ClassID:

166634

G01L5/0047 - CPC Classification

Classification description:

Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes measuring forces due to residual stresses

Recent Application in this class:
#1
20260153393
2026-06-04

METHOD FOR ANALYZING POST-ASSEMBLY RESIDUAL STRESSES IN MICROWAVE ASSEMBLY

#2
20260079059
2026-03-19

CALCULATION METHOD, CALCULATION DEVICE, AND CALCULATION PROGRAM OF RESIDUAL STRESS DISTRIBUTION

#3
20250224290
2025-07-10

Method for Measuring Residual Stress in Thin Plate

#4
20240264060
2024-08-08

SYSTEMS AND METHODS FOR ANALYSIS OF MATERIAL PROPERTIES OF COMPONENTS AND STRUCTURES USING MACHINING PROCESSES TO ENABLE STRESS RELIEF IN THE MATERIAL UNDER TEST

#5
20230324316
2023-10-12

MEASUREMENT SYSTEM AND MEASUREMENT METHOD

#6
20230304876
2023-09-28

Method for measuring residual stress

#7
20230098763
2023-03-30

COUPLING MEMBER AND MEASUREMENT SYSTEM

#8
20230088293
2023-03-23

Residual stress measurement method of curved surface block

#9
20230078198
2023-03-16

ILLUMINATION TECHNIQUES FOR ADDITIVE FABRICATION AND METHODS

#10
20230016175
2023-01-19

Method for internal stress regulation in superalloy disk forgings by pre-spinning

#11
20220381633
2022-12-01

Systems and methods for analysis of material properties of components and structures using machining processes to enable stress relief in the material under test

#12
20220018724
2022-01-20

Measuring method of residual stress distribution, calculating method of same, and program

#13
20210389195
2021-12-16

Ultrasonic test device and test method for service stress of a moving mechanical component

#14
20210172845
2021-06-10

Analysis of material properties of internal surfaces using machining processes to enable stress relief in the material under test

#15
20200284671
2020-09-10

METHOD FOR DETECTING AN ANOMALY OF A ROLLING EQUIPMENT EXPLOITING A DEFORMATION SIGNAL FROM A RAIL SUPPORT

#16
20200191670
2020-06-18

Residual stress detection device and detection method thereof

#17
20200181752
2020-06-11

High temperature imaging media for digital image correlation

#18
20200158585
2020-05-21

Non-destructive detecting method for weld residual stress and a probe using the same

#19
20200120870
2020-04-23

Biomass impact sensor having a conformal encasement enveloping a pressure sensitive film

#20
20190369566
2019-12-05

Techniques for force sensing in additive fabrication and related systems and methods

#21
20190366636
2019-12-05

Techniques for directing light from a movable stage in additive fabrication and related systems and methods

#22
20190366634
2019-12-05

Multi-film containers for additive fabrication and related systems and methods

#23
20190366630
2019-12-05

Film tensioning techniques for additive fabrication and related systems and methods

#24
20190366623
2019-12-05

Techniques for producing a flat film surface in additive fabrication and related systems and methods

#25
20190353582
2019-11-21

Process-induced distortion prediction and feedforward and feedback correction of overlay errors

#26
20190228129
2019-07-25

Method for calculating processing parameters for residual stress control by parameter inversion

#27
20190139336
2019-05-09

Nut, in particular wheel or axle nut, washer, control device for wheel or axle nuts in vehicles and vehicle provided therewith

#28
20190041758
2019-02-07

METHODS OF DETERMINING A MECHANICAL PROPERTY OF A LAYER APPLIED TO A SUBSTRATE, CONTROL SYSTEM FOR A LITHOGRAPHIC APPARATUS AND LITHOGRAPHIC APPARATUS

#29
20180364111
2018-12-20

System for nondestructive residual stress profiling using inductive sensing

#30
20180259406
2018-09-13

Electronic force dynamometer and control system

#31
20180231499
2018-08-16

Fixed value residual stress test block and manufacturing and preservation method thereof

#32
20180202872
2018-07-19

Optical method and arrangement for measuring residual stresses, in particular in coated objects

