Double Beam ThemoReflectance Spectroscopy (DBTRS) for Conductive Area Inspection

MULTI-SPECTRAL IMAGING SYSTEM AND METHOD FOR CONDUITS

INSPECTION APPARATUS AND METHOD

Apparatus and Testing Methodology for Optically Determining Properties Specific to Drill Well Cuttings

Apparatus and System for Visual Inspection of Fiber Ends and Image Analysis Tool for Detecting Contamination

OPTICAL INSPECTION TOOL INCLUDING FIELD APERTURE SYSTEM HAVING DIFFERENT TRANSMITTANCE FOR DIFFERENT RADIATION WAVELENGTHS AND METHOD OF USING THEREOF

SUBSTRATE INSPECTION APPARATUS

INSPECTION DEVICE

DEVICE FOR DETECTING FOREIGN MATTERS

MULTISPOT OPTICAL SYSTEM AND METHODS OF USE

OPTICAL APPARATUS, OPTICAL INSPECTION SYSTEM, OBJECT IMAGING METHOD, AND NON-TRANSITORY STORAGE MEDIUM STORING OBJECT IMAGING PROGRAM

DYNAMIC RANGE EXTENSION OF OPTICAL SYSTEMS WITH MULTIPLE LOW INTENSITY BEAMS

SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD

INSPECTION DEVICE AND INSPECTION METHOD

SYSTEM FOR NONDESTRUCTIVE MEASUREMENT OF A SAMPLE

VISION INSPECTION SYSTEMS AND METHODS USING LIGHT SOURCES OF DIFFERENT WAVELENGTHS

SURFACE INSPECTION DEVICE AND SURFACE INSPECTION METHOD

DEFECT INSPECTION SYSTEM AND DEFECT INSPECTION METHOD

WOUND CARE IMAGE ANALYSIS USING A SMARTPHONE

DEPOSITION MONITOR FOR SEMICONDUCTOR MANUFACTURING SYSTEM

Surface Inspection Sensor

DUAL SCAN BEAM SEPARATION WITH INDEPENDENT ANGLE OF INCIDENCE DEFECT SCANNER AND OPTICAL INSPECTOR

SPECTRAL ANGULAR METROLOGY

ILLUMINATION LIGHT SOURCE AND SUBSTRATE INSPECTION APPARATUS INCLUDING THE SAME

BEAM SPLITTER USING MULTI-REFRACTIVE INDEX LAYER AND DEFECTIVE ELEMENT DETECTING DEVICE COMPRISING SAME

OPTICAL APPARATUS, OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TRANSITORY STORAGE MEDIUM STORING OPTICAL INSPECTION PROGRAM

DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNED

METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING FOR IMAGE INSPECTION APPARATUS

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

INSPECTION METHOD FOR ELECTRONIC DEVICES

INSPECTION APPARATUS AND INSPECTION METHOD

SYSTEMS AND METHODS FOR DETECTING DEFECTIVE BEVERAGE CANS

OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TRANSITORY STORAGE MEDIUM STORING OPTICAL INSPECTION PROGRAM

Method for Analyzing an Electrode Layer of a Battery Storage Device, Method for Producing a Battery Storage Device, and Production Unit

OPTICAL DEVICE

METHOD AND APPARATUS FOR INSPECTING FULL CONTAINERS

OPTICAL MEASUREMENT APPARATUS

HYPERSPECTRAL IMAGING AND ARTIFICIAL INTELLIGENCE DETECTION METHODS AND SYSTEMS

Methods for Analyzing an Electrode Layer of a Battery Cell Using a KI Engine, Training a KI Engine, Producing a Battery Storage Device, and Production Units

PHOTOACOUSTIC DEVICES AND SYSTEMS INCLUDING ONE OR MORE LIGHT GUIDE COMPONENTS

MEASURING APPARATUS AND METHOD FOR ROUGHNESS AND/OR DEFECT MEASUREMENT ON A SURFACE

Inspection Systems and Methods Employing Different Wavelength Directional Light For Enhanced Imaging

Methods for Analyzing an Electrode Layer of a Battery Cell Using a KI Engine, Training a KI Engine, Producing a Battery Storage Device, and Production Units

SEMICONDUCTOR MEASUREMENT APPARATUS

LIGHT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS

System for optical inspection of a substrate using same or different wavelengths

Method for Monitoring the Compliance of a Container and Apparatus Thereof

INSPECTION SYSTEM AND METHOD FOR ANALYZING DEFECTS

Inspection condition presentation apparatus, surface inspection apparatus, inspection condition presentation method and program

INSPECTION METHOD, INSPECTION DEVICE, MANUFACTURING METHOD, AND MANUFACTURING DEVICE FOR OPTICAL WAVELENGTH CONVERSION SHEET, OPTICAL WAVELENGTH CONVERSION SHEET, BACKLIGHT DEVICE, LIQUID CRYSTAL PANEL, AND LIQUID CRYSTAL DISPLAY DEVICE

SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, AND MANUFACTURING METHOD OF METAL STRIP

