ClassID:

168160

G01N2021/8812 - CPC Classification

Classification description:

Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems specially adapted for particular applications; Investigating the presence of flaws or contamination; Specially adapted optical and illumination features Diffuse illumination, e.g. "sky"

Sub-classes:
Recent Application in this class:
#1
20260016368
2026-01-15

Apparatus and System for Visual Inspection of Fiber Ends and Image Analysis Tool for Detecting Contamination

#2
20250305935
2025-10-02

BONDING ENERGY MEASUREMENT

#3
20250189457
2025-06-12

IMAGING

#4
20240280499
2024-08-22

Visual inspection systems and methods

#5
20240102937
2024-03-28

HIGH CLARITY GEMSTONE FACET AND INTERNAL IMAGING ANALYSIS

#6
20240022693
2024-01-18

SUBSTRATE IMAGING APPARATUS

#7
20230228648
2023-07-20

Apparatus and System for Visual Inspection of Fiber Ends and Image Analysis Tool for Detecting Contamination

#8
20230003666
2023-01-05

Inspection device and coating apparatus equipped with the same

#9
20220291140
2022-09-15

Defect inspection device and defect inspection method

#10
20220244192
2022-08-04

Imaging device, inspection apparatus and inspection method

#11
20220214286
2022-07-07

Surface inspection sensor

#12
20220178839
2022-06-09

Illuminator for a viewing unit of an optical inspection machine for the quality control of parts

#13
20220099587
2022-03-31

INSPECTION APPARATUS, INSPECTION SYSTEM, AND INSPECTION METHOD

#14
20220084892
2022-03-17

Method of processing a cleaved semiconductor wafer

#15
20220084857
2022-03-17

Cleaved semiconductor wafer imaging system

#16
20220082510
2022-03-17

Cleaved semiconductor wafer camera system

#17
20210185282
2021-06-17

Substrate imaging apparatus

#18
20210056679
2021-02-25

Inspection system, inspection apparatus, and method using multiple angle illumination

#19
20210025829
2021-01-28

Defect inspection apparatus and defect inspection method

#20
20200400585
2020-12-24

Apparatus and method for inspection of a film on a substrate

#21
20200300748
2020-09-24

Device and method for investigating bulk material

#22
20200271591
2020-08-27

Apparatus and method for inspection of a film on a substrate

#23
20200256804
2020-08-13

Defect inspection apparatus and defect inspection method

#24
20200217756
2020-07-09

Apparatus for checking tyres

#25
20200103352
2020-04-02

Adaptive diffuse illumination systems and methods

#26
20200084422
2020-03-12

Substrate imaging apparatus

#27
20190302030
2019-10-03

Vehicle lighting

#28
20190277771
2019-09-12

Image inspection device

#29
20190086293
2019-03-21

Method and apparatus for checking tyres

#30
20180348144
2018-12-06

Image inspection apparatus and image inspection method

#31
20180143143
2018-05-24

SYSTEM AND METHOD FOR INSPECTING BOTTLES AND CONTAINERS USING LIGHT

#32
20180038806
2018-02-08

Systems and methods for measuring physical characteristics of semiconductor device elements using structured light

#33
20170343482
2017-11-30

Inspection apparatus and inspection method for inspection of the surface appearance of a flat item that represents a test specimen

#34
20170336323
2017-11-23

Detection system and method of detecting corrosion under an outer protective layer

#35
20170328838
2017-11-16

Visual inspection device and visual inspection method

#36
20170322164
2017-11-09

Reverberation chamber loading

#37
20170244936
2017-08-24

Substrate imaging apparatus

#38
20160305871
2016-10-20

System and method for acquiring images of surface texture

#39
20160305869
2016-10-20

Detection system and method of detecting corrosion under an outer protective layer

#40
20160003734
2016-01-07

Detection system and method of detecting corrosion under an outer protective layer

#41
20150138341
2015-05-21

Apparatus and method for selectively inspecting component sidewalls

#42
20150059957
2015-03-05

Systems and methods for measuring physical characteristics of semiconductor device elements using structured light

#43
20140338471
2014-11-20

Reverberation chamber loading

#44
20120236557
2012-09-20

Illumination system with illumination shield

#45
20110310242
2011-12-22

Apparatus for optically inspecting an at least partially reflecting surface of an object

#46
20100215221
2010-08-26

Method and device for analyzing berries

#47
20100208980
2010-08-19

Apparatus and method for detecting defects in wafer manufacturing

#48
20100128261
2010-05-27

DEVICE FOR DETECTING AND CLASSIFYING RESIDUAL OXIDE IN METAL SHEET PRODUCTION LINES

#49
20100111515
2010-05-06

Illumination apparatus and appearance inspection apparatus including the same

#50
20090323053
2009-12-31

Optical inspection tools featuring light shaping diffusers

#51
20080137088
2008-06-12

Device for optically measuring the shapes of objects and surfaces

#52
20080085940
2008-04-10

METHOD AND DEVICE FOR NON-DESTRUCTIVE ANALYSIS OF PERFORATIONS IN A MATERIAL

#53
20070263206
2007-11-15

Apparatus and method for characterizing defects in a transparent substrate

#54
20070097686
2007-05-03

Illuminator-especially for cylindrical curved surfaces

#55
20070073134
2007-03-29

Lighting and imaging system including a flat light source with LED illumination

#56
20070019187
2007-01-25

Method and device for non-destructive analysis of perforations in a material

#57
20060283145
2006-12-21

Beverage bottling plant for filling bottles with a liquid beverage material having an inspection apparatus for inspecting bottles

#58
20060180775
2006-08-17

Device and method for optical control under diffuse illumination and observation means of crockery items or any glazed ceramic products

#59
20060152741
2006-07-13

Method and apparatus for backlighting and imaging multiple views of isolated features of an object

#60
20050238222
2005-10-27

Illumination device, recognizing device with the illumination device, and part mounting device

#61
20050220335
2005-10-06

Surface inspection technology for the detection of porosity and surface imperfections on machined metal surfaces

#62
20050004956
2005-01-06

Optical method for evaluating surface and physical properties of structures made wholly or partially from fibers, films, polymers or a combination thereof

#63
18111122
2024-01-02

Portable lighting device for workbench