ClassID:

168169

G01N2021/8841 - CPC Classification

Classification description:

Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems specially adapted for particular applications; Investigating the presence of flaws or contamination; Specially adapted optical and illumination features Illumination and detection on two sides of object

Recent Application in this class:
#1
20260140065
2026-05-21

APPARATUS FOR THE INSPECTION OF A CIRCULAR ELONGATED ELEMENT

#2
20260133136
2026-05-14

WAFER INSPECTION SYSTEM AND METHOD THEREOF

#3
20260092872
2026-04-02

OPTICAL DETECTION DEVICE AND OPTICAL DETECTION METHOD

#4
20260036517
2026-02-05

INSPECTION DEVICE, INSPECTION METHOD, AND INSPECTION PROGRAM

#5
20260016420
2026-01-15

DETECTING FOREIGN PARTICLES USING A TDI CAMERA

#6
20250383295
2025-12-18

PEARL GRADING INSTRUMENT AND METHODS

#7
20250362236
2025-11-27

INSPECTION APPARATUS, METHOD OF INSPECTION USING THE INSPECTION APPARATUS, AND ELECTRONIC DEVICE MANUFACTURED USING THE INSPECTION APPARATUS

#8
20250354939
2025-11-20

MULTI-AZIMUTH ILLUMINATION AND IMAGING INSPECTION SYSTEM AND METHOD

#9
20250354938
2025-11-20

OPTICAL LINE SENSOR

#10
20250321194
2025-10-16

APPEARANCE INSPECTION METHOD FOR GOODS

#11
20250290869
2025-09-18

SEMICONDUCTOR INSPECTION TOOL SYSTEM AND METHOD FOR WAFER EDGE INSPECTION

#12
20250277752
2025-09-04

OPTICAL INSPECTION SYSTEM, METHOD OF OPTICAL INSPECTION, AND METHOD OF MANUFACTURING SEMICONDUCTOR PACKAGE

#13
20250271412
2025-08-28

TWO-SIDED SCANNING APPARATUS FOR ANALYSIS OF AGRICULTURAL PRODUCTS

#14
20250231119
2025-07-17

INSPECTION APPARATUS, INSPECTION SYSTEM, CONTROL DEVICE, INSPECTION METHOD, AND PROGRAM

#15
20250208055
2025-06-26

LIGHTING FOR AN OPTICAL MONITORING APPARATUS

#16
20250198943
2025-06-19

SHEET MATERIAL EDGE BURR DETECTION DEVICE

#17
20240402083
2024-12-05

METHODS AND APPARATUSES FOR MEASURING FLUID COMPOSITION AND TURBIDITY

#18
20240377334
2024-11-14

AUTOMATED OPTICAL INSPECTION TOOL

#19
20240280504
2024-08-22

METHOD AND APPARATUS FOR INSPECTING FULL CONTAINERS

#20
20240230552
2024-07-11

APPARATUS AND METHOD FOR OPTICAL INSPECTING THREE OR MORE SIDES OF A COMPONENT

#21
20240230473
2024-07-11

SYSTEM AND METHOD FOR AUTOMATIC INSPECTION OF VEHICLES

#22
20240201102
2024-06-20

INSPECTION APPARATUS

#23
20240133772
2024-04-25

SYSTEM AND METHOD FOR AUTOMATIC INSPECTION OF VEHICLES

#24
20240102940
2024-03-28

DEVICE FOR INSPECTING THE SURFACE OF A TRANSPARENT OBJECT, AND CORRESPONDING METHOD

#25
20240060909
2024-02-22

Cylindrical shell detection method and cylindrical shell detection device

#26
20240027363
2024-01-25

GLASS INSPECTION EQUIPMENT AND METHOD OF GLASS INSPECTION

#27
20240003826
2024-01-04

Semiconductor inspection tool system and method for wafer edge inspection

#28
20230298153
2023-09-21

VISUAL INSPECTION SYSTEM FOR ANNULAR PRODUCT

#29
20230213457
2023-07-06

Automated optical double-sided inspection apparatus

#30
20230027883
2023-01-26

DOUBLET DETECTION IN GEMSTONES

#31
20230021095
2023-01-19

Product inspection system and method

#32
20220397536
2022-12-15

SENSORS, IMAGING SYSTEMS, AND METHODS FOR FORMING A SENSOR

#33
20220373470
2022-11-24

Device for recognizing defects in finished surface of product

#34
20220357285
2022-11-10

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

#35
20220136977
2022-05-05

Electronic Device Valuation System

#36
20210249643
2021-08-12

Method for manufacturing electrode by switching contact region of roll surface upon abnormality detection

