Patents-Review.com
ClassID:

167783 ⎘

G01N2021/212 - CPC Classification

Classification description:

Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems in which incident light is modified in accordance with the properties of the material investigated; Polarisation-affecting properties; Ellipsometry Arrangement with total internal reflection

Recent Application in this class:
#1
20230228673
2023-07-20

Single ion detection method and device

 #2
20210381986
2021-12-09

Total internal reflection enabled wide-field Coherent anti-Stokes Raman scattering microscopy

 #3
20190353584
2019-11-21

Differential polarisation imaging and imaging precision ellipsometry

 #4
20190285542
2019-09-19

Optical sensing device, method of manufacturing the same, and optical sensing method

 #5
20180172578
2018-06-21

Total internal reflection and transmission illumination fluorescence microscopy imaging system with improved background suppression

 #6
20130335741
2013-12-19

Polarization based interferometric detector

 #7
20120129723
2012-05-24

System and method for carrying out multiple binding reactions in an array format

 #8
20120069336
2012-03-22

Intra-cavity ellipsometer system and method

 #9
20120057146
2012-03-08

Surface plasmon resonance sensor using vertical illuminating focused-beam ellipsometer

 #10
20110216320
2011-09-08

Multi-channel surface plasmon resonance sensor using beam profile ellipsometry

 #11
20110109906
2011-05-12

Fast sample height, AOI and POI alignment in mapping ellipsometer or the like

 #12
20100259754
2010-10-14

Method of optimising the sensitivity of a surface plasmon ellipsometry apparatus

 #13
20100183800
2010-07-22

Method and apparatus for measuring optical extinction in a thin film during its deposition

 #14
20090290157
2009-11-26

Apparatus and method for performing ligand binding assays on microarrays in multiwell plates

 #15
20090103093
2009-04-23

Fast sample height, AOI and POI alignment in mapping ellipsometer or the like

 #16
20080207463
2008-08-28

Apparatus and method for performing ligand binding assays on microarrays in multiwell plates

 #17
20080204750
2008-08-28

IMAGE ACQUISITION, PROCESSING, AND DISPLAY

 #18
20080030738
2008-02-07

Analytical method and apparatus

 #19
20080002202
2008-01-03

Polarization based interferometric detector

 #20
20070087348
2007-04-19

System and method for carrying out multiple binding reactions in an array format

 #21
20070058166
2007-03-15

Image acquisition, processing, and display

 #22
20070013912
2007-01-18

Analytical method and apparatus

 #23
20060127278
2006-06-15

System and method of measuring molecular interactions

 #24
20060072115
2006-04-06

Analytical method and apparatus

 #25
20050131650
2005-06-16

Method and system for interaction analysis

 #26
20050105091
2005-05-19

Apparatus and method for imaging

 #27
20050030535
2005-02-10

Microarray scanning

 #28
20050024642
2005-02-03

Imaging method and apparatus

 #29
20050007605
2005-01-13

Analytical method and apparatus

 #30
15732252
2018-09-11

Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, near, mid and far infrared and terahertz optical hall effect (OHE) instrument, and method of use

 #31
13494866
2015-06-23

Birefringence correction for imaging ellipsometric bioassay system and method