ClassID:

168049

G01N21/68 - CPC Classification

Classification description:

Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using high frequency electric fields

Recent Application in this class:
#1
20240096608
2024-03-21

PLASMA MONITORING SYSTEM, PLASMA MONITORING METHOD, AND MONITORING DEVICE

#2
20230349832
2023-11-02

HIGH SPECTRAL AND TEMPORAL RESOLUTION GLOW DISCHARGE SPECTROMETRY DEVICE AND METHOD

#3
20230258500
2023-08-17

SPATIAL OPTICAL EMISSION SPECTROSCOPY FOR ETCH UNIFORMITY

#4
20230141107
2023-05-11

MIXED SALINITY IMPACT ON INTERPRETATION AND REMEDIAL DETECTION TECHNIQUE

#5
20220365009
2022-11-17

DEVICE FOR MEASURING ELEMENT CONCENTRATIONS IN PLANT LEAVES AND METHOD OF IMPLEMENTING THE SAME

#6
20220333989
2022-10-20

Spatial optical emission spectroscopy for etch uniformity

#7
20220146430
2022-05-12

Portable water quality instrument

#8
20220136975
2022-05-05

Device and method for detecting concentration of specimen

#9
20220082584
2022-03-17

Probe for detecting near field and near-field detection system including the same

#10
20220074862
2022-03-10

Portable water quality instrument

#11
20220034817
2022-02-03

Multi-dimensional spectroscopy of macromolecules

#12
20210310956
2021-10-07

Glow plasma gas measurement signal processing

#13
20210180189
2021-06-17

Apparatus for detecting or monitoring for a chemical precursor in a high temperature environment

#14
20210111008
2021-04-15

METHOD OF DETERMINING CLEANING CONDITIONS AND PLASMA PROCESSING DEVICE

#15
20200343074
2020-10-29

GLOW PLASMA STABILIZATION

#16
20200132606
2020-04-30

SYSTEMS AND METHODS FOR RAPID ELEMENTAL ANALYSIS OF AIRBORNE PARTICLES USING ATMOSPHERIC GLOW DISCHARGE OPTICAL EMISSION SPECTROSCOPY

#17
20200083030
2020-03-12

Plasma sensing device, plasma monitoring system and method of controlling plasma processes

#18
20200066499
2020-02-27

Plasma monitoring apparatus and plasma processing system

#19
20200049560
2020-02-13

Optical emission spectroscopy system, method of calibrating the same, and method of fabricating semiconductor device

#20
20190264324
2019-08-29

Apparatus for detecting or monitoring for a chemical precursor in a high temperature environment

#21
20190252164
2019-08-15

OES device, plasma processing apparatus including the same and method of fabricating semiconductor device

#22
20190170653
2019-06-06

PLASMA PROCESSING APPARATUS, PLASMA PROCESSING METHOD AND PLASMA PROCESSING ANALYSIS METHOD

#23
20180313763
2018-11-01

Optical detection of tracer gases in a gas discharge cell having unexposed electrodes

#24
20180275069
2018-09-27

ICP emission spectrophotometer

#25
20180266960
2018-09-20

Method and tool for producing sample containing object, method for performing glow discharge optical emission spectrometry, and glow discharge optical emission spectrometer

#26
20180252650
2018-09-06

Computed tomography using intersecting views of plasma using optical emission spectroscopy during plasma processing

#27
20180217121
2018-08-02

Method for determining a mixing ratio of N organic, miscible components in a mixture of said components and use of an inorganic marker

#28
20180190548
2018-07-05

Method for measuring gas dissociation degrees

#29
20180158657
2018-06-07

Methods and systems for chamber matching and monitoring

#30
20180158652
2018-06-07

Methods and systems for chamber matching and monitoring

#31
20180100803
2018-04-12

Plasma spectroscopic analysis method and inhibitor of plasma emission derived from non-target