#37
20210208085
2021-07-08

Tubular body inner surface inspection apparatus and tubular body inner surface inspection method

#38
20210003511
2021-01-07

DETECTION OF DAMAGE TO OPTICAL ELEMENT OF ILLUMINATION SYSTEM

#39
20200378899
2020-12-03

GLASS PROCESSING APPARATUS AND METHODS

#40
20200371043
2020-11-26

Apparatus for high-speed surface relief measurement

#41
20200240926
2020-07-30

Method and a machine for checking the quality of a product

#42
20200191550
2020-06-18

INSPECTING A SLAB OF MATERIAL

#43
20200132609
2020-04-30

Object multi-perspective inspection apparatus and method therefor

#44
20190360945
2019-11-28

Methods, apparatus, and systems for inspecting holes in transparent materials

#45
20190277769
2019-09-12

Cosmetic Evaluation Box for Used Electronics

#46
20190188844
2019-06-20

Microneedle array imaging device, microneedle array imaging method, microneedle array inspection device, and microneedle array inspection method

#47
20190074503
2019-03-07

Electrode manufacture by switching contact region of roll surface upon abnormality detection

#48
20180188184
2018-07-05

Object multi-perspective inspection apparatus and method therefor

#49
20170328839
2017-11-16

Cosmetic Evaluation Box for Used Electronics

#50
20170299376
2017-10-19

Device and method for surface profilometry for the control of wafers during processing

#51
20170219497
2017-08-03

Hybrid inspection system and inspection method for dosage

#52
20170184510
2017-06-29

Particulate matter detection apparatus

#53
20160327494
2016-11-10

Upper surface foreign material detecting device of ultra-thin transparent substrate

#54
20160320178
2016-11-03

Method of manufacturing liquid crystal display device and inspection device

#55
20160216214
2016-07-28

Panel inspection apparatus and method

#56
20160109385
2016-04-21

Pill inspection apparatus and pill inspection method

#57
20150330910
2015-11-19

Cosmetic Evaluation Box for Used Electronics

#58
20150062329
2015-03-05

Visual inspection apparatus

#59
20140299253
2014-10-09

Prepreg production method

#60
20110170101
2011-07-14

Camera web support

#61
20110054659
2011-03-03

Method of monitoring fabrication processing including edge bead removal processing

#62
20100026997
2010-02-04

Apparatus and method for inspecting edge of semiconductor wafer

#63
20090196489
2009-08-06

HIGH RESOLUTION EDGE INSPECTION

#64
20080212084
2008-09-04

Edge inspection

#65
20080198602
2008-08-21

Method and apparatus for illuminating material for automated inspection

#66
20070222977
2007-09-27

Surface inspection apparatus and surface inspection method

#67
20070070334
2007-03-29

Defect inspection apparatus

#68
20060152716
2006-07-13

Double sided optical inspection of thin film disks or wafers

#69
20060119367
2006-06-08

Apparatus for Inspecting the front side and backside of a disk-shaped object

#70
20060119366
2006-06-08

System for inspection of a disk-shaped object

#71
20050036671
2005-02-17

Edge inspection

#72
20050023492
2005-02-03

Dust and scratch detection for an image scanner

#73
18613183
2024-11-12

Single pass automated vehicle inspection system and method

#74
18542036
2024-07-16

Image capturing unit and inspection system

#75
18080006
2023-11-28

Semiconductor inspection tool system and method for wafer edge inspection

#76
15998452
2019-09-03

Lighting apparatus for conveyors

#77
15725085
2018-08-21

Detection and identification of opaqueness of vehicle windows

#78
15499959
2018-05-15

Apparatus and a method for inspecting a light transmissive optical component

#79
14485929
2015-08-18

Night vision device test apparatus