#33
20180164169
2018-06-14

Stress measurement method and system for optical materials

#34
20180164164
2018-06-14

Thin film material residual stress testing structure and method

#35
20180045639
2018-02-15

Vitreous silica crucible and evaluation method of the same

#36
20180045592
2018-02-15

Residual stress estimation method and residual stress estimation device

#37
20180038750
2018-02-08

Residual stress estimation method and residual stress estimation device

#38
20180010205
2018-01-11

RESIDUAL STRESS EVALUATION METHOD

#39
20170305529
2017-10-26

Fastener Status Detection System

#40
20170256105
2017-09-07

Nut, in particular wheel or axle nut, washer, control device for wheel or axle nuts in vehicles and vehicle provided therewith

#41
20170241925
2017-08-24

Method and apparatus for testing residual stress in coatings

#42
20170199092
2017-07-13

Evaluation method for bulk silicon carbide single crystals and reference silicon carbide single crystal used in said method

#43
20170191887
2017-07-06

Apparatus and method for measuring residual torsions on an elongated element

#44
20160313234
2016-10-27

Vitreous silica crucible and distortion-measuring apparatus for the same

#45
20160273979
2016-09-22

Residual stress measuring method

#46
20160245668
2016-08-25

Detection compensation of mechanical stresses

#47
20160103114
2016-04-14

Stress history measurement method and stress sensor

#48
20160103026
2016-04-14

Measuring device and method for ascertaining a pressure map

#49
20160033452
2016-02-04

Fixed value residual stress test block and manufacturing and preservation method thereof

#50
20150219444
2015-08-06

Method and apparatus for determining residual stresses of a component

#51
20150177082
2015-06-25

Force sensor and robot having force sensor

#52
20150120216
2015-04-30

Process-induced distortion prediction and feedforward and feedback correction of overlay errors

#53
20150008908
2015-01-08

Apparatus and method for measuring properties of a ferromagnetic material

#54
20140330525
2014-11-06

System and method for predicting distortion of a workpiece resulting from a peening machine process

#55
20130135620
2013-05-30

SYSTEMS AND METHODS FOR NON-INVASIVE TESTING OF ELECTROMECHANICAL SYSTEMS DEVICES

#56
20130091955
2013-04-18

Method and apparatus for measuring residual stresses in a component

#57
20130044864
2013-02-21

X-ray diffraction instrument

#58
20120314202
2012-12-13

Polariscope stress measurement tool and method of use

#59
20120253702
2012-10-04

Internal residual stress calculating device, non-transitory computer-readable medium, and internal residual stress calculating method

#60
20120205756
2012-08-16

Semiconductor device and method of testing the same

#61
20120193734
2012-08-02

Stress sensor for in-situ measurement of package-induced stress in semiconductor devices

#62
20120182595
2012-07-19

Photonic MEMS and structures

#63
20120176598
2012-07-12

Apparatus and method for quantifying residual stress of a birefringent material

#64
20120143524
2012-06-07

Determination of strain components for different deformation modes using a filter

#65
20120050747
2012-03-01

Non-destructive stress profile determination in chemically tempered glass

#66
20110315985
2011-12-29

SENSOR-FITTED SUBSTRATE AND METHOD FOR PRODUCING SENSOR-FITTED SUBSTRATE

#67
20110265578
2011-11-03

Local stress measurement

#68
20110075387
2011-03-31

Strain Measurement Chips For Printed Circuit Boards

#69
20110037907
2011-02-17

Controller and driver features for bi-stable display

#70
20110033103
2011-02-10

Glass container stress measurement using fluorescence

#71
20110032510
2011-02-10

Glass stress measurement using fluorescence

#72
20110027919
2011-02-03

Measurement and control of strained devices

#73
20100313677
2010-12-16

Strain gauge rosette for internal stress measurement

#74
20100224006
2010-09-09

Internal Stress Actuated Micro- and Nanomachines for Testing Physical Properties Of Micro and Nano-Sized Material Samples.

