167786 ⎘
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems in which incident light is modified in accordance with the properties of the material investigated; Polarisation-affecting properties; Ellipsometry Brewster incidence arrangement
MUELLER MATRIX ELLIPSOMETER
#2Concentration measuring method of optically active substance and concentration measuring device of optically active substance
#3ELLIPSOMETER AND APPARATUS FOR INSPECTING SEMICONDUCTOR DEVICE INCLUDING THE ELLIPSOMETER
#4Angle independent optical surface inspector
#5High-sensitive biosensor chip using high extinction coefficient marker and dielectric substrate, measurement system, and measurement method
#6Biomarker detection apparatus
#7SAMPLE ANALYSIS TOOL EMPLOYING A BROADBAND ANGLE-SELECTIVE FILTER
#8Multiple wavelength ellipsometer system and related method
#9Apparatus and method for measuring a tissue analyte such as bilirubin using the Brewster's angle
#10PRESSURE CONTROL IN CONTINUOUS PLASMA DEPOSITION PROCESSES
#11Transforming metrology data from a semiconductor treatment system using multivariate analysis
#12Polishing end point detection method, polishing end point detection apparatus, and polishing apparatus
#13Method and apparatus for optically characterizing the doping of a substrate
#14Polishing end point detection method, polishing end point detection apparatus and polishing apparatus
#15Transforming metrology data from a semiconductor treatment system using multivariate analysis
#16Surface defect inspection apparatus
#17Analytical method and apparatus
#18Transforming metrology data from a semiconductor treatment system using multivariate analysis
#19Analytical method and apparatus
#20Analytical method and apparatus
#21High-sensitivity reflection measurement apparatus
#22Analytical method and apparatus
#23Reflectometer, spectrophotometer, ellipsometer or polarimeter system including sample imaging system that simultaneously meet the scheimpflug condition and overcomes keystone error