STARK EFFECT POLARIZATION SPECTROSCOPY AND METHODS

METHOD AND APPARATUS FOR DETERMINING SURFACE WAVE DATA IN LIQUIDS

MEASUREMENT APPARATUS AND METHOD BASED ON PHOTON NUMBER RESOLVING DETECTOR

PHASE MASKING FOR POLARIZATION AND OPTICAL SIGNAL CONTROL IN OPTICAL INSPECTION SYSTEMS

IMAGING ELEMENT, IMAGING DEVICE, IMAGING SYSTEM, ASSOCIATED ANALYSIS METHOD AND MANUFACTURING METHOD

OPTICAL INSPECTION APPARATUS

Method for fabricating a liquid-crystal-based electro-optical light modulator using surface MEMS techniques for flat panel display inspection

CONDUCTIVE AND TRANSPARENT INTERCONNECTION STRUCTURE, ASSOCIATED MANUFACTURING METHOD AND SYSTEM

Device and method for analyzing a material

Optical inspection apparatus

Method and device for determining the concentration of analytes in whole blood

ELECTRICALLY-MODULATED SURFACE WAVES AND AN ELECTRODE INTERFACE COMPRISING A METALLIC BILAYER

Apparatus for analyzing and detecting interactions and reactions of molecules

Apparatus, systems and methods for integrative photo-optical/mechanical test for noncontact measurement of polymerization

FIELD-BIASED NONLINEAR OPTICAL METROLOGY USING CORONA DISCHARGE SOURCE

Electrically-Modulated Biosensors Using Electro-Active Waveguides

Apparatus, systems and methods for integrative photo-optical/mechanical test for noncontact measurement of polymerization

Genetically encoded red fluorescent voltage sensors enabling millivolt-resolution and high-speed neural voltage imaging

Device and method for analyzing a material

Device and method for analyzing a material

Optical methods for obtaining digital data to be used in determining, shaping or testing of semiconductor or anisotropic materials, or devices, under test through all stages of manufacture or development

Method and device for drug screening

Methods for obtaining and analyzing digital interferometric data for computer testing and developing semiconductor and anisotropic devices and materials

Multiple beam transmission interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor and anisotropic devices

Method and device for analysis of a fluid by means of evanescence field spectroscopy and dielectrophoresis

Multiple optical wavelength interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor devices and materials, wafers, and monitoring all phases of development and manufacture

Method and apparatus for simultaneous spectroelectrochemical analysis

Optical sensor and method for detecting molecules

High frequency deflection measurement of IR absorption

Optically enhanced holographic interferometric testing methods for the development and evaluation of semiconductor devices, materials, wafers, and for monitoring all phases of development and manufacture

Surface impedance imaging methods and apparatuses

Methods for optically enhanced holographic interferometric testing for test and evaluation of semiconductor devices and materials

Method and apparatus for measuring zeta potential of suspended particles

System for measuring electro-optic coefficient by using interference fringe measurement, and method of measuring electro-optic coefficient by using the system

Microelectronic sensor device for the detection of target particles

Analytical method for optical measurement

Characterization of non-linear optical materials using bragg coupling

Optical measuring device

Method and apparatus for enhancing waveguide sensor signal

Method for optically testing semiconductor devices

Surface-plasmon-resonance sensing technique using electro-optic modulation

Method for optically testing semiconductor devices

Non-destructive testing system using a laser beam

Super resolution and fast surface B-field imaging using an NV-diamond