168049 ⎘
Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light; Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using high frequency electric fields
PLASMA MONITORING SYSTEM, PLASMA MONITORING METHOD, AND MONITORING DEVICE
#2HIGH SPECTRAL AND TEMPORAL RESOLUTION GLOW DISCHARGE SPECTROMETRY DEVICE AND METHOD
#3SPATIAL OPTICAL EMISSION SPECTROSCOPY FOR ETCH UNIFORMITY
#4MIXED SALINITY IMPACT ON INTERPRETATION AND REMEDIAL DETECTION TECHNIQUE
#5DEVICE FOR MEASURING ELEMENT CONCENTRATIONS IN PLANT LEAVES AND METHOD OF IMPLEMENTING THE SAME
#6Spatial optical emission spectroscopy for etch uniformity
#7Portable water quality instrument
#8Device and method for detecting concentration of specimen
#9Probe for detecting near field and near-field detection system including the same
#10Portable water quality instrument
#11Multi-dimensional spectroscopy of macromolecules
#12Glow plasma gas measurement signal processing
#13Apparatus for detecting or monitoring for a chemical precursor in a high temperature environment
#14METHOD OF DETERMINING CLEANING CONDITIONS AND PLASMA PROCESSING DEVICE
#15GLOW PLASMA STABILIZATION
#16SYSTEMS AND METHODS FOR RAPID ELEMENTAL ANALYSIS OF AIRBORNE PARTICLES USING ATMOSPHERIC GLOW DISCHARGE OPTICAL EMISSION SPECTROSCOPY
#17Plasma sensing device, plasma monitoring system and method of controlling plasma processes
#18Plasma monitoring apparatus and plasma processing system
#19Optical emission spectroscopy system, method of calibrating the same, and method of fabricating semiconductor device
#20Apparatus for detecting or monitoring for a chemical precursor in a high temperature environment
#21OES device, plasma processing apparatus including the same and method of fabricating semiconductor device
#22PLASMA PROCESSING APPARATUS, PLASMA PROCESSING METHOD AND PLASMA PROCESSING ANALYSIS METHOD
#23Optical detection of tracer gases in a gas discharge cell having unexposed electrodes
#24ICP emission spectrophotometer
#25Method and tool for producing sample containing object, method for performing glow discharge optical emission spectrometry, and glow discharge optical emission spectrometer
#26Computed tomography using intersecting views of plasma using optical emission spectroscopy during plasma processing
#27Method for determining a mixing ratio of N organic, miscible components in a mixture of said components and use of an inorganic marker
#28Method for measuring gas dissociation degrees
#29Methods and systems for chamber matching and monitoring
#30Methods and systems for chamber matching and monitoring
#31Plasma spectroscopic analysis method and inhibitor of plasma emission derived from non-target
#32Systems and methods for detecting oxygen in-situ in a substrate area of a substrate processing system
#33Method and system for determining downhole optical fiber orientation and/or location
#34Analysis system for online-transferred analysis sample
#35Laser apparatus enabling calculation of effective driving time and remaining lifetime taking account of drive conditions including temperature
#36Optical emission spectroscope with a pivotably mounted inductively coupled plasma source
#37Spatially resolved optical emission spectroscopy (OES) in plasma processing
#38Sample-analyzing system
#39Methods for manufacturing semiconductor device and for detecting end point of dry etching
#40Thermal stress resistant micro-plasma emission detector unit
#41In-situ spatially resolved plasma monitoring by using optical emission spectroscopy
#42Wideband antenna structure with optics reflector as ground plane and associated methods
#43Inspection method of vitreous silica crucible
#44Induction device
#45Glow discharge spectroscopy method and system for measuring in situ the etch depth of a sample
#46Methods of spectroscopic analysis of diamonds and apparatuses thereof
#47Method and system for determining downhole optical fiber orientation and/or location
#48Downhole fluid properties analysis device and tools comprising such a device
#49Plasma processing apparatus, plasma processing method and plasma processing analysis method
#50Plasma spectrochemical analysis method and plasma spectrochemical analyzer
#51Method of accurate thickness measurement of boron carbide coating on copper foil
#52Stabilized ICP emission spectrometer and method of using
#53ICP emission spectrometer
#54Plasma spectrometry method
#55Object detection systems
#56System for light source location detection
#57Optimization of nucleation and crystallization for lyophilization using gap freezing
#58Optimization of nucleation and crystallization for lyophilization using gap freezing
#59Devices and systems including a boost device
#60Systems and methods for computer models of animal feed
#61Spatially resolved optical emission spectroscopy (OES) in plasma processing
#62Induction device
#63Gas concentration estimation device
#64System for provision of analysis results, analysis terminal, and method for provision of analysis results
#65Plasma processing apparatus and analyzing apparatus
#66Plasma generation provision, internal combustion engine and analysis provision
#67Micro-plasma emission detector unit and method
#68High-frequency power supply for plasma and ICP optical emission spectrometer using the same
#69Analysis apparatus and analysis method
#70Analysis apparatus and analysis method
#71Plasma emission transfer and modification device
#72Microplasma for downhole compositional analysis
#73Device and method for controlling a dehydration operation during a freeze-drying treatment
