ClassID:

166127

G01J4/04 - page 2 - CPC Classification

Classification description:

Measuring polarisation of light Polarimeters using electric detection means

Recent Application in this class:
#301
20100315567
2010-12-16

LIQUID CRYSTAL BASED BROADBAND FILTER FOR FAST POLARIZATION IMAGING

#302
20100296039
2010-11-25

Photo-aligned liquid-crystal micropolarimeter array and its manufacturing method

#303
20100271475
2010-10-28

Compact snapshot polarimetry camera

#304
20100259759
2010-10-14

Polarimeter employing a fizeau interferometer

#305
20100220313
2010-09-02

Terahertz-infrared ellipsometer system, and method of use

#306
20100208264
2010-08-19

Polarization monitoring reticle design for high numerical aperture lithography systems

#307
20100157298
2010-06-24

POLARIMETRIC IMAGING APPARATUS

#308
20100149533
2010-06-17

Switchable imaging polarimeter and method

#309
20100128268
2010-05-27

Vectorial polarimetry method and apparatus for analyzing the three-dimensional electromagnetic field resulting from an interaction between a focused illuminating field and a sample to be observed

#310
20100123133
2010-05-20

Spin-polarised charge-carrier device

#311
20100118398
2010-05-13

Method for producing polarisation filters and use of polarisation-sensitive photo-sensors and polarisation-generating reproduction devices

#312
20100118304
2010-05-13

Method for measuring polarization characteristics and measurement apparatus

#313
20100110427
2010-05-06

System and process for analyzing a sample

#314
20100103418
2010-04-29

Apparatus and methods for concentration determination using polarized light

#315
20100103417
2010-04-29

Optical Characteristic Measuring Apparatus, Optical Characteristic Measuring Method, and Optical Characteristic Measuring Unit

#316
20100039646
2010-02-18

POLARIMETRIC IMAGING SYSTEM HAVING A MATRIX OF PROGRAMMABLE WAVEPLATES BASED ON A MATERIAL WITH AN ISOTROPIC ELECTROOPTIC TENSOR

#317
20100038525
2010-02-18

System and method for optically co-registering pixels

#318
20100033815
2010-02-11

Polarization filter utilizing Brewster's angle

#319
20100027008
2010-02-04

On-chip polarimetry for high-throughput screening of nanoliter and smaller sample volumes

#320
20100007882
2010-01-14

Rapid acquisition ellipsometry

#321
20090304235
2009-12-10

METHOD AND DEVICE FOR OBSERVING AN OBJECT

#322
20090296089
2009-12-03

Method and apparatus for determining liquid crystal cell parameters from full mueller matrix measurements

#323
20090290039
2009-11-26

Image processing apparatus that obtains color and polarization information

#324
20090237662
2009-09-24

Real-time, hybrid amplitude-time division polarimetric imaging camera

#325
20090231583
2009-09-17

Local non-perturbative remote sensing devices and method for conducting diagnostic measurements of magnetic and electric fields of optically active mediums

#326
20090135422
2009-05-28

Visualizing birefringent structures in samples

#327
20090128814
2009-05-21

Modulated polarizer-based polarimeter, and method for determining the polarization state of an optical signal

#328
20090119808
2009-05-07

Molecular imaging and nanophotonics imaging and detection principles and systems, and contrast agents, media makers and biomarkers, and mechanisms for such contrast agents

#329
20090116012
2009-05-07

APPARATUS AND METHODS FOR CONCENTRATION DETERMINATION USING POLORIZED LIGHT

#330
20090109437
2009-04-30

Method and device for measuring polarization state and polarization mode dispersion in photonic transmission systems

#331
20090079991
2009-03-26

Optical characteristic measuring apparatus

#332
20090079982
2009-03-26

Method and system for stokes polarization imaging

#333
20090073442
2009-03-19

Local non-perturbative remote sensing devices and method for conducting diagnostic measurements of magnetic and electric fields of optically active mediums

#334
20090066954
2009-03-12

Detector configurations for optical metrology

#335
20090051916
2009-02-26

Measuring apparatus, measuring method, and characteristic measurement unit

#336
20090040522
2009-02-12

Measuring Apparatus and Measuring Method

#337
20090035671
2009-02-05

Adjustment method, exposure method, device manufacturing method, and exposure apparatus

#338
20090033938
2009-02-05

Process and apparatus for measurements of Mueller matrix parameters of polarized light scattering

#339
20080316495
2008-12-25

Optical characteristic measuring apparatus

#340
20080252888
2008-10-16

APPARATUS FOR POLARIZATION-SPECIFIC EXAMINATION, OPTICAL IMAGING SYSTEM, AND CALIBRATION METHOD

#341
20080238791
2008-10-02

Interferometric polarization control

#342
20080231529
2008-09-25

Interferometric polarization control

#343
20080200817
2008-08-21

Electronic polarimetric imaging system for a colposcopy device and an adapter housing

