168024 ⎘
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited; Fluorescence; Phosphorescence; Specially adapted constructive features of fluorimeters; Spatial resolved fluorescence measurements; Imaging Detecting fluorescent inhomogeneities at a position, e.g. for detecting defects
SYSTEM AND METHOD FOR ENHANCING PHOTOLUMINESCENCE
#2APPARATUS AND METHOD FOR CELL KILL CONFIRMATION
#3RAPID REAL-TIME VISUALIZATION METHOD AND SYSTEM FOR CRACK INITIATION PROCESS OF CONCRETE COMPONENT
#4DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
#5A METHOD FOR MAPPING AN INTERNAL STRUCTURE OF A SAMPLE
#6METHOD AND DEVICE FOR DETERMINING THE STATE OF CELLS IN REACTORS
#7PHOTOLUMINESCENCE MEASUREMENT DEVICE
#8Apparatus and method for cell kill confirmation
#9INSPECTION APPARATUS AND INSPECTION METHOD
#10Selective marking of a substrate with fluorescent conjugated polymer probes having a small form factor
#11METHOD FOR ESTIMATING A THREE-DIMENSIONAL SPATIAL DISTRIBUTION OF FLUORESCENCE, INSIDE AN OBJECT
#12SYSTEM AND METHOD FOR FEATURE SIGNAL ENHANCEMENT USING A SELECTIVELY BONDED PHOTOLUMINESCENT MATERIAL
#13INSPECTION SYSTEM FOR OPTICAL SURFACE INSPECTION OF A TEST SPECIMEN
#14Apparatus and method for cell kill confirmation
#15Inspection arrangement and method for fluorescence-based inspection
#16Inspection apparatus and inspection method
#17Method for testing a preservative layer
#18Apparatus and method for extracting low intensity photonic signals
#19Systems and methods for bio-inactivation
#20LOCALIZED SURFACE COATING DEFECT PATCHING PROCESS
#21Method for photoluminescence measurement of a sample
#22Contact lens defect inspection using UV illumination
#23Menthol detection on tobacco
#24Systems and methods for determining patient compliance with an orthodontic device
#25Apparatus and method for cell kill confirmation
#26Detection of fluorescence of foreign materials
#27System, apparatus and method for dispensed adhesive material inspection
#28Multi moire structured illumination microscopy with high index materials
#29Apparatus and method for extracting low intensity photonic signals
#30Systems and methods for defect material classification
#31Ultraviolet illumination with optical elements
#32Methods for inspecting semiconductor wafers
#33MAGNETO-OPTICAL DEFECT CENTER SENSOR WITH VIBRATION INSENSITIVE PRECISION ADJUSTABILITY
#34Menthol detection on tobacco
#35Micro photoluminescence imaging with optical filtering
#36Semiconductor device inspection of metallic discontinuities
#37COPOLYMER AND ASSOCIATED LAYERED ARTICLE, AND DEVICE-FORMING METHOD
#38Systems and methods for defect material classification
#39Methods for inspecting semiconductor wafers
#40Systems and methods for bio-inactivation
#41Method and arrangement for analyzing a semiconductor element and method for manufacturing a semiconductor component
#42Detecting damage to a converter device
#43System, apparatus and method for dispensed adhesive material inspection
#44Contact lens defect inspection using UV illumination
#45Method and arrangement for analyzing a semiconductor element and method for manufacturing a semiconductor component
#46Method and apparatus for detecting undesired measurement conditions
#47Menthol detection on tobacco
#48Micro photoluminescence imaging with optical filtering
#49Optical metrology system for spectral imaging of a sample
#50Methods of defect inspection of plated through hole structures utilizing fluorescent conductive fill material
#51Luminescence imaging systems and methods for evaluating photovoltaic devices
#52Heroin detection by Raman spectroscopy from impure compositions comprising an interfering fluorescent contaminant
#53Imaging system
#54Apparatus for in-vitro imaging and analysis of dental samples
#55Menthol detection on tobacco
#56Wafer imaging and processing method and apparatus
#57On-line oil and foreign matter detection system and method
