167875 ⎘
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems in which incident light is modified in accordance with the properties of the material investigated; Refractivity; Phase-affecting properties, e.g. optical path length Phase distribution
Sub-classes:METHOD, DEVICE, AND INFORMATION PROCESSING PROGRAM FOR DETERMINING NECROSIS CELL REGION
#2MEASURING APPARATUS, MEASURING METHOD, AND MEASURING PROGRAM
#3MICROSCOPE, OBSERVATION METHOD, AND PROGRAM
#4MEASUREMENT CHIP, MEASURING DEVICE AND MEASURING METHOD
#5MICROSCOPE, OBSERVATION METHOD, AND PROGRAM
#6OBSERVATION DEVICE AND OBSERVATION METHOD
#7Estimating phase fraction/distribution with dielectric contrast analysis
#8IMAGING DEVICE AND METHOD FOR IMAGING AN OBJECT USING A MICROSCOPE
#9Wave front reconstruction for dielectric coatings at arbitrary wavelength
#10Deformometer for determining deformation of an optical cavity optic
#11Estimating phase fraction/distribution with dielectric contrast analysis
#12Optical sensor for phase determination
#13Cell image evaluation device, method, and program
#14Methods and devices for analyzing material properties and detecting objects in scattering media
#15Reconstruction of nonlinear wave propagation
#16Optical inspection apparatus and optical inspection method