167868 ⎘
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems in which incident light is modified in accordance with the properties of the material investigated; Refractivity; Phase-affecting properties, e.g. optical path length Index of thin films
THIN FILM CHARACTERISTIC DIAGNOSIS DEVICE AND THIN FILM CHARACTERISTIC DIAGNOSIS METHOD
#2DIFFUSION DISCRIMINATING GAS SENSORS
#3Method and device for analysing a sample using a resonant support, illuminated by infrared radiation
#4METHOD AND SYSTEM FOR EVALUATION OF AN INTERACTION BETWEEN AN ANALYTE AND A LIGAND USING A BIOSENSOR
#5Method for determining the thickness and refractive index of a layer using a shape feature during analysis
#6Systems and methods for conducting contact-free thickness and refractive-index measurements of intraocular lenses using a self-calibrating dual confocal microscopy
#7Growth rate detection apparatus, vapor deposition apparatus, and vapor deposition rate detection method
#8Prism coupling methods of characterizing stress in glass-based ion-exchanged articles having problematic refractive index profiles
#9Growth-rate measuring apparatus and growth-rate detection method
#10Method and system for evaluation of an interaction between an analyte and a ligand using a biosensor
#11Systems and methods for conducting contact-free thickness and refractive-index measurements of intraocular lenses using a self-calibrating dual confocal microscopy system
#12Apparatus and methods for measuring mode spectra for ion-exchanged glasses having steep index region
#13INTEGRATED COMPUTATIONAL ELEMENTS INCORPORATING A STRESS RELIEF LAYER
#14Systems and methods to improve optical spectrum fidelity in integrated computational elements
#15Prism-coupling systems and methods for characterizing ion-exchanged waveguides with large depth-of-layer
#16Reusable Long Period Microfiber Grating for detection of DNA Hybridization
#17Prism-coupling systems and methods for characterizing large depth-of-layer waveguides
#18Apparatus and methods for measuring mode spectra for ion-exchanged glasses having steep index region
#19Method and apparatus for determining a property of a surface
#20Method and apparatus for supervision of optical material production
#21Diffraction grating coupler, system and method
#22Optical monitor for rugate filter deposition
#23Method of characterizing transparent thin-films using differential optical sectioning interference microscopy
#24Tiled periodic metal film sensors
#25Method and device for three-dimensionally determining the refractive index of transparent or partially transparent layers
#26Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure