Shape measurement apparatus and shape measurement method

Method of measurement of number of nonmetallic inclusions and casting mold for obtaining cast sample used for same

Evaluation method of fouling, fouling evaluation apparatus, production method of optical member, optical layered body, and display product

Method and apparatus for detecting foreign materials and storage medium

Method and apparatus for detecting defects and embedded objects in sealed sterilized packaging

Sheet-like product inspecting method and device

Methods of characterizing and measuring particulate filter accumulation

METHOD AND APPARATUS FOR IMAGING AN LCD USING TERAHERTZ TIME DOMAIN SPECTROSCOPY

Defect inspection apparatus and defect inspection method

METHOD AND APPARATUS FOR DETECTING DEFECTS

Illumination system for optical inspection

DEVICE AND METHOD FOR EVALUATING CLEANLINESS

Method of detecting defects on an object

Systems and methods for detecting chemical and biological substances

Test method

Inspection apparatus

Downhole sanding analysis tool

Method for real time measurement of acrylamide in a food product

HARD DISK INSPECTION APPARATUS AND METHOD, AS WELL AS PROGRAM

Hard disk inspection apparatus

Particle detection on an object surface

EUV lithography apparatus and method for determining the contamination status of an EUV-reflective optical surface

Method for cleaning an EUV lithography device, method for measuring the residual gas atmosphere and the contamination and EUV lithography device

DETECTING MATERIALS ON WAFER AND REPAIR SYSTEM AND METHOD THEREOF

Surface inspection method and surface inspection apparatus

Inspection apparatus, exposure apparatus, and method of manufacturing device

Method for detecting particles and defects and inspection equipment thereof

Equipment and method for detecting foreign matters

Surface inspecting method and device

Inspection method and inspection apparatus

EXPOSURE METHOD, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD

Contamination monitoring and control techniques for use with an optical metrology instrument

Method for detection of chemicals on a surface

Method for inspecting defect and apparatus for inspecting defect

Hand-held inspection tool and method

Portable multispectral imaging systems

METHOD AND DEVICE FOR OBSERVING AN OBJECT

Foreign matter inspection apparatus and foreign matter inspection method

Particle Detection on Patterning Devices with Arbitrary Patterns

Apparatus for analysing composition of crops in a crop elevator

Inspecting method and inspecting apparatus for substrate surface

Foreign particle inspection apparatus, exposure apparatus, and method of manufacturing device

Apparatus and method for analysing the composition of crop in a crop-conveying machine

Optical apparatus for defect inspection

Method for evaluating purity and concentration of oils and fatty acid compositions

Method for detecting residues on a component

Device and method for quantifying a surface's cleanliness

Method and apparatus for detecting defects

Defect inspecting apparatus

Detection of heavy oil using fluorescence polarization

METHOD OF INSPECTING FOOD AND INSPECTION APPARATUS IMPLEMENTING THE SAME

Inspection system and method

System for monitoring foreign particles, process processing apparatus and method of electronic commerce

Droplet discharge device

System and method for analyzing impurities of an object

Methods and apparatus to monitor contamination levels in a formation fluid

Optical inspection apparatus for substrate defect detection

Method and system for determining cumulative foreign object characteristics during fabrication of a composite structure

Optical defect inspection apparatus

Defect inspection method and system

Device for use in rating engine deposits

METHOD AND APPARATUS FOR RESIDUE DETECTION ON A POLISHED WAFER

Detection circuit and foreign matter inspection apparatus for semiconductor wafer

Apparatus and method for inspecting defects

Method and apparatus for determining composition and concentration of contaminants on a film encapsulated in a plasma display panel

Apparatus and method for inspecting defect on object surface

Surface inspection apparatus and method thereof

Optical device for detecting live insect infestation

Method for inspecting pattern defect and device for realizing the same

METHOD AND APPARATUS FOR CLEANING AN INTEGRATING SPHERE

High-resolution tracking of industrial process materials using trace incorporation of luminescent markers

Machine imaging apparatus and method for detecting foreign materials

Method and apparatus for inspecting foreign particle defects

Method for detecting particles and defects and inspection equipment thereof

Inspection apparatus and inspection method using electromagnetic wave

Systems and methods for food safety detection

Method for inspecting a foreign matter on mirror-finished substrate

Analyzer for absorption spectrometry of impurity concentration contained in liquid using exciting light