#344
20080170227
2008-07-17

Apparatus and Method for Determining Anisotropies Using Optical Microscopy

#345
20080165359
2008-07-10

Method for enhancing polarimeter systems that use micro-polarizers

#346
20080151244
2008-06-26

Optical switching method and optical switch

#347
20080088842
2008-04-17

System and method for imaging through an irregular water surface

#348
20080088841
2008-04-17

Coded aperture imaging photopolarimetry

#349
20080084563
2008-04-10

Polarization evaluation mask, polarization evaluation method, and polarization determination device

#350
20080043226
2008-02-21

Measuring apparatus and a measuring method for measuring a polarization characteristic of an optical system

#351
20080037905
2008-02-14

METHOD AND APPARATUS FOR DETERMINING THE INFLUENCING OF THE STATE OF POLARIZATION BY AN OPTICAL SYSTEM, AND AN ANALYSER

#352
20080029692
2008-02-07

Method and Apparatus for Dual Polarization Imaging

#353
20080018895
2008-01-24

Detector configurations for optical metrology

#354
20080002201
2008-01-03

High-speed polarizing device and high-speed birefringence measuring apparatus and stereoscopic image display apparatus utilizing the polarizing device

#355
20070268490
2007-11-22

Driverless ellipsometer and ellipsometry

#356
20070263218
2007-11-15

Rapid 4-Stokes parameter determination via Stokes filter wheel

#357
20070252991
2007-11-01

Method for determining stokes parameters

#358
20070252986
2007-11-01

Method and device for optical determination of physical properties of features, not much larger than the optical wavelength used, on a test sample

#359
20070241267
2007-10-18

Sensor and polarimetric filters for real-time extraction of polarimetric information at the focal plane

#360
20070241265
2007-10-18

Method and apparatus for dual polarization imaging

#361
20070187604
2007-08-16

Polarization-sensitive quantum well infrared photodetector focal plane array

#362
20070182969
2007-08-09

Method for approximating an influence of an optical system on the state of polarization of optical radiation

#363
20070182967
2007-08-09

Method and apparatus for precision measurement of phase shifts

#364
20070159630
2007-07-12

Beam profile ellipsometer with rotating compensator

#365
20070146723
2007-06-28

Interferometric polarization control

#366
20070146706
2007-06-28

Broadband ellipsometer / polarimeter system

#367
20070146632
2007-06-28

Advanced polarization imaging method, apparatus, and computer program product for retinal imaging, liquid crystal testing, active remote sensing, and other applications

#368
20070133005
2007-06-14

Optical apparatus having a polarization splitter and multiple interferometers

#369
20070127024
2007-06-07

Polarization evaluation mask, polarization evaluation method, and polarization determination device

#370
20070046922
2007-03-01

Exposure apparatus and device fabrication method

#371
20070041014
2007-02-22

Simultaneous 4-stokes parameter determination using a single digital image

#372
20070034803
2007-02-15

Method and apparatus for real-time polarization difference imaging (PDI) video

#373
20070030551
2007-02-08

Imaging polarimetry

#374
20070030485
2007-02-08

Multiple beam ellipsometer

#375
20070002321
2007-01-04

Method and system for determining a polarization dependent characteristics of optical and opto-electrical devices

#376
20060279741
2006-12-14

Optical characteristic measuring apparatus

#377
20060262307
2006-11-23

Fiber polarimeter, the use thereof, as well as polarimetric method

#378
20060238759
2006-10-26

Spectroscopic polarimetry

#379
20060215879
2006-09-28

Real-time image detection using polarization data

#380
20060215158
2006-09-28

Method and apparatus for analyzing optical characteristics of optical medium and method for production monitoring

#381
20060210911
2006-09-21

Exposure apparatus and device manufacturing method

#382
20060209413
2006-09-21

Chip-scale optical spectrum analyzers with enhanced resolution

#383
20060193044
2006-08-31

Conical refraction polarimeter

#384
20060192961
2006-08-31

Method and apparatus for determination of source polarization matrix

#385
20060192960
2006-08-31

Polarization detection

#386
20060187451
2006-08-24

Phase-shifting test mask patterns for characterizing illumination polarization balance in image forming optical systems

#387
20060176558
2006-08-10

Polarization filter utilizing Brewster's angle

#388
20060170932
2006-08-03

Measuring apparatus and measuring method

#389
20060170921
2006-08-03

Spectroscopic polarimetry

#390
20060164652
2006-07-27

Method and apparatus for measuring polarization mode dispersion

#391
20060164643
2006-07-27

Multispectral, multifusion, laser-polarimetric optical imaging system

#392
20060159452
2006-07-20

Polarization resolving heterodyne optical receiver

#393
20060132806
2006-06-22

Parametric profiling using optical spectroscopic systems to adjust processing parameter

#394
20060103844
2006-05-18

Beam profile ellipsometer with rotating compensator

#395
20060066868
2006-03-30

Detector configurations for optical metrology

#396
20060050273
2006-03-09

Method of producing polarizers for polarized optical probes

#397
20060038999
2006-02-23

Polarization conversion unit for reducing polarization dependent measurement errors

