ClassID:

168215

G01N2021/8967 - CPC Classification

Classification description:

Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems specially adapted for particular applications; Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined; Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod Discriminating defects on opposite sides or at different depths of sheet or rod

Recent Application in this class:
#1
20240363895
2024-10-31

SOLID ELECTRODES, ASSEMBLIES AND SOLID STATE BATTERIES THEREOF

#2
20240102940
2024-03-28

DEVICE FOR INSPECTING THE SURFACE OF A TRANSPARENT OBJECT, AND CORRESPONDING METHOD

#3
20220328865
2022-10-13

Making and inspecting a web of vitreous lithium sulfide separator sheet and lithium electrode assemblies and battery cells

#4
20220136982
2022-05-05

Region prober optical inspector

#5
20210320328
2021-10-14

Lithium ion conducting sulfide glass fabrication

#6
20200333258
2020-10-22

Methods and apparatus for detecting surface defects on glass sheets

#7
20200259212
2020-08-13

Lithium ion conducting sulfide glass fabrication

#8
20200243902
2020-07-30

METHODS OF MAKING AND INSPECTING A WEB OF VITREOUS LITHIUM SULFIDE SEPARATOR SHEET AND LITHIUM ELECTRODE ASSEMBLIES

#9
20190277774
2019-09-12

Method and apparatus for inspecting defects on transparent substrate and method emitting incident light

#10
20190257765
2019-08-22

Method and apparatus for inspecting defects on transparent substrate

#11
20180164225
2018-06-14

Optical device for detecting an internal flaw of a transparent substrate and method for the same

#12
20170229731
2017-08-10

Methods of making and inspecting a web of vitreous lithium sulfide separator sheet and lithium electrode assemblies

#13
20160354808
2016-12-08

Substrate mark detection apparatus and substrate mark detection method

#14
20160327494
2016-11-10

Upper surface foreign material detecting device of ultra-thin transparent substrate

#15
20160151880
2016-06-02

Method for producing a mirror substrate blank of titanium-doped silica glass for EUV lithography, and system for determining the position of defects in a blank

#16
20150346109
2015-12-03

Method for particle detection on flexible substrates

#17
20140347664
2014-11-27

Apparatus and method for identifying defects within the volume of a transparent sheet and use of the apparatus

#18
20130044209
2013-02-21

APPARATUS AND METHOD FOR DETECTING THE SURFACE DEFECT OF THE GLASS SUBSTRATE

#19
20120133762
2012-05-31

METHOD AND SYSTEM FOR DETECTING AND CLASSIFYING A DEFECT OF A SUBSTRATE

#20
20110221885
2011-09-15

Transparent body inspecting device

#21
20090201368
2009-08-13

GLAZING INSPECTION

#22
20080278718
2008-11-13

Defect inspection method and apparatus for transparent plate-like members

#23
20070216897
2007-09-20

Defect inspection method and apparatus for transparent plate-like members

#24
20060066845
2006-03-30

System and method for inspecting a light-management film and method of making the light-management film

#25
15854384
2020-10-06

System and method for in-process inspection within advanced manufacturing processes