168168 ⎘
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems specially adapted for particular applications; Investigating the presence of flaws or contamination; Specially adapted optical and illumination features Stroboscopic illumination; synchronised illumination
VISION INSPECTION SYSTEMS AND METHODS USING LIGHT SOURCES OF DIFFERENT WAVELENGTHS
#2WOUND CARE IMAGE ANALYSIS USING A SMARTPHONE
#3TEST SYSTEM
#4MULTI-CAMERA SYNCHRONIZATION FOR INSPECTION SYSTEMS
#5Stroboscopic stepped illumination defect detection system
#6Systems and methods for calibrating and operating imaging systems with illumination external to a host
#7DEFECT REMOVAL DEVICE, DEFECT REMOVAL METHOD, PATTERN FORMING METHOD, AND METHOD OF MANUFACTURING ELECTRONIC DEVICE
#8DARK FIELD ILLUMINATION BASED ON LASER ILLUMINATED PHOSPHOR
#9Displacement measurement device and defect detection device
#10Defect detection device
#11Vibration measurement device
#12Automatic optical inspection device and method
#13Multi-feature image tracking
#14Systems and methods for autonomous stroboscopic machine inspection for multi-point and multi-frequency vibration measurement
#15Apparatus for controlling tyres in a production line
#16Image capture apparatus and method executed by image capture apparatus
#17Container inspection device and container inspection method for inspecting containers
#18Defect detection method and defect detection apparatus
#19Container inspection device and container inspection method for inspecting containers
#20LED strobe
#21Automated wafer defect inspection system and a process of performing such inspection
#22Image processing apparatus for performing correction processing for effecting virtual light source and method executed by image processing apparatus
#23System and method for individually inspecting objects in a stream of products and a sorting apparatus comprising such system
#24Trigger for blade imaging based on a controller
#25AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMING SUCH INSPECTION
#26Systems and methods for controlling strobe illumination
#27Removal of fusarium infected kernels for grain
#28Automated wafer defect inspection system and a process of performing such inspection
#29DEVICE FOR DETECTING AND CLASSIFYING RESIDUAL OXIDE IN METAL SHEET PRODUCTION LINES
#30Systems and methods for controlling strobe illumination
#31Apparatus and methods for inspecting tape lamination
#32Strobe illumination
#33Device and method for inspecting an object
#34Automated wafer defect inspection system and a process of performing such inspection