#32
20180088031
2018-03-29

Systems and methods for detecting oxygen in-situ in a substrate area of a substrate processing system

#33
20180052252
2018-02-22

Method and system for determining downhole optical fiber orientation and/or location

#34
20180024068
2018-01-25

Analysis system for online-transferred analysis sample

#35
20180013259
2018-01-11

Laser apparatus enabling calculation of effective driving time and remaining lifetime taking account of drive conditions including temperature

#36
20170343478
2017-11-30

Optical emission spectroscope with a pivotably mounted inductively coupled plasma source

#37
20170314991
2017-11-02

Spatially resolved optical emission spectroscopy (OES) in plasma processing

#38
20170307551
2017-10-26

Sample-analyzing system

#39
20170287794
2017-10-05

Methods for manufacturing semiconductor device and for detecting end point of dry etching

#40
20170254786
2017-09-07

Thermal stress resistant micro-plasma emission detector unit

#41
20170254755
2017-09-07

In-situ spatially resolved plasma monitoring by using optical emission spectroscopy

#42
20170214134
2017-07-27

Wideband antenna structure with optics reflector as ground plane and associated methods

#43
20170088973
2017-03-30

Inspection method of vitreous silica crucible

#44
20170045460
2017-02-16

Induction device

#45
20170045457
2017-02-16

Glow discharge spectroscopy method and system for measuring in situ the etch depth of a sample

#46
20170010217
2017-01-12

Methods of spectroscopic analysis of diamonds and apparatuses thereof

#47
20160349403
2016-12-01

Method and system for determining downhole optical fiber orientation and/or location

#48
20160327683
2016-11-10

Downhole fluid properties analysis device and tools comprising such a device

#49
20160225681
2016-08-04

Plasma processing apparatus, plasma processing method and plasma processing analysis method

#50
20160202187
2016-07-14

Plasma spectrochemical analysis method and plasma spectrochemical analyzer

#51
20160161416
2016-06-09

Method of accurate thickness measurement of boron carbide coating on copper foil

#52
20150276611
2015-10-01

Stabilized ICP emission spectrometer and method of using

#53
20150276484
2015-10-01

ICP emission spectrometer

#54
20150241356
2015-08-27

Plasma spectrometry method

#55
20150234049
2015-08-20

Object detection systems

#56
20150226546
2015-08-13

System for light source location detection

#57
20150226480
2015-08-13

Optimization of nucleation and crystallization for lyophilization using gap freezing

#58
20150184935
2015-07-02

Optimization of nucleation and crystallization for lyophilization using gap freezing

#59
20150170895
2015-06-18

Devices and systems including a boost device

#60
20150169847
2015-06-18

Systems and methods for computer models of animal feed

#61
20150124250
2015-05-07

Spatially resolved optical emission spectroscopy (OES) in plasma processing

#62
20150085280
2015-03-26

Induction device

#63
20150015881
2015-01-15

Gas concentration estimation device

#64
20140362375
2014-12-11

System for provision of analysis results, analysis terminal, and method for provision of analysis results

#65
20140262029
2014-09-18

Plasma processing apparatus and analyzing apparatus

#66
20140261271
2014-09-18

Plasma generation provision, internal combustion engine and analysis provision

#67
20140160477
2014-06-12

Micro-plasma emission detector unit and method

#68
20140071448
2014-03-13

High-frequency power supply for plasma and ICP optical emission spectrometer using the same

#69
20130208275
2013-08-15

Analysis apparatus and analysis method

#70
20130208274
2013-08-15

Analysis apparatus and analysis method

#71
20130057858
2013-03-07

Plasma emission transfer and modification device

#72
20130014943
2013-01-17

Microplasma for downhole compositional analysis

#73
20130008048
2013-01-10

Device and method for controlling a dehydration operation during a freeze-drying treatment

