167901 ⎘
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems in which incident light is modified in accordance with the properties of the material investigated; Scattering, i.e. diffuse reflection; Angular selective; Multiangle measurement Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor
METHODS AND APPARATUS FOR PERFORMING DIFFUSE OPTICAL IMAGING
#2Radiation detector and radiation detection apparatus
#3Thermal compensation
#4Illumination system for recognizing material and method of recognizing material using the same
#5Calibration insert, and mount of the same
#6Thermal compensation
#7Illumination system for recognizing material and method of recognizing material using the same
#8Optical measuring device and optical measuring method
#9Light scattering flow cell device
#10Surface defect inspection method and apparatus
#11Friction-coefficient estimating device and friction-coefficient estimating method
#12Optical measuring device and optical measuring method
#13Surface defect inspection method and apparatus
#14Subject observation apparatus and subject observation method
#15Instrument for measuring particle parameters
#16Light Scattering Methods and Systems Using Supercritical Fluid Solvents to Measure Polymer Molecular Weight and Molecular Weight Distribution
#17Semiconductor wafer inspection device and method
#18Surface defect inspection method and apparatus
#19Methods for using light reflection patterns to determine diving angle of grain
#20Grain angle sensor
#21Automatic sampling and dilution apparatus for use in a polymer analysis system
#22Optical sensor and method for optically inspecting surfaces
#23PHOTOSENSITIVE DIAGNOSTIC DEVICE
#24INSTRUMENT FOR MEASURING PARTICLE PARAMETERS
#25Light scattering and imaging optical system