168179 ⎘
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems specially adapted for particular applications; Investigating the presence of flaws or contamination; Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges; Grading and classifying of flaws Taking dimensions of defect into account
METAL CONTAINER INSPECTION DEVICE
#2MATERIAL INSPECTION SYSTEM
#3METHOD AND APPARATUS FOR OPTICALLY CHECKING MOLDED PARTS
#4MULTIFUNCTIONAL DEVICE, SYSTEM, AND METHOD FOR MONITORING CREPED PRODUCT QUALITY AND BLADE WEAR
#5MULTI-ANGLE VEHICLE DEFECT MEASUREMENT USING SURFACE-ADAPTIVE OPTICAL CORRECTIONS
#6INSPECTION DEVICE AND INSPECTION METHOD
#7TAB DEFECT DETECTION METHOD AND TAB DEFECT DETECTION DEVICE FOR BATTERY CELL
#8SYSTEM FOR NONDESTRUCTIVE MEASUREMENT OF A SAMPLE
#9METHOD FOR OBSERVING SURFACE
#10FAULT DETECTION AND CLASSIFICATION (FDC) FOR ENDPOINT DETECTION (EPD) BY REFLECTOMETRY
#11IMAGING AND ANALYZING CRACK PROPAGATION IN GLASS
#12OPTICAL FOREIGN SUBSTANCE DETECTION DEVICE USING LIGHT SCATTERING AND IMAGE ANALYSIS
#13COMPONENT CORROSION PROGNOSTICS USING COMPUTED TOMOGRAPHY (CT)-SCAN AND METHODS
#14Surface Inspection Sensor
#15MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD
#16METHOD OF IDENTIFYING DEFECTS IN CRYSTALS
#17SYSTEM AND METHOD FOR GRADING, PROCESSING, AND LOADING LOGS
#18SPUTTER MEASUREMENT SYSTEM
#19VISUAL INSPECTION APPARATUS AND VISUAL INSPECTION METHOD
#20INSPECTION DEVICE AND INSPECTION METHOD FOR FILTER
#21INSPECTION APPARATUS, RECORDING MEDIUM, AND INSPECTION SYSTEM
#22METHOD AND APPARATUS FOR DETECTING DEFECTS IN THE SURFACE OF CURVED ARTICLES
#23Method for Inspecting Surface Deformation of Structure, System for Inspecting Surface Deformation of Structure, and Structure Protection Sheet
#24MACRO PLASTIC AND MICRO PLASTIC DETECTION METHOD BASED ON RGB AND HYPERSPECTRAL IMAGE FUSION
#25GRADING COSMETIC APPEARANCE OF A TEST OBJECT
#26DEFECT INSPECTION DEVICE AND METHOD FOR INSPECTING DEFECT
#27METHOD AND SYSTEM FOR DETECTING A FALSE ERROR ON A COMPONENT OF A BOARD INSPECTED BY AN AOI MACHINE
#28INSPECTION SYSTEM AND METHOD FOR ANALYZING DEFECTS
#29Foreign Substance Detection Device and Detection Method
#30System and method for assessing wear on the tread of a shoe for limiting slip and fall risk
#31LEATHER DEFECT DETECTION SYSTEM
#32DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING SINGLE INCIDENT LIGHT-BASED PHOTOLUMINESCENCE AND DEFECT CLASSIFICATION METHOD USING THE SAME
#33Multi-sensor pipe inspection system and method
#34Optimized printing defect compensation using automatic job image repositioning
#35Surface defect monitoring system
#36Method and devices to construct artificial inline defects to calibrate inspection hardware on automated fiber placement systems
#37Grading cosmetic appearance of a test object based on multi-region determination of cosmetic defects
#38Qualitative or quantitative characterization of a coating surface
#39QUALITATIVE OR QUANTITATIVE CHARACTERIZATION OF A COATING SURFACE
#40Smart defect calibration system in semiconductor wafer manufacturing
#41Smart coordinate conversion and calibration system in semiconductor wafer manufacturing
#42Smart coordinate conversion and calibration system in semiconductor wafer manufacturing
#43Method for performing smart semiconductor wafer defect calibration
#44Method for smart conversion and calibration of coordinate
#45Method for smart conversion and calibration of coordinate
#46Defect inspection device
#47FLAW INSPECTION APPARATUS AND METHOD
#48Multimode defect classification in semiconductor inspection
#49Multi-sensor pipe inspection utilizing pipe templates to determine cross sectional profile deviations
#50Multi-sensor pipe inspection system and method
#51Remote visual inspection method and system
#52Interactive semi-automated borescope video analysis and damage assessment system and method of use
#53Smart defect calibration system and the method thereof
#54Item inspecting device
#55Method for producing an OSB
#56Methods for defect inspection, sorting, and manufacturing photomask blank
#57Method and system for inspecting wafers for electronics, optics or optoelectronics
#58Inspection method and inspection apparatus
#59System and method for self-performing a cosmetic evaluation of an electronic device
#60Evaluation method of defect size of photomask blank, selection method, and manufacturing method
#61Remote visual inspection system and method
#62Prepreg production method
#63INSPECTION SYSTEM AND METHOD OF DEFECT DETECTION ON SPECULAR SURFACES
#64Extraction of systematic defects
#65Defect detection apparatus, defect detection method, and computer program
#66Defect inspection device and inspection method
#67Method and apparatus for inspecting a surface of a substrate
#68Method of measuring defect density of single crystal
#69SYSTEM AND METHOD FOR DETECTING A DEFECT OF A SUBSTRATE
#70Mask defect measurement method, mask quality determination and method, and manufacturing method of semiconductor device
#71Method for detecting particles and defects and inspection equipment thereof
#72Defect inspection apparatus
#73Method and system for determining cumulative foreign object characteristics during fabrication of a composite structure
#74Method for detecting particles and defects and inspection equipment thereof
#75Scatterometer-interferometer and method for detecting and distinguishing characteristics of surface artifacts
#76Method for examining defect in steel bar and apparatus therefor
#77Method for detecting particles and defects and inspection equipment thereof
#78Method and system for detecting defects
#79Multi-resolution inspection system and method of operating same
#80Pipe inspection video processing system
#81Inspection apparatus and inspection method
#82Inspection and cosmetic grading through image processing system and method
#83Contrast-based imaging and analysis computer-implemented methods to analyze thermography data for nondestructive evaluation
#84System and method to determine depth for optical wafer inspection