#74
20130004682
2013-01-03

Method and device for plasma-treating workpieces

#75
20120325783
2012-12-27

Induction device

#76
20120305189
2012-12-06

Method and apparatus for detecting plasma unconfinement

#77
20120224175
2012-09-06

MICROWAVE PLASMA ATOMIC FLUORESCENCE MERCURY ANALYSIS SYSTEM

#78
20120192448
2012-08-02

Optimization of nucleation and crystallization for lyophilization using gap freezing

#79
20120170039
2012-07-05

Methods and apparatus for normalizing optical emission spectra

#80
20120006998
2012-01-12

CONFIGURATIONS OF USING A POINT LIGHT SOURCE IN THE CONTEXT OF SAMPLE SEPARATION

#81
20110315661
2011-12-29

Etching apparatus, analysis apparatus, etching treatment method, and etching treatment program

#82
20110294225
2011-12-01

Method for detecting optical signals, microfluidic mixing chip having light emitting compound and system thereof

#83
20110291567
2011-12-01

Discharge lamp for GDS with an axial magnetic field

#84
20110259268
2011-10-27

METHOD FOR MEASURING DOPANT CONCENTRATION DURING PLASMA ION IMPLANTATION

#85
20110177625
2011-07-21

Method and apparatus for identifying the chemical composition of a gas

#86
20110133074
2011-06-09

ANALYTICAL METHOD AND ANALYTICAL SYSTEM

#87
20110122396
2011-05-26

Photonic measurement instrument using fiber optics

#88
20110090503
2011-04-21

APPARATUS FOR DETECTING ARCS

#89
20110068262
2011-03-24

Systems and methods for determining recycled thermoplastic content

#90
20100320379
2010-12-23

Devices and systems including a boost device

#91
20100255604
2010-10-07

Sample introduction solutions and methods

#92
20100224322
2010-09-09

ENDPOINT DETECTION FOR A REACTOR CHAMBER USING A REMOTE PLASMA CHAMBER

#93
20100216258
2010-08-26

Method for measuring dopant concentration during plasma ion implantation

#94
20100072391
2010-03-25

Nano-particle trap using a microplasma

#95
20100050736
2010-03-04

FLUID ANALYZER SYSTEMS

#96
20090299668
2009-12-03

Method of depositing a silicon-containing material by utilizing a multi-step fill-in process in a deposition machine

#97
20090272402
2009-11-05

Method and apparatus for detecting plasma unconfinement

#98
20090251700
2009-10-08

Methods and apparatus for normalizing optical emission spectra

#99
20090237667
2009-09-24

Particle density measuring probe and particle density measuring equipment

#100
20090237496
2009-09-24

SUBSTRATE FOR OBSERVATION AND OBSERVATION SYSTEM

#101
20090233384
2009-09-17

Method for measuring dopant concentration during plasma ion implantation

#102
20090229348
2009-09-17

REAL TIME LEAK DETECTION SYSTEM OF PROCESS CHAMBER

#103
20090218483
2009-09-03

Analysis method and analysis apparatus

#104
20090180113
2009-07-16

Method and apparatus for identifying the chemical composition of a gas

#105
20090166179
2009-07-02

Induction device

#106
20090159211
2009-06-25

Plasma processing apparatus

#107
20090088333
2009-04-02

TARGET MOLECULE EVALUATION METHOD AND APPARATUS

#108
20090059221
2009-03-05

Plasma spectroscopy system with a gas supply

#109
20090040505
2009-02-12

In-stream spectroscopic elemental analysis of particles being conducted within a gaseous stream

#110
20090033915
2009-02-05

Method of forming a deposited material by utilizing a multi-step deposition/etch/deposition (D/E/D) process

#111
20090001052
2009-01-01

Plasma processing apparatus and plasma processing method

#112
20080291428
2008-11-27

Full spectrum adaptive filtering (FSAF) for low open area endpoint detection

#113
20080245131
2008-10-09

Methods and apparatus for evaluating insulating glass units

#114
20080173810
2008-07-24

Devices and systems including a boost device

#115
20080123082
2008-05-29

Multivariate monitoring method for plasma process machine

#116
20080078504
2008-04-03

Self-calibrating optical emission spectroscopy for plasma monitoring

#117
20080011422
2008-01-17

Plasma processing system and apparatus and a sample processing method

#118
20070284044
2007-12-13

Method and apparatus for measuring electron density of plasma and plasma processing apparatus

