDAR SYSTEM AND METHOD FOR CONTROLLING A LASER SOURCE

#6
20230144290
2023-05-11

Device and method for measuring wavelength for laser device

#7
20230025759
2023-01-26

High precision optical locker

#8
20210262862
2021-08-26

Optical frequency measurement device

#9
20190293491
2019-09-26

Process and device including a fixed cavity with a free spectral range for characterizing an optical source

#10
20180266890
2018-09-20

Random wavelength meter

#11
20170122828
2017-05-04

Optical pressure sensor

#12
20160349165
2016-12-01

Interferometric method for measuring a size of particle in the presence of a gap

#13
20160258817
2016-09-08

Random wavelength meter

#14
20160223393
2016-08-04

Cylindrical package

#15
20150020599
2015-01-22

Optical pressure sensor

#16
20120162657
2012-06-28

Coherency Reduction for Bandwidth Measurement

#17
20060256437
2006-11-16

Wavelength filter and wavelength monitor device

#18
20050286599
2005-12-29

Method and apparatus for gas discharge laser output light coherency reduction

#19
20050062976
2005-03-24

Laser monitoring using both the reflected and transmitted interference patterns of an etalon

#20
20050018995
2005-01-27

Wavelength stabilizing apparatus and control method