167857 ⎘
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems in which incident light is modified in accordance with the properties of the material investigated; Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands; Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers; Measuring reradiation, e.g. fluorescence, backscatter and using a spectral variation of the interaction of the laser beam and the sample
Method and device for simulating a solar spectrum
#2Spectroscopy Device Incorporating a Mid-Infrared Laser
#3FAST SINGLE-MODE SPECTROSCOPY
#4Tunable light source cavity detection using a plurality of axial-plus-transverse modes
#5MEASURING APPARATUS AND SUBSTRATE ANALYSIS METHOD USING THE SAME
#6Laser system with optical feedback
#7Tunable light source cavity detection using a plurality of axial-plus-transverse modes
#8Spectrum inspecting apparatus
#9CHEMICAL MAPPING USING THERMAL MICROSCOPY AT THE MICRO AND NANO SCALES
#10Chemical mapping using thermal microscopy at the micro and nano scales
#11Chemical mapping using thermal microscopy at the micro and nano scales
#12System and method for encoded spatio-spectral information processing
#13System and method for encoded spatio-spectral information processing