167833 ⎘
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems in which incident light is modified in accordance with the properties of the material investigated; Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands; Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultra-violet light Vacuum UV
Spectroscopy Systems And Methods For Analyzing Liquids At Vacuum Ultraviolet (VUV) Wavelengths
#2Flow Cells And Methods For Analyzing Liquids At Vacuum Ultraviolet (VUV) Wavelengths
#3Apparatus and method for measuring phase of extreme ultraviolet (EUV) mask and method of fabricating EUV mask including the method
#4Apparatus and method for element analysis of materials by means of optical emission spectroscopy
#5Complex spatially-resolved reflectometry/refractometry
#6Apparatus and method for measuring phase of extreme ultraviolet (EUV) mask and method of fabricating EUV mask including the method
#7Determining one or more characteristics of light in an optical system
#8Testing method for residual organic compounds in a liquid sample
#9Mid-infrared spectroscopy for measurement of high aspect ratio structures
#10Extreme ultraviolet radiation in genomic sequencing and other applications
#11Vacuum ultraviolet absorption spectroscopy system and method
#12SPECTROMETER COMPATIBLE VACUUM AMPOULE DETECTION SYSTEM FOR RAPIDLY DIAGNOSING AND QUANTIFYING VIABLE BACTERIA IN LIQUID SAMPLES
#13Gas chromatography with vacuum ultra-violet detector and mass spectrometer or ion mobility spectrometer
#14Complex Spatially-Resolved Reflectometry/Refractometry
#15Vacuum ultraviolet absorption spectroscopy system and method
#16Multidimensional nanotomography with high harmonics and attosecond pulses
#17Modulus-enforced probe
#18Infrared spectroscopic reflectometer for measurement of high aspect ratio structures
#19Extreme ultraviolet radiation in genomic sequencing and other applications
#20Vacuum ultraviolet absorption spectroscopy system and method
#21Vacuum ultraviolet absorption spectroscopy system and method
#22Vacuum ultraviolet absorption spectroscopy system and method
#23Vacuum ultraviolet absorption spectroscopy system and method
#24Vacuum ultraviolet absorption spectroscopy system and method
#25Methods and apparatus for vacuum ultraviolet (VUV) or shorter wavelength circular dichroism spectroscopy
#26Vacuum ultraviolet absorption spectroscopy system and method
#27Device for UV-spectrometric analysis of gaseous compounds
#28Device for UV-spectrometric analysis of gaseous compounds
#29Methods and apparatus for vacuum ultraviolet (VUV) or shorter wavelength circular dichroism spectroscopy
#30Broad band referencing reflectometer
#31Automated calibration methodology for VUV metrology system
#32Optical method and system utilizing operating with deep or vacuum UV spectra
#33Broad band referencing reflectometer
#34Contamination monitoring and control techniques for use with an optical metrology instrument
#35Broad band referencing reflectometer
#36Broad band referencing reflectometer
#37Vacuum ultra-violet reflectometer with stray light correction
#38Vacuum ultraviolet reflectometer integrated with processing system
#39Vacuum ultraviolet reflectometer having collimated beam
#40Broad band referencing reflectometer