#398
20060033914
2006-02-16

Multiple beam ellipsometer

#399
20060033019
2006-02-16

Polarization state detecting system, light source, and exposure apparatus

#400
20060012789
2006-01-19

Ellipsometer, measurement device and method, and lithographic apparatus and method

#401
20060012788
2006-01-19

Ellipsometer, measurement device and method, and lithographic apparatus and method

#402
20060000974
2006-01-05

Polarization and wavelength-selective patch-coupled infrared photodetector

#403
20050279921
2005-12-22

Polarization sensitive solid state image sensor including integrated photodetector and polarizing assembly and associated methods

#404
20050264813
2005-12-01

Multi-wavelength imaging system

#405
20050254039
2005-11-17

Polarization state measuring apparatus

#406
20050243314
2005-11-03

Polarized optical probes

#407
20050225761
2005-10-13

Simultaneous 4-stokes parameter determination using a single digital image

#408
20050213104
2005-09-29

Optical analyzers of polarization properties

#409
20050206879
2005-09-22

Lithographic apparatus and methods for use thereof

#410
20050174573
2005-08-11

Imaging spectrometer

#411
20050163365
2005-07-28

Apparatus and method of information extraction from electromagnetic energy based upon multi-characteristic spatial geometry processing

#412
20050162741
2005-07-28

Arbitrary and endless polarization controller and polarization-mode dispersion compensator using the same and arbitrary and endless polarization controlling method

#413
20050157295
2005-07-21

Ellipsometry system and method using spectral imaging

#414
20050146789
2005-07-07

Apparatus for polarization-specific examination, optical imaging system, and calibration method

#415
20050128481
2005-06-16

System and method for measuring birefringence in an optical material

#416
20050105089
2005-05-19

Detector configurations for optical metrology

#417
20050094143
2005-05-05

Polarization measuring apparatus

#418
20050051712
2005-03-10

Optical module with built-in wavelength locker

#419
20050036143
2005-02-17

Reference calibration of metrology instrument

#420
20050018189
2005-01-27

Photopolarimeters and spectrophotopolarimaters with multiple diffraction gratings

#421
20050007591
2005-01-13

Instantaneous polarization measurement system and method

#422
20050002033
2005-01-06

Multiple beam ellipsometer

#423
19198843
2026-05-12

Underwater point source polarized light detection device and heading angle measurement method

#424
18375889
2024-12-10

Systems and methods of acquiring polarization information

#425
17969666
2025-02-25

Method, use, device, electronic equipment and storage medium for measuring polarization uniformity of non-uniformly totally polarized beams

#426
17733227
2024-10-22

System and method of utilizing polarized light for remote optical characterization of and through scattering media

#427
17519423
2023-10-03

Systems and methods of acquiring polarization information

#428
16501536
2020-04-21

Systems and methods for producing a more uniform intensity wavelength dispersed beam of electromagnetic radiation entering a multielement detector, while maintaining information content therein

#429
15932748
2019-01-08

Method to analyze spectroscopic ellipsometry or intensity data of porous samples utilizing the anisotropic bruggeman-effective medium theory

#430
15878535
2020-10-27

Temporally multiplexed LADAR polarimeter

#431
15784309
2018-11-13

Faraday rotator device

#432
15731298
2018-05-22

Method to analyze spectroscopic ellipsometry data of porous samples utilizing the anisotropic Bruggeman-effective medium theory

#433
15330430
2018-11-20

Reflectometer, spectrophometer, ellipsometer and polarimeter system with a super continuum laser-source of a beam of electromagnetism and improved detector system

#434
15330353
2018-09-04

Information maintenance, intensity attenuation, and angle/plane of incidence control in electromagentic beams

#435
15214814
2017-02-21

Single wavelength ellipsometry with improved spot size capability

#436
15137558
2016-10-04

System and method for characterizing polarimetric response of a remote sensing instrument

#437
14999748
2018-04-24

Method of characterizing a beam of electromagnetic radiation in ellipsometer and the like systems

#438
14757280
2019-04-02

Enhanced detector operation made possible by application of a functional plurality of gratings and combination dichroic beam splitter-prisms

#439
14757232
2018-07-17

Method of obtaining micrographs of transparent or semi-transparent specimens using anisotropic contrast

#440
14756345
2018-10-16

Birefringence imaging chromatography based on highly ordered 3D nanostructures

#441
14545816
2017-12-26

Integrated mid-infrared, far infrared and terahertz optical Hall effect (OHE) instrument, and method of use

#442
14545786
2016-06-07

System for determining average ellipsometric parameters for planar or non-planar shaped objects, and method of its use

#443
14545713
2019-02-19

Operation of an electromagnetic radiation focusing element

#444
14306521
2016-06-07

System and method for characterizing polarimetric response of a remote sensing instrument

#445
13494866
2015-06-23

Birefringence correction for imaging ellipsometric bioassay system and method