168169 ⎘
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems specially adapted for particular applications; Investigating the presence of flaws or contamination; Specially adapted optical and illumination features Illumination and detection on two sides of object
APPARATUS FOR THE INSPECTION OF A CIRCULAR ELONGATED ELEMENT
#2WAFER INSPECTION SYSTEM AND METHOD THEREOF
#3OPTICAL DETECTION DEVICE AND OPTICAL DETECTION METHOD
#4INSPECTION DEVICE, INSPECTION METHOD, AND INSPECTION PROGRAM
#5DETECTING FOREIGN PARTICLES USING A TDI CAMERA
#6PEARL GRADING INSTRUMENT AND METHODS
#7INSPECTION APPARATUS, METHOD OF INSPECTION USING THE INSPECTION APPARATUS, AND ELECTRONIC DEVICE MANUFACTURED USING THE INSPECTION APPARATUS
#8MULTI-AZIMUTH ILLUMINATION AND IMAGING INSPECTION SYSTEM AND METHOD
#9OPTICAL LINE SENSOR
#10APPEARANCE INSPECTION METHOD FOR GOODS
#11SEMICONDUCTOR INSPECTION TOOL SYSTEM AND METHOD FOR WAFER EDGE INSPECTION
#12OPTICAL INSPECTION SYSTEM, METHOD OF OPTICAL INSPECTION, AND METHOD OF MANUFACTURING SEMICONDUCTOR PACKAGE
#13TWO-SIDED SCANNING APPARATUS FOR ANALYSIS OF AGRICULTURAL PRODUCTS
#14INSPECTION APPARATUS, INSPECTION SYSTEM, CONTROL DEVICE, INSPECTION METHOD, AND PROGRAM
#15LIGHTING FOR AN OPTICAL MONITORING APPARATUS
#16SHEET MATERIAL EDGE BURR DETECTION DEVICE
#17METHODS AND APPARATUSES FOR MEASURING FLUID COMPOSITION AND TURBIDITY
#18AUTOMATED OPTICAL INSPECTION TOOL
#19METHOD AND APPARATUS FOR INSPECTING FULL CONTAINERS
#20APPARATUS AND METHOD FOR OPTICAL INSPECTING THREE OR MORE SIDES OF A COMPONENT
#21SYSTEM AND METHOD FOR AUTOMATIC INSPECTION OF VEHICLES
#22INSPECTION APPARATUS
#23SYSTEM AND METHOD FOR AUTOMATIC INSPECTION OF VEHICLES
#24DEVICE FOR INSPECTING THE SURFACE OF A TRANSPARENT OBJECT, AND CORRESPONDING METHOD
#25Cylindrical shell detection method and cylindrical shell detection device
#26GLASS INSPECTION EQUIPMENT AND METHOD OF GLASS INSPECTION
#27Semiconductor inspection tool system and method for wafer edge inspection
#28VISUAL INSPECTION SYSTEM FOR ANNULAR PRODUCT
#29Automated optical double-sided inspection apparatus
#30DOUBLET DETECTION IN GEMSTONES
#31Product inspection system and method
#32SENSORS, IMAGING SYSTEMS, AND METHODS FOR FORMING A SENSOR
#33Device for recognizing defects in finished surface of product
#34DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
#35Electronic Device Valuation System
#36Method for manufacturing electrode by switching contact region of roll surface upon abnormality detection
#37Tubular body inner surface inspection apparatus and tubular body inner surface inspection method
#38DETECTION OF DAMAGE TO OPTICAL ELEMENT OF ILLUMINATION SYSTEM
#39GLASS PROCESSING APPARATUS AND METHODS
#40Apparatus for high-speed surface relief measurement
#41Method and a machine for checking the quality of a product
#42INSPECTING A SLAB OF MATERIAL
#43Object multi-perspective inspection apparatus and method therefor
#44Methods, apparatus, and systems for inspecting holes in transparent materials
#45Cosmetic Evaluation Box for Used Electronics
#46Microneedle array imaging device, microneedle array imaging method, microneedle array inspection device, and microneedle array inspection method
#47Electrode manufacture by switching contact region of roll surface upon abnormality detection
#48Object multi-perspective inspection apparatus and method therefor
#49Cosmetic Evaluation Box for Used Electronics
#50Device and method for surface profilometry for the control of wafers during processing
#51Hybrid inspection system and inspection method for dosage
#52Particulate matter detection apparatus
#53Upper surface foreign material detecting device of ultra-thin transparent substrate
#54Method of manufacturing liquid crystal display device and inspection device
#55Panel inspection apparatus and method
#56Pill inspection apparatus and pill inspection method
#57Cosmetic Evaluation Box for Used Electronics
#58Visual inspection apparatus
#59Prepreg production method
#60Camera web support
#61Method of monitoring fabrication processing including edge bead removal processing
#62Apparatus and method for inspecting edge of semiconductor wafer
#63HIGH RESOLUTION EDGE INSPECTION
#64Edge inspection
#65Method and apparatus for illuminating material for automated inspection
#66Surface inspection apparatus and surface inspection method
#67Defect inspection apparatus
#68Double sided optical inspection of thin film disks or wafers
#69Apparatus for Inspecting the front side and backside of a disk-shaped object
#70System for inspection of a disk-shaped object
#71Edge inspection
#72Dust and scratch detection for an image scanner
#73Single pass automated vehicle inspection system and method
#74Image capturing unit and inspection system
#75Semiconductor inspection tool system and method for wafer edge inspection
#76Lighting apparatus for conveyors
#77Detection and identification of opaqueness of vehicle windows
#78Apparatus and a method for inspecting a light transmissive optical component
#79Night vision device test apparatus