INSPECTION DURING THE MANUFACTURE OF MODULES OR PRECURSORS OF MODULES

DEFECT INSPECTION SYSTEM AND DEFECT INSPECTION METHOD

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

WEB EDGE METROLOGY

TERAHERTZ WAVE DETECTION CHIP AND TERAHERTZ WAVE DETECTION SYSTEM

Cylindrical shell detection method and cylindrical shell detection device

Part quality monitoring in a stereolithographic additive manufacturing system

METHOD FOR EVALUATING ADHESION RELIABILITY AND HEAT RADIATION PERFORMANCE OF COMPOSITE, AND COMPOSITE

Making and inspecting a web of vitreous lithium sulfide separator sheet and lithium electrode assemblies and battery cells

Method for determining the composition of a multi-layer system showing a predetermined colour flip-flop effect

Web edge metrology

Part quality monitoring in a stereolithographic additive manufacturing system

Measuring deflection to determine a characteristic of a cantilever

Method for detecting defects in thin film layers

Inspection of bonding quality of transparent materials using optical coherence tomography

Non-destructive method for measuring thickness of three-layered reinforced hydrogen ion exchange membrane for fuel cell

Measuring deflection to determine a characteristic of a layered-material strip

Measuring deflection to determine a characteristic of a cantilever

Method of forming enhanced super-resolution image

Method to determine properties of a coating on a transparent film, method for manufacturing a capacitor film and device to determine properties of a coating on a transparent film

Methods and systems for measurement of thick films and high aspect ratio structures

Systems and methods for determining characteristics of semiconductor devices

FIELD-BIASED NONLINEAR OPTICAL METROLOGY USING CORONA DISCHARGE SOURCE

APPARATUS AND METHOD FOR TIME-RESOLVED CAPTURE OF PULSED ELECTROMAGNETIC RADIO FREQUENCY RADIATION

Detection system for a multilayer film and method thereof using dual image capture devices for capturing forward scattered light and back scattered light

Inspection system, inspection device, and inspecting method

Apparatus and method for measurement of multilayer structures

Manufacturing process for integrated computational elements

Systems and methods for metrology with layer-specific illumination spectra

Growth-rate measuring apparatus and growth-rate detection method

Methods and systems for measurement of thick films and high aspect ratio structures

CHARACTERIZATION OF MULTILAYER STRUCTURES

Three-dimensional imaging for semiconductor wafer inspection

3D printer with hovering printing head or printing bed

Arrangement for spatially resolved determination of the specific electrical resistance and/or the specific electrical conductivity of samples

Sensor system and method for characterizing a stack of wet paint layers

Systems and methods for quality control of a periodic structure

Optical element, article, and method of producing optical element

Method for detecting bonding failure part and inspection system

Arrangement for determining properties and/or parameters of a sample and/or of at least one film formed on the surface of a sample

Apparatus and methods for probing a material as a function of depth using depth-dependent second harmonic generation

Systems and Methods to Reduce Delamination In Integrated Computational Elements Used Downhole

TEMPERATURE-DEPENDENT FABRICATION OF INTEGRATED COMPUTATIONAL ELEMENTS

In-situ spectroscopy for monitoring fabrication of integrated computational elements

Method and system for determining and verifying ply orientation of a composite laminate

Scanning interferometry technique for through-thickness evaluation in multi-layered transparent structures

Multilayer ceramic electronic component

Inspecting apparatus for inspecting a multilayer structure

Composite inspection and structural check of multiple layers

Method and system for the ply-by-ply machining of a component made of composite material, by applying energy

Method and device for nondestructive testing of material health especially in the fillets of a composite part

Computer program product and method of controlling polishing of a substrate

Method for detecting buried layers

Methods and systems for inspection of composite irregularities

Method and apparatus for measuring damage to an organic layer of a thin film encapsulation

Resin article

Photon doppler velocimetry for laser bond inspection

Method of detecting volatile organic compounds

Resin article

Resin article

Method and apparatus for supervision of optical material production

Test device for testing a bonding layer between wafer-shaped samples and test process for testing the bonding layer

Combining X-ray and VUV analysis of thin film layers

Method of controlling polishing

Construction of reference spectra with variations in environmental effects

APPARATUS AND METHOD FOR MEASURING CHARACTERISTICS OF MULTI-LAYERED THIN FILMS

POSITION-SENSITIVE METROLOGY SYSTEM

Method for measuring and method for viewing a wave surface using spectrophotometry

Device and method for determining a piece of polarization information and polarimetric imaging device

Device and method for determining a piece of polarisation information and polarimetric imaging device

Laser ultrasonic multi-component imaging

Apparatus and method for enhancing the electromagnetic signal of a sample

Thin film interference filter and bootstrap method for interference filter thin film deposition process control

Use of fluorescent nanoparticles to measure individual layer thicknesses or composition in multi-layer films and to calibrate secondary measurement devices

Multiple measurement techniques including focused beam scatterometry for characterization of samples

PROPERTY DETERMINATION WITH LIGHT IMPINGING AT CHARACTERISTIC ANGLE

Surface defect inspection apparatus

Thin Film Interference Filter and Bootstrap Method for Interference Filter Thin Film Deposition Process Control

System and method for counting number of layers of multilayer object by means of electromagnetic wave

Systems and methods for metrology with layer-specific illumination spectra