168262 ⎘
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems specially adapted for particular applications; Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined; Inspecting patterns on the surface of objects for PCB's for leads, e.g. position, curvature
OPTICAL PLANAR METROLOGY MOUNTING DEVICE AND METHODS FOR ABRASIVE CROSS-SECTIONING OF ELECTRICAL COMPONENTS
#2Electronic component evaluation method, electronic component evaluation device, and electronic component evaluation program
#3Inspection system and method for defect analysis of wire connections
#4Method of manufacturing printed circuit board and method of inspecting printed circuit board
#5Substrate detection device and method
#6Image processing device, method for controlling same, program, and inspection system
#7Recognition apparatus, recognition method, mounting apparatus, and mounting method
#8PART INSPECTION SYSTEM
#9THREE-DIMENSIONAL SHAPE MEASUREMENT APPARATUS AND THREE-DIMENSIONAL SHAPE MEASUREMENT METHOD
#10Inspection method
#11OPTICALLY MONITORING AN ALOX FABRICATION PROCESS
#12Micro-surface inspection tool
#13Image capturing for pattern recognition of electronic devices
#14Perspective switching optical device for 3D semiconductor inspection
#15Method of manufacturing ball array devices using an inspection apparatus having two or more cameras and ball array devices produced according to the method
#16Method of manufacturing ball array devices using an inspection apparatus having one or more cameras and ball array devices produced according to the method
#17Image pick-up inspection equipment and method
#18Method and apparatus for backlighting and imaging multiple views of isolated features of an object