168178 ⎘
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems specially adapted for particular applications; Investigating the presence of flaws or contamination; Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges; Grading and classifying of flaws using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing the measurements made in two or more directions, angles, positions
GENERATION AND ASSESSMENT OF STRIPED LIGHTING ILLUMINATED DAMAGE DETECTION DATA
#2PRODUCT INSPECTION SYSTEM AND PRODUCT INSPECTION METHOD
#3SPECIALIZED LIGHTING CONFIGURATION FOR PROJECTION OF STRIPED LIGHTING
#4VARIABLY SWITCHED UNIFORM AND STRIPED LIGHTING PANEL
#5TECHNIQUES AND MECHANISMS FOR STRIPED LIGHTING DAMAGE DETECTION
#6STRIPED LIGHTING VEHICLE TUNNELS FOR DAMAGE DETECTION
#7INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM
#8Laser scanning of cable and cable accessory components subjected to mechanical loads and elastic or inelastic deformation
#9Lock-in Averaging for Semiconductor Diagnostics
#10SYSTEMS AND METHODS FOR TRANSLATIONAL TRIGGERING FOR IMAGE-BASED INSPECTION OF OBJECTS
#11VISUAL INSPECTION APPARATUS AND VISUAL INSPECTION METHOD
#12METHOD FOR FINDING BLACK SPOTS IN SEPARATOR
#13MEASUREMENT DEVIATION ANALYSIS FOR A SEMICONDUCTOR SPECIMEN
#14INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM
#15Method for detecting defects of the horizontal mold seal for glass containers
#16Information processing apparatus, information processing method, and storage medium
#17Apparatus and method for inspecting containers which are at least partially transparent to a predetermined electromagnetic radiation
#18Information processing apparatus, information processing method, and non-transitory computer-readable storage medium
#19Strain measurement method and strain measurement apparatus
#20Optical scanning for industrial metrology
#21Electronic device for optically checking appearance of product for defects
#22Electronic device for optically checking appearance of product for defects
#23Method for detecting wafer backside defect
#24Non invasive process for the evaluation of the quality of internal dense connective tissues
#25Appearance inspection system, setting device, and inspection method
#26Systems and methods for detecting defects on a wafer
#27Geographic atrophy identification and measurement
#28System and method for self-performing a cosmetic evaluation of an electronic device
#29Geographic atrophy identification and measurement
#30Systems and methods for detecting defects on a wafer
#31Systems and methods for detecting defects on a wafer
#32Defect inspection method
#33Defect inspection method and apparatus
#34DISK SURFACE DEFECT INSPECTION METHOD AND APPARATUS
#35Systems and methods for detecting defects on a wafer
#36Defect inspection method
#37Defect Inspection Method and Apparatus
#38Multi-imaging automated inspection methods and systems for wet ophthalmic lenses
#39Method and apparatus for detecting defects using structured light
#40Defect inspection method
#41Optical inspection apparatus for substrate defect detection
#42Surface inspection method and surface inspection device
#43Apparatus for checking the quality of preforms each having a body made of plastics material