167742 ⎘
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance Carrier modulation in semiconductors
Method for testing lifetime of surface state carrier of semiconductor
#2FIELD-BIASED NONLINEAR OPTICAL METROLOGY USING CORONA DISCHARGE SOURCE
#3Photoelectric conversion element evaluation apparatus
#4Method and device for characterising a fluid medium using a semi-conductive substrate
#5Method and device for characterising a fluid medium using a photoelectric transducer
#6Dual-phase interferometry for charge modulation mapping in ICS
#7Pump probe measuring device
#8Method for determining the doping profile of a partially activated doped semiconductor region
#9System and method for nondestructively measuring concentration and thickness of doped semiconductor layers
#10Methods for depth profiling in semiconductors using modulated optical reflectance technology
#11High resolution wafer inspection system
#12METHOD FOR DETERMINING THE DOPING PROFILE OF A PARTIALLY ACTIVATED DOPED SEMICONDUCTOR REGION
#13Measuring method, arrangement and software product
#14High resolution wafer inspection system
#15Inline stress evaluation in microstructure devices
#16Methods for depth profiling in semiconductors using modulated optical reflectance technology
#17Modulated scatterometry
#18Combined modulated optical reflectance and electrical system for ultra-shallow junctions applications
#19Using a polaron interaction zone as an interface to integrate a plasmon layer and a semiconductor detector
#20Utilizing an integrated plasmon detector to measure a metal deposit roughness on a semiconductor surface
#21Modulated scatterometry