168165 ⎘
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems specially adapted for particular applications; Investigating the presence of flaws or contamination; Specially adapted optical and illumination features Shadow projection or structured background, e.g. for deflectometry
Sub-classes:GENERATION AND ASSESSMENT OF STRIPED LIGHTING ILLUMINATED DAMAGE DETECTION DATA
#2SPECIALIZED LIGHTING CONFIGURATION FOR PROJECTION OF STRIPED LIGHTING
#3VARIABLY SWITCHED UNIFORM AND STRIPED LIGHTING PANEL
#4TECHNIQUES AND MECHANISMS FOR STRIPED LIGHTING DAMAGE DETECTION
#5STRIPED LIGHTING VEHICLE TUNNELS FOR DAMAGE DETECTION
#6DETECTING FOREIGN PARTICLES USING A TDI CAMERA
#7IMAGING AND ANALYZING CRACK PROPAGATION IN GLASS
#8Surface Inspection Sensor
#9DEFLECTOMETRY MEASUREMENT METHOD
#10AN INSPECTION TOOL FOR INSPECTING A CONCRETE SURFACE
#11METHOD AND APPARATUS TO ENHANCE SEMICONDUCTOR DEVICE MANUFACTURING
#12METHOD AND DEVICE FOR DETECTING LOCAL DEFECTS ON A REFLECTIVE SURFACE
#13Pore measurement device
#14Structured light projector
#15Structured light projector
#16Deflectometry devices, systems and methods
#17INSPECTION APPARATUS, INSPECTION SYSTEM, AND INSPECTION METHOD
#18Structured illumination optical inspection platform for transparent materials
#19INSPECTION DEVICE
#20Vehicle surface scanning system
#21Vehicle detection system
#22AUTOMATED CONTROL AND INSPECTION SYSTEM FOR MANUFACTURE AND MEASUREMENT OF APPAREL
#23MULTIPLEXED ASSAY SYSTEMS AND METHODS
#24Inspection apparatus for optically inspecting an object, and object inspection system
#25Machine vision systems, illumination sources for use in machine vision systems, and components for use in the illumination sources
#26System and method for damage detection by cast shadows
#27Image inspecting apparatus, image inspecting method and image inspecting program
#28Reference plate and method for calibrating and/or checking a deflectometry sensor system
#29Inspection method for semiconductor substrates using slope data and inspection apparatus
#30Optical sensing device and structured light projector
#31System and method to calibrate an uncollimated laser diode for 3D imaging applications
#32METHOD FOR MEASURING THE AXIAL RUNOUT OF A PLANE SURFACE OF A WORKPIECE WITH RESPECT TO AN AXIS OF ROTATION, AND CORRESPONDING MEASURING ASSEMBLY
#33Method for inspection of a machine part
#34Evaluation device and recording medium storing evaluation program
#35Image inspection apparatus
#36System and method for finding dents on an automobile using a booth
#37Light modulation for inspection probes
#38Systems and methods for measuring physical characteristics of semiconductor device elements using structured light
#39Method and apparatus of inspecting a substrate with a component mounted thereon
#40Defect inspection method and apparatus therefor
#41METHOD OF INSPECTING AN OBJECT WITH A VISION PROBE
#42Inspection system and inspection method
#43SURFACE INSPECTION APPARATUS AND SURFACE INSPECTION METHOD
#44Systems and methods for measuring physical characteristics of semiconductor device elements using structured light
#45Method and device for analysing phase distribution of fringe image using high-dimensional intensity information, and program for the same
#46Three-dimensional measuring apparatus
#47Method for the detection of a possible joint defect in a friction stir weld seam
#48Method and apparatus for optically inspecting a test specimen having an at least partly reflective surface
#49Inspection apparatus
#50Inspection apparatus and measurement method
#51Three dimensional shape measurement apparatus
#52MICROTUBE READER DEVICE FOR THE ANALYSIS OF BLOOD SAMPLES
#53Method for detecting surface defects on a substrate and device using said method
#54Fastener inspection system and method