#74Method and device for plasma-treating workpieces
#75Induction device
#76Method and apparatus for detecting plasma unconfinement
#77MICROWAVE PLASMA ATOMIC FLUORESCENCE MERCURY ANALYSIS SYSTEM
#78Optimization of nucleation and crystallization for lyophilization using gap freezing
#79Methods and apparatus for normalizing optical emission spectra
#80CONFIGURATIONS OF USING A POINT LIGHT SOURCE IN THE CONTEXT OF SAMPLE SEPARATION
#81Etching apparatus, analysis apparatus, etching treatment method, and etching treatment program
#82Method for detecting optical signals, microfluidic mixing chip having light emitting compound and system thereof
#83Discharge lamp for GDS with an axial magnetic field
#84METHOD FOR MEASURING DOPANT CONCENTRATION DURING PLASMA ION IMPLANTATION
#85Method and apparatus for identifying the chemical composition of a gas
#86ANALYTICAL METHOD AND ANALYTICAL SYSTEM
#87Photonic measurement instrument using fiber optics
#88APPARATUS FOR DETECTING ARCS
#89Systems and methods for determining recycled thermoplastic content
#90Devices and systems including a boost device
#91Sample introduction solutions and methods
#92ENDPOINT DETECTION FOR A REACTOR CHAMBER USING A REMOTE PLASMA CHAMBER
#93Method for measuring dopant concentration during plasma ion implantation
#94Nano-particle trap using a microplasma
#95FLUID ANALYZER SYSTEMS
#96Method of depositing a silicon-containing material by utilizing a multi-step fill-in process in a deposition machine
#97Method and apparatus for detecting plasma unconfinement
#98Methods and apparatus for normalizing optical emission spectra
#99Particle density measuring probe and particle density measuring equipment
#100SUBSTRATE FOR OBSERVATION AND OBSERVATION SYSTEM
#101Method for measuring dopant concentration during plasma ion implantation
#102REAL TIME LEAK DETECTION SYSTEM OF PROCESS CHAMBER
#103Analysis method and analysis apparatus
#104Method and apparatus for identifying the chemical composition of a gas
#105Induction device
#106Plasma processing apparatus
#107TARGET MOLECULE EVALUATION METHOD AND APPARATUS
#108Plasma spectroscopy system with a gas supply
#109In-stream spectroscopic elemental analysis of particles being conducted within a gaseous stream
#110Method of forming a deposited material by utilizing a multi-step deposition/etch/deposition (D/E/D) process
#111Plasma processing apparatus and plasma processing method
#112Full spectrum adaptive filtering (FSAF) for low open area endpoint detection
#113Methods and apparatus for evaluating insulating glass units
#114Devices and systems including a boost device
#115Multivariate monitoring method for plasma process machine
#116Self-calibrating optical emission spectroscopy for plasma monitoring
#117Plasma processing system and apparatus and a sample processing method
#118Method and apparatus for measuring electron density of plasma and plasma processing apparatus
#119Fluid analyser systems
#120Method And Apparatus For Seasoning Semiconductor Apparatus Of Sensing Plasma Equipment
#121Method and apparatus for measuring electron density of plasma and plasma processing apparatus
#122Plasma generating equipment
#123METHODS AND APPARATUS FOR EVALUATING INSULATING GLASS UNITS
#124Method and apparatus for measuring electron density of plasma and plasma processing apparatus
#125Gas monitor device
#126Optical emission device with boost device
#127Methods and apparatus for evaluating insulating glass units
#128Spectroscopy-based real-time control for microwave-assisted chemistry
#129Method and device utilizing plasma source for real-time gas sampling
#130Device and method for controlling dehydration during freeze-drying
#131In-situ micro-spectro-sensor for detecting gas leakage from vacuum chamber during plasma-based process
#132Method and apparatus for etch endpoint detection
#133Plasma processing system and method
#134Induction device for generating a plasma
#135Plasma processing apparatus and plasma processing method
#136Plasma treatment apparatus and light detection method of a plasma treatment
#137Method and system for monitoring plasma using optical emission spectrometry
#138Method of reworking structures incorporating low-k dielectric materials
#139Plasma leak monitoring method, plasma processing apparatus and plasma processing method
#140Method for in situ monitoring of chamber peeling
#141System and method for generating a discharge in gases
#142Method and system of discriminating substrate type
#143Detecting minority gaseous species by light-emission spectroscopy
#144Detecting gaseous species by light-emission spectrometry with spectrum processing
#145End point detection for sputtering and resputtering
#146Methods of determining an etching end point based on compensation for etching disturbances
#147System and method for generating a discharge in high pressure gases
#148Method and system for monitoring plasma using optical emission spectroscopy
#149Microwave plasma source
#150Optical control interface between controller and process chamber
#151Miniature gas cell with folded optics
#152Method and device utilizing plasma source for real-time gas sampling
#153Methods and apparatus for evaluating insulating glass units
#154Method and apparatus for measuring electron density of plasma and plasma processing apparatus
#155Plasma monitoring apparatus, and plasma processing apparatus including the same
#156Optical microresonator device with thermal isolation
#157Optically dithered atomic gyro-compass
#158Spectrographic applications of trichel pulses