SYSTEM AND METHOD OF DYNAMIC MICRO-OPTICAL COHERENCE TOMOGRAPHY FOR MAPPING CELLULAR FUNCTIONS

METHODS AND SYSTEMS FOR OPTICAL CHARACTERISATION OF A BULK SCATTERING MEDIUM

CALIBRATION METHOD OF AN ANALYSIS INSTRUMENT FOR ANALYSING THE DIRECTION OF WOOD FIBRES OF A PIECE OF WOOD

SYSTEMS AND METHODS FOR DETECTING CARBURIZATION

BIDIRECTIONAL REFLECTANCE SPECTROSCOPY MEASUREMENT DEVICE FOR TRACE MINERAL SAMPLES OF EXTRATERRESTRIAL OBJECTS

IN-LINE ANGULAR OPTICAL MULTI-POINT SCATTEROMETRY FOR NANOMANUFACTURING SYSTEMS

SYSTEM, ROBOT AND METHOD FOR MEASURING THE COLOR OF AN AREA OF A SAMPLE OR OF A VEHICLE'S PART

OPTICAL FOREIGN SUBSTANCE DETECTION DEVICE USING LIGHT SCATTERING AND IMAGE ANALYSIS

INSTRUMENT AND METHOD FOR MEASURING THE CURVATURE OF A SURFACE OF A SAMPLE

Multi-Parameter Inspection Apparatus for Monitoring of Manufacturing Parts

MEASUREMENT METHOD, MEASUREMENT DEVICE, AND NONTRANSITORY COMPUTER-READABLE MEDIUM

IN-LINE ANGULAR OPTICAL MULTI-POINT SCATTEROMETRY FOR NANOMANUFACTURING SYSTEMS

SYSTEM, ROBOT AND METHOD FOR MEASURING THE COLOR OF AN AREA OF A SAMPLE OR OF A VEHICLE'S PART

Method and system for detecting a defect on a semi-reflective film by illuminating different light sources along the same optical axis

OPTICAL FOREIGN MATTER INSPECTION DEVICE

METHOD AND APPARATUS FOR DETECTING AN AMORPHOUS AND/OR CRYSTALLINE STRUCTURE OF PHOSPHATE AND/OR SULPHATE SALTS ON THE SURFACE OF A SUBSTRATE OR WITHIN A SUBSTRATE

FOAMED GLASS AGGREGATE LAYER COMPACTION

SYSTEM AND METHOD OF DYNAMIC MICRO-OPTICAL COHERENCE TOMOGRAPHY FOR MAPPING CELLULAR FUNCTIONS

Multi-parameter inspection apparatus for monitoring of manufacturing parts using a polarization image detector

SPECTRAL ANALYSIS OF A SAMPLE

Monitoring copper corrosion in an integrated circuit device

METHOD AND DEVICE FOR EXAMINING ROD-SHAPED PRODUCTS OF THE CIGARETTE INDUSTRY

Defect inspection apparatus and defect inspection method

DETECTION OF AN AMORPHOUS AND/OR CRYSTALLINE STRUCTURE OF PHOSPHATE AND/OR SULPHATE SALTS ON THE SURFACE OF A SUBSTRATE OR WITHIN A SUBSTRATE WITH A LWIR IMAGING SYSTEM

Light source intensity control systems and methods for improved light scattering polarimetry measurements

Device and method for monitoring the drying/curing process of coatings

Metrology method

COMPACT IN-LINE NON-CONTACT OPTICAL PROPERTY MEASUREMENT SYSTEM

Multi-parameter inspection apparatus for monitoring of additive manufacturing parts

System, apparatus, and method for detecting microbes

Measurement device, measurement system, measurement program, and measurement method

High-brightness illumination source for optical metrology

Evaluation method for thermal expansion properties of titania-containing silica glass body, and manufacturing method for titania-containing silica glass body

Display apparatus having display panel and humidity detection method thereof and gamma curve calibration method thereof

Systems and methods for monitoring copper corrosion in an integrated circuit device

DEVICE FOR HANDLING AND/OR MACHINING A WORKPIECE, AND METHOD

Apparatus and method for measuring particle on surface of wafer

Optical fiber inspecting device, optical fiber manufacturing apparatus, method for inspecting optical fiber, and method for manufacturing optical fiber

Systems and methods for characterizing high-scatter glass-based samples using light-scattering polarimetry

Scatterometry system and method of using the same

Multi-parameter inspection apparatus for monitoring of manufacturing parts

Portable device for measuring the geometry of an object and its spatially varying surface reflectance on site

Cure monitoring systems and methods

Surface measurement system

Information processing apparatus, method of deriving reflection characteristics, program, and reflection characteristic profile

Distributed measurement of minimum and maximum in-situ stress in substrates

Collection optics system for spectrometer and Raman spectral system

On-device metrology using target decomposition

Optical fiber inspecting device, optical fiber manufacturing apparatus, method for inspecting optical fiber, and method for manufacturing optical fiber

Hand-held measurement device for capturing the visual impression of a measurement object

Optical characterization of fiber reinforced plastic composites based on optical transmission scanning

Optical soiling measurement device for photovoltaic arrays

Apparatus and method for customized hair-coloring

Sparkle measurement

Stage system and metrology tool

Method and device for characterizing a wafer patterned using at least one lithography step