Time domain multiplexed defect scanner

OPTICAL INSPECTION METHOD, NON-TRANSITORY STORAGE MEDIUM STORING OPTICAL INSPECTION PROGRAM, PROCESSING DEVICE, AND OPTICAL INSPECTION APPARATUS

ANALYSIS DEVICE AND ANALYSIS METHOD

DEVICE AND METHOD FOR TRANSMISSION INSPECTION OF CONTAINERS HAVING AT LEAST ONE LIGHT-EMITTING DIODE LIGHT SOURCE

PHYSICAL BODY INSPECTION SYSTEM AND DISPLAY CONTROL METHOD

DEFECT IDENTIFICATION USING MACHINE LEARNING IN AN ADDITIVE MANUFACTURING SYSTEM

Methods and systems for targeted monitoring of semiconductor measurement quality

Apparatus and System for Visual Inspection of Fiber Ends and Image Analysis Tool for Detecting Contamination

Substrate inspection apparatus, substrate inspection method, and recording medium

DUVF-MSI Biophotonic Analyzer Device and Methods for Detecting Pathogens on Plants and Measuring Stress Response

LUMINAIRE ELEMENT FOR AN INSPECTION TUNNEL, LUMINAIRE STRIP, AND INSPECTION TUNNEL

Optical inspection device and inspecting method using the same

Optical diagnostics of semiconductor process using hyperspectral imaging

Optical inspection method, non-transitory storage medium storing optical inspection program, processing device, and optical inspection apparatus

Method for identifying raw meat and high-quality fake meat based on gradual linear array change of component

Apparatus for inspecting substrate and method for fabricating semiconductor device using the same

MANUAL INSPECTION WORKSTATION

Device for recognizing defects remaining in finished surface of product in images taken under multiple colors of light

Optical sorter

Inspection system, inspection method, program, and storage medium

TEST DEVICE AND METHOD FOR TESTING THE RETROREFLECTION AND/OR FLUORESCENCE OF AN OBJECT

Illumination system, an imaging system, and a method for illumination of a sample in a container

Method and device for optically inspecting containers

Method and device for optically inspecting containers

Inspection device

System and method for detecting glass-ceramic material

Product inspection method and product inspection apparatus

Inspection apparatus comprising a first imager imaging fluorescence having a wavelength longer than a first wavelength and a second imager imaging fluorescence having a wavelength shorter than a second wavelength and inspection method

Method for the identification of defects in transparent slabs and related system

Optical detection device, optical detection method, method for designing optical detection device, sample classification method, and defect detection method

Optical imaging apparatus, optical inspection apparatus, and optical inspection method

Electronic Device Valuation System

Evaluating surfaces

Defect identification using machine learning in an additive manufacturing system

Device and method for providing sorted stopper elements

MULTI-SOURCE ILLUMINATION UNIT AND METHOD OF OPERATING THE SAME

DEVICE AND METHOD FOR DETECTING AND/OR EVALUATING ARTICLES OR PRODUCTS

Composite structures with damage detection capability

Method and arrangement for determining a position of an object

Learning device, inspection device, learning method, and inspection method

Tubular body inner surface inspection apparatus and tubular body inner surface inspection method

Inspection system, inspection method, program, and storage medium

Measurement cycle determination device, measurement cycle determination program and method thereof

Optical system, and imaging apparatus and imaging system including the same

Inspection apparatus, inspection system, and inspection method

Gemstone testing apparatus

Method for inspecting surface of wafer, device for inspecting surface of wafer, and manufacturing method of electronic component

Optical diagnostics of semiconductor process using hyperspectral imaging

Optical diagnostics of semiconductor process using hyperspectral imaging

SiC substrate evaluation method and method for manufacturing SiC epitaxtal wafer

Portable organic molecular sensing device and related systems and methods

Water measurement apparatus

Defect detecting device and defect detecting method

Inspection system and method of inspection

SiC substrate evaluation method and method for manufacturing SiC epitaxial wafer

Appearance inspection device, lighting device, and imaging lighting device

Surface height determination of transparent film

Diagnosis support apparatus, diagnosis support method, diagnosis method, and repair method of vacuum degassing tank

Apparatus for semiconductor package inspection

System for detecting crack growth of asphalt pavement based on binocular image analysis

Method for leakage detection of underground pipeline corridor based on dynamic infrared thermal image processing

Measurement cycle determination device, measurement cycle determination program and method thereof

Mode selection for inspection

Defect investigation device simultaneously detecting photoluminescence and scattered light

Method and system for detecting inclusions in float glass based on wavelength(s) analysis

Inspection apparatus, inspection system, and inspection method

Visual inspection device and illumination condition setting method of visual inspection device

Sensor system, information processing device, and sensor management method

Image inspection device and illumination device

Inspecting an object that includes a photo-sensitive polyimide layer

Apparatus and a method for inspecting a light transmissible optical component

Image inspection device and illumination device

Method and device for optical yarn quality monitoring

METHOD AND SYSTEM FOR YARN QUALITY MONITORING

Damage detection system and damage detection method

HHG source, inspection apparatus and method for performing a measurement

Methods and systems for quality inference and control for additive manufacturing processes