#58Method for analysing the crystal structure of a polycrystalline semiconductor
#59Centimeter-scale high resolution metrology of entire CVD grown graphene sheets
#60Methods for inspecting semiconductor wafers
#61Optical metrology system for spectral imaging of a sample
#62Menthol detection on tobacco
#63Detection of contaminated areas
#64On-line oil and foreign matter detection system and method
#65Method of manufacturing bearing device component coated with photoluminescence material, bearing device component and processing device with an indicator displaying information for a signal including information in accordance with light emission of a photoluminescence material applied on bearing device
#66Methods and systems for determining a critical dimension and overlay of a specimen
#67Non-uniform grating
#68Heroin detection by raman spectroscopy from impure compositions comprising an interfering fluorescent contaminant
#69Plated Through Hole Void Detection in Printed Circuit Boards by Detecting Material Coupling to Exposed Laminate
#70Product marking
#71System and method for detecting and visualizing ignitable liquid residues using hyperspectral imaging
#72APPARATUS, AND ASSOCIATED METHOD, FOR DETECTING CONTAMINATION OF AN OBJECT
#73Photoluminescence measurement
#74Photoluminescence spectroscopy
#75FLUORESCENCE-DETECTING DISK INSPECTION SYSTEM
#76TIME RESOLVED PHOTOLUMINESCENCE IMAGING SYSTEMS AND METHODS FOR PHOTOVOLTAIC CELL INSPECTION
#77Method to measure the characteristics in an electrical component
#78THIN FILM IMAGING METHOD AND APPARATUS
#79METHOD AND APPARATUS FOR DETECTING UNDESIRED MEASUREMENT CONDITIONS
#80Wafer imaging and processing method and apparatus
#81Methods for detecting defects in inorganic-coated polymer surfaces
#82Methods and systems for determining a critical dimension and overlay of a specimen
#83Hand-held inspection tool and method
#84System and method of optically monitoring contamination of a machine component
#85Trace evidence detection using multiple laser light sources
#86METHOD FOR MANUFACTURING PLASMA DISPLAY PANEL, INSPECTION METHOD FOR INSPECTING PHOSPOR LAYER AND INSPECTION APPARATUS FOR INSPECTING PHOSPHOR LAYER
#87MONITORING A COATING APPLIED TO A METAL SURFACE
#88Method for evaluating a semiconductor substrate
#89LITHOGRAPHIC PRINTING PLATE PRECURSOR, LITHOGRAPHIC PRINTING PLATE, AND PROCESS OF MAKING THE SAME
#90Method and device for controlling the quality of thermoplastic molding compositions
#91Apparatus and methods for the inspection of microvias in printed circuit boards
#92Luminescent coating
#93Photoluminescence imaging with preferential detection of photoluminescence signals emitted from a specified material layer of a wafer or other workpiece
#94Differential wavelength photoluminescence for non-contact measuring of contaminants and defects located below the surface of a wafer or other workpiece
#95Defect inspection method for a glass substrate for a mask blank, glass substrate for a mask blank, mask blank, exposure mask, method of producing a glass substrate for a mask blank, method of producing a mask blank, and method of producing an exposure mask
#96Apparatuses and methods for detecting defects in semiconductor workpieces
#97Apparatus and method for reading fluorescence from bead arrays
#98Fluorescent coating void detection system and method
#99Methods and systems for determining a presence of macro and micro defects on a specimen
#100Applied flavoring-material inspection device and cigarette making machine provided with same
#101Method for judging change in probe-bearing substrate, probe-bearing substrate and detecting apparatus
#102Spore state discrimination
#103Analyses of surface-mount-technology components using fluorescent-dye penetrants
#104Spore state discrimination
#105Methods of manufacturing a light source carrier and an electronic device, and a light source qualification method
#106Spore state discrimination
#107Labeled wafer inspection