#75
20100154555
2010-06-24

Apparatus for measuring a mechanical quantity

#76
20100057381
2010-03-04

IMPOSING AND DETERMINING STRESS IN SUB-MICRON SAMPLES

#77
20090219604
2009-09-03

Photonic MEMS and structures

#78
20090217767
2009-09-03

Measurement of Stress in Coatings Using a Piezoelectric Actuator

#79
20090180103
2009-07-16

Apparatus for measuring residual stress of optical fiber

#80
20090122036
2009-05-14

Controller and driver features for bi-stable display

#81
20090024335
2009-01-22

Method, System, and computer program product for calculating the residual stress equilibrium of two concentric cylinders coldworked by a loading-unloading expansion process

#82
20090007686
2009-01-08

Apparatus for measuring a mechanical quantity

#83
20080291423
2008-11-27

Apparatus for controlling optical fringe generation member based on detected optical fringe and method therefor

#84
20080250863
2008-10-16

Piezoelectric sensor based smart-die structure for predicting the onset of failure during die casting operations

#85
20080239315
2008-10-02

Apparatus and method for determining stress in solar cells

#86
20080234970
2008-09-25

System and method for measuring residual stress

#87
20080191978
2008-08-14

APPARATUS FOR DRIVING MICROMECHANICAL DEVICES

#88
20080123079
2008-05-29

Residual stress measuring method and system

#89
20080111987
2008-05-15

Surface form measuring apparatus and stress measuring apparatus and surface form measuring method and stress measuring method

#90
20080111565
2008-05-15

Concept of compensating for piezo influences on integrated circuitry

#91
20080087105
2008-04-17

Process condition measuring device and method for measuring shear force on a surface of a substrate that undergoes a polishing or planarization process

#92
20080086276
2008-04-10

Stress component measurement method

#93
20080084552
2008-04-10

Stress measurement method

#94
20080067619
2008-03-20

Stress sensor for in-situ measurement of package-induced stress in semiconductor devices

#95
20080047347
2008-02-28

ULTRASONIC STRESS MEASURING APPARATUS

#96
20070273865
2007-11-29

Stress measuring method and instrument

#97
20070227258
2007-10-04

Stress measuring method and system

#98
20070216427
2007-09-20

Method and apparatus for predicting the reliability of electronic systems

#99
20070180919
2007-08-09

Characterizing curvatures and stresses in thin-film structures on substrates having spatially non-uniform variations

#100
20070177129
2007-08-02

System and method for providing residual stress test structures

#101
20070151356
2007-07-05

Apparatus for measuring a mechanical quantity

#102
20070146376
2007-06-28

Systems and methods of controlling micro-electromechanical devices

#103
20070070327
2007-03-29

Moiré interferometric strain sensor

#104
20070044568
2007-03-01

Strain measurement method and device

#105
20070023944
2007-02-01

Thermal forming

#106
20070017296
2007-01-25

Method for whole field thin film stress evaluation

#107
20060289652
2006-12-28

Binary code symbol for non-linear strain measurement and apparatus and method for analyzing and measuring strain therewith

#108
20060284877
2006-12-21

Photonic MEMS and structures

#109
20060276977
2006-12-07

Techniques and devices for characterizing spatially non-uniform curvatures and stresses in thin-film structures on substrates with non-local effects

#110
20060274074
2006-12-07

Display device having a movable structure for modulating light and method thereof

#111
20060262126
2006-11-23

Transparent thin films

#112
20060250337
2006-11-09

Photonic MEMS and structures

#113
20060231622
2006-10-19

PRINTED CIRCUIT BOARD WITH INTEGRAL STRAIN GAGE

#114
20060189201
2006-08-24

Printed circuit board with integral strain gage

#115
20060123919
2006-06-15

Determining film stress from substrate shape using finite element procedures

#116
20060113473
2006-06-01

Method and apparatus for measuring the physical properties of micro region

#117
20060033975
2006-02-16

Photonic MEMS and structures

#118
20060028205
2006-02-09

Measurement of residual and thermally-induced stress in a rail

#119
20060021453
2006-02-02

Embedded strain gauge in printed circuit boards

#120
20050286113
2005-12-29

Photonic MEMS and structures

#121
20050278126
2005-12-15

Techniques for analyzing non-uniform curvatures and stresses in thin-film structures on substrates with non-local effects

#122
20050263760
2005-12-01

Semiconductor structure comprising a stress sensitive element and method of measuring a stress in a semiconductor structure

#123
20050252311
2005-11-17

Integrated strain gages for board strain characterization

#124
20050237818
2005-10-27

Plating internal stress measurement program and plating internal stress measurement system

#125
20050162160
2005-07-28

Concept of compensating for piezo influences on integrated circuitry

#126
20050120807
2005-06-09

Method and apparatus for detecting the strain levels imposed on a circuit board

#127
18643033
2026-05-12

Systems and methods for rapid force-based measurements of residual stress

#128
16351977
2020-04-21

Strain gauge driving piezoelectric device