Method for producing a prophylactic article

Method of inspecting a terminal of a component mounted on a substrate and substrate inspection apparatus

Device for checking tyres

Methods and apparatus for characterizing a specimen container and specimen

Method of inspecting foreign substance on substrate

Image inspection device

Apparatus for inspecting back surface of epitaxial wafer and method of inspecting back surface of epitaxial wafer using the same

Patterned optic for epi-fluorescence collection

Systems and methods for metrology with layer-specific illumination spectra

Installation for the optical inspection of surface regions of objects

Active real-time characterization system using fiber optic-based transmission media

System and method for inspecting containers using multiple radiation sources

Identifying defects in transparent containers

Apparatus and method for optical inspection of objects, in particular metal lids

Portable organic molecular sensing device and related systems and methods

Inspection device for container closures

DEVICES AND METHODS FOR DETECTION OF COUNTERFEIT OR ADULTERATED PRODUCTS AND/OR PACKAGING

Active real-time characterization system

Plant information acquisition system, plant information acquisition device, plant information acquisition method, crop management system and crop management method

Detecting damage to a converter device

INSPECTION APPARATUS, INSPECTION SYSTEM, AND ARTICLE MANUFACTURING METHOD

Simultaneous multi-spot inspection and imaging

Inspection systems and techniques with enhanced detection

Photon emitter array including photon emitters with different orientations

Inspecting device and method for inspecting inspection target

Multi-wavelength laser check detection tool

System and method for defect detection and photoluminescence measurement of a sample

Inspection method and apparatus and lithographic apparatus

Method of evaluating epitaxial wafer

Decoration line

Method of manufacturing printed circuit board and method of inspecting printed circuit board

All reflective wafer defect inspection and review systems and methods

System and method for semiconductor wafer inspection and metrology

Inspectable black glass containers

Inspection systems and techniques with enhanced detection

Portable three-dimensional metrology with data displayed on the measured surface

Active real-time characterization system

Spherical light-emitting structure for inspecting workpiece

Method for the surface inspection of long products and apparatus suitable for carrying out such a method

Three-dimensional shape measuring device capable of measuring color information

Method of inspecting foreign substance on substrate

Detection of spurious information or defects on playing card backs

Apparatus and methods for detecting defects in vertical memory

Apparatus and methods for combined brightfield, darkfield, and photothermal inspection

Inspection apparatus and inspection method

Defect inspection apparatus and defect inspection method

Diode laser based broad band light sources for wafer inspection tools

System and method for defect detection and photoluminescence measurement of a sample

Simultaneous multi-spot inspection and imaging

Photon emitter array

Detection of spurious information or defects on playing card backs

Apparatus and method for recognizing stamped character and system for detecting stamped depth of character using the same

Inspection system including parallel imaging paths with multiple and selectable spectral bands

Apparatus and methods for detecting defects in vertical memory

Board inspection method

Portable three-dimensional metrology with data displayed on the measured surface

Diode laser based broad band light sources for wafer inspection tools

Systems and methods for sample inspection and review

Resin detection system

Automatic Optical Detection Method and Optical Automatic Detector

Large particle detection for multi-spot surface scanning inspection systems

Method of acquiring an image in a transparent, colored container

Multiple radiation inspection of ophthalmic lenses

Apparatus, system and method for detecting defects of metallic lids

Apparatus for inspecting light emitting diode and inspecting method using said apparatus

Multi-spectral imaging system and method of surface inspection therewith

System and method for capturing illumination reflected in multiple directions

Surface scanning device

Illumination system for optical inspection

Method of assessing a model of a substrate, an inspection apparatus and a lithographic apparatus

Fiber property measurement

System and method for acquiring images

Method for identifying surface characteristics of metallurgical products, especially continuously cast and rolled products, and a device for carrying out said method

Illumination system for optical inspection

Surface inspection apparatus

Circuit board detecting device and method thereof

Backlight apparatus with remote light source

METHOD AND APPARATUS FOR IDENTIFYING TOOTH-COLOURED TOOTH FILLING RESIDUES

Imaging system with high-spectrum resolution and imaging method for the same

Light Source Device for Components Inspection

DETACHABLY COUPLED IMAGE INTENSIFIER AND IMAGE SENSOR

Online internal quality inspection method and apparatus

Methods and apparatus for inspecting an object

Apparatus for feature detection

Illumination system for optical inspection

Device for scanning a yarn with a light beam

Non-destructive inspection method and apparatus therefor

Dark field inspection system

Sample inspection system

Sample inspection system

Sample inspection system

Multi-wavelength aperture and vision system

Method for providing plural magnified images

Method for detecting foreign bodies within a continuously guided product stream and apparatus for carrying out the method

Method for identifying tooth-colored tooth filling residues

Time domain multiplexed defect scanner

Arbitrary wavefront compensator for deep ultraviolet (DUV) optical imaging system