DETERMINING ABSORPTION AND SCATTERING COEFFICIENT USING A CALIBRATED OPTICAL REFLECTANCE SIGNAL

Device for processing a surface

Hand-held measurement device for capturing the visual impression of a measurement object

Method, system, and equipment for glass material processing as a function of crystal state

Systems and methods for endoscopic angle-resolved low coherence interferometry

Dark field wafer nano-defect inspection system with a singular beam

Rapid and non-destructive detection of infection

Method and apparatus for determining the property of a structure, device manufacturing method

Method and apparatus to detect defects in transparent solids

Particulate matter detection apparatus

Methods and devices for measuring properties of coatings on optical fibers

Substrate inspection apparatus

VOLUMETRIC SUBSTRATE SCANNER

Apparatus and method for customized hair-coloring

Method and apparatus for detecting an object with circular-arc-shaped supporting elements

Upper surface foreign material detecting device of ultra-thin transparent substrate

Optical metrology system for spectral imaging of a sample

Grating pattern element, target material measuring apparatus, and target material measuring method

Optical method for characterizing a diffractive surface and apparatus for implementing such a method

Method and apparatus to optically detect defects in transparent solids

Method of determining dose, inspection apparatus, patterning device, substrate and device manufacturing method

Portable broadband diffuse optical spectroscopic imaging (DOSI) device for noninvasive tissue characterization

Methods for increasing transmission through scattering random media

System and method for haze measurement

Apparatus and method of investigating surface properties

Multi-angle colorimeter

Recording medium determining device and recording medium determination method

Optical metrology system for spectral imaging of a sample

Systems and methods for endoscopic angle-resolved low coherence interferometry

Surface feature manager

Device for inspecting ceramic sphere

Hand-held measurement device for capturing the visual impression of a measurement object

Multi-angle colorimeter

Multi-angle colorimeter

Systems and methods for endoscopic angle-resolved low coherence interferometry

Laser scanning module including an optical isolator

IMAGE ACQUISITION APPARATUS, PATTERN INSPECTION APPARATUS, AND IMAGE ACQUISITION METHOD

SYSTEMS AND METHODS FOR ENDOSCOPIC ANGLE-RESOLVED LOW COHERENCE INTERFEROMETRY

Sintered ceramic and ceramic sphere

Friction-coefficient estimating device and friction-coefficient estimating method

Methods and systems for optically characterizing a turbid material using a structured incident beam

Chemical/biological sensor employing scattered chromatic components in nano-patterned aperiodic surfaces

Illumination system for optical inspection

Systems and methods for endoscopic angle-resolved low coherence interferometry

OPTICAL MEASURING UNIT AND METHOD FOR CARRYING OUT A REFLECTIVE MEASUREMENT

Information processing apparatus and method

Laser speckle imaging systems and methods

Method, Apparatus and Kit for Measuring Optical Properties of Materials

Inspection device and inspection method for the optical examination of object surfaces, particularly of wafer surfaces

Illumination of diffusely scattering media

Photodetector and jig for sample holder

Illumination system for optical inspection

Reverse photoacoustic standoff spectroscopy

Systems and methods for endoscopic angle-resolved low coherence interferometry

HIGH-THROUGHPUT SPECTRAL IMAGING AND SPECTROSCOPY APPARATUS AND METHODS

Apparatus for determining optical surface properties of workpieces

Wiring Pattern Inspection Method and Inspection Apparatus for Flexible Printed Wiring Board

Light scattering property measurement method

Optical inspection of test surfaces

Methods for using light reflection patterns to determine diving angle of grain

System and method for z-structure measurements using simultaneous multi-band tomography

Evaluation method for crystal defect in silicon single crystal wafer

METHOD AND A DEVICE FOR MEASUREMENT OF SCATTERED RADIATION AT AN OPTICAL SYSTEM

Threshold determination in an inspection system

Grain angle sensor

DETACHABLY COUPLED IMAGE INTENSIFIER AND IMAGE SENSOR

Methods and systems for detecting pinholes in a film formed on a wafer or for monitoring a thermal process tool

Method and Device for Measuring Coarseness of a Paint Film

Optical sensor and method for optically inspecting surfaces

Method of measuring a physical function using a composite function which includes the physical function and an arbitrary reference function

Arrangement and method for assessing tissue qualities

Systems and methods for endoscopic angle-resolved low coherence interferometry

Laser treatment apparatus

Optical measuring device and image forming apparatus

Illumination system for optical inspection

Optical method and device for texture quantification of photovoltaic cells

System and method for enhancing confocal reflectance images of tissue specimens

APPARATUS AND METHODS FOR SCATTEROMETRY OF OPTICAL DEVICES

Sensing light

Device and method for identifying image forming print medium

Method of measuring a physical function using a composite function which includes the physical function and an arbitrary reference function

Method of measuring a physical function using a composite function which includes the physical function and an arbitrary reference function

Glare-directed imaging

Method and device for in-line measurement of characteristics of the surface coating of a metallurgy product

Method of measuring thickness of an opaque coating using near-infrared absorbance

Overhead transparency clarity simulator

Dark field inspection system

Detection of impurities in cylindrically shaped transparent media

Optical measuring method for semiconductor multiple layer structures and apparatus therefor

Non-invasive tension measuring system

Dual mode optical rain sensing device

Scatterometry system and method