168174 ⎘
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems specially adapted for particular applications; Investigating the presence of flaws or contamination; Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges; Grading and classifying of flaws Flaw counting
SHEET FIXING APPARATUS AND METHOD OF MANUFACTURING COMBINATION OF WORKPIECE AND SHEET FIXED THERETO
#2SYSTEMS AND METHODS FOR ENHANCED EVALUATION OF PRE-OWNED ELECTRONIC DEVICES AND PROVISION OF RELATED SERVICES
#3METHOD OF INSPECTING SEMICONDUCTOR DEVICE
#4Systems and methods for enhanced evaluation of pre-owned electronic devices and provision of related services
#5System and method for detection of mobile device fault conditions
#6Method and electronic apparatus for displaying inspection result of board
#7MEASUREMENT DEVICE AND MEASUREMENT METHOD
#8Information processing apparatus related to machine learning for detecting target from image, method for controlling the same, and storage medium
#9System and method for detection of mobile device fault conditions
#10Method for adaptive sampling in examining an object and system thereof
#11Crack analysis device, crack analysis method, and crack analysis program
#12System and method for production line monitoring
#13System and method for self-performing a cosmetic evaluation of an electronic device
#14GLASS SUBSTRATE PRODUCTION MANAGEMENT SYSTEM AND GLASS SUBSTRATE PRODUCTION MANAGEMENT METHOD
#15Defect inspection apparatus, defect inspection method, and manufacture method for semiconductor device
#16Apparatus and method for inspecting a surface of a wafer
#17Method and system for determining cumulative foreign object characteristics during fabrication of a composite structure
#18Inspection and cosmetic grading through image processing system and method