#119
20070256477
2007-11-08

Fluid analyser systems

#120
20070201016
2007-08-30

Method And Apparatus For Seasoning Semiconductor Apparatus Of Sensing Plasma Equipment

#121
20070193514
2007-08-23

Method and apparatus for measuring electron density of plasma and plasma processing apparatus

#122
20070164003
2007-07-19

Plasma generating equipment

#123
20070151209
2007-07-05

METHODS AND APPARATUS FOR EVALUATING INSULATING GLASS UNITS

#124
20070089835
2007-04-26

Method and apparatus for measuring electron density of plasma and plasma processing apparatus

#125
20060290925
2006-12-28

Gas monitor device

#126
20060285108
2006-12-21

Optical emission device with boost device

#127
20060279736
2006-12-14

Methods and apparatus for evaluating insulating glass units

#128
20060219710
2006-10-05

Spectroscopy-based real-time control for microwave-assisted chemistry

#129
20060203239
2006-09-14

Method and device utilizing plasma source for real-time gas sampling

#130
20060137212
2006-06-29

Device and method for controlling dehydration during freeze-drying

#131
20060092416
2006-05-04

In-situ micro-spectro-sensor for detecting gas leakage from vacuum chamber during plasma-based process

#132
20060087644
2006-04-27

Method and apparatus for etch endpoint detection

#133
20060043064
2006-03-02

Plasma processing system and method

#134
20060038992
2006-02-23

Induction device for generating a plasma

#135
20060027324
2006-02-09

Plasma processing apparatus and plasma processing method

#136
20060012796
2006-01-19

Plasma treatment apparatus and light detection method of a plasma treatment

#137
20060007425
2006-01-12

Method and system for monitoring plasma using optical emission spectrometry

#138
20050285106
2005-12-29

Method of reworking structures incorporating low-k dielectric materials

#139
20050277209
2005-12-15

Plasma leak monitoring method, plasma processing apparatus and plasma processing method

#140
20050219520
2005-10-06

Method for in situ monitoring of chamber peeling

#141
20050218814
2005-10-06

System and method for generating a discharge in gases

#142
20050211669
2005-09-29

Method and system of discriminating substrate type

#143
20050190364
2005-09-01

Detecting minority gaseous species by light-emission spectroscopy

#144
20050190363
2005-09-01

Detecting gaseous species by light-emission spectrometry with spectrum processing

#145
20050173239
2005-08-11

End point detection for sputtering and resputtering

#146
20050134835
2005-06-23

Methods of determining an etching end point based on compensation for etching disturbances

#147
20050093481
2005-05-05

System and method for generating a discharge in high pressure gases

#148
20050078310
2005-04-14

Method and system for monitoring plasma using optical emission spectroscopy

#149
20050078309
2005-04-14

Microwave plasma source

#150
20050078300
2005-04-14

Optical control interface between controller and process chamber

#151
20050046851
2005-03-03

Miniature gas cell with folded optics

#152
20050030531
2005-02-10

Method and device utilizing plasma source for real-time gas sampling

#153
20050012926
2005-01-20

Methods and apparatus for evaluating insulating glass units

#154
20050009347
2005-01-13

Method and apparatus for measuring electron density of plasma and plasma processing apparatus

#155
16668825
2020-08-18

Plasma monitoring apparatus, and plasma processing apparatus including the same

#156
15661725
2019-04-02

Optical microresonator device with thermal isolation

#157
14482826
2015-11-03

Optically dithered atomic gyro-compass

#158
13448331
2015-07-14

Spectrographic applications of trichel pulses