Optical multiwavelength window contamination monitor for optical control sensors and systems

Systems and methods for remote monitoring of contaminants in fluids

Sheet Metal Oxide Detector

System and method for detecting blemishes on image sensor package

Method and system for measuring contamination of a lithographical element

Apparatus and Method to Monitor Particulates

WAFER SURFACE INSPECTION APPARATUS AND WAFER SURFACE INSPECTION METHOD

Wafer surface inspection apparatus and wafer surface inspection method

Visual inspection apparatus

Wafer inspecting method and device

Contamination-inspecting apparatus and detection circuit

Optical power measuring apparatus capable of monitoring status of optical fiber contact end

Pattern defect inspection apparatus and method

Particulate determination method

Foreign substance inspection apparatus

Method and its apparatus for inspecting particles or defects of a semiconductor device

Inspection apparatus and inspection method

Fuel contaminant light sensor

Method of imaging radiation from an object on a detection device and an inspection device for inspecting an object

Process for structuring a surface layer

Particle monitor system and substrate processing apparatus

Matched optical waveforms for detection and identification of biological pathogens

Jewish-Law-Compliant Insect Checker and Sabbath Toothbrush

Methods and apparatus for the non-destructive detection of variations in a sample

Optical system for detecting anomalies and/or features of surfaces

Defect inspection apparatus and method

Methods and apparatus to monitor contamination levels in a formation fluid

Foreign matter inspection apparatus

Method And Apparatus For Classification Of Surfaces

Apparatus and method for analyzing contaminants on wafer

Apparatus And Method For Inspecting Defects

Apparatus for inspecting defects

Monitoring System For Sensing Microorganisms

SENSOR FOR DETECTING CONTAMINANTS AND/OR RAIN AND METHOD FOR OPERATING A SENSOR

Method and apparatus for performing qualitative and quantitative analysis of produce (fruit, vegetables) using spatially structured illumination

Method and device for controlling the quality of thermoplastic molding compositions

Surface defect inspection apparatus

Foreign matter inspection apparatus and foreign matter inspection method

APPARATUS FOR DETERMINING A PHYSICAL QUANTITY

Contamination monitoring and control techniques for use with an optical metrology instrument

Defect inspection apparatus and defect inspection method

DETACHABLY COUPLED IMAGE INTENSIFIER AND IMAGE SENSOR

Particle detection system, and lithographic apparatus provided with such particle detection system

Method and apparatus for monitoring oil deterioration in real time

Spectral analysis system utilizing water vapor plasma

Surface Inspection Method and Surface Inspection Apparatus

Surface inspection method and surface inspection apparatus

Method for detecting particles and defects and inspection equipment thereof

Optical apparatus for defect inspection

Optical inspection method and optical inspection apparatus

Polarization and reflection based non-contact latent fingerprint imaging and lifting

Method and its apparatus for inspecting particles or defects of a semiconductor device

Inspection method and apparatus using same

Method and apparatus for inspecting particles or defects of a semiconductor device

Inspection system and method

Portable composite bonding inspection system

Indication composition for surgical instrument cleaning evaluation

Method for inspecting defect and apparatus for inspecting defect

Surface contamination detection

Surface inspection method and surface inspection device

Vision inspection system device and method

Defect inspecting apparatus

Optical defect inspection apparatus

Substrate processing system, substrate surface processing apparatus, substrate surface inspecting apparatus, substrate surface inspecting method, and storage medium storing program for implementing the method

Defect inspection method and system

Surface defect inspecting method and device

Foreign matter inspection method and foreign matter inspection apparatus

Assembly and method for identifying coatings lying on the surface of components and for determining their characteristics

Backside contamination inspection device

Optical scanning system for surface inspection

Wafer surface inspection apparatus and wafer surface inspection method

Apparatus and method for inspecting defects

Particulates detection method

System for monitoring foreign particles, process processing apparatus and method of electronic commerce

Image scanner and method for detecting a defect in an image to be scanned

Autonomous evanescent optical nanosensor

Device for visualizing object attributes

Sensor using ultra thin waveguides and optical fibers

Method and apparatus for quantifying pigment dispersion quality by paint drawdown

Apparatus and method for testing defects

Apparatus and method for testing defects

Inspection apparatus, lithographic system provided with the inspection apparatus and a method for inspecting a sample

DYNAMIC WAFER STRESS MANAGEMENT SYSTEM

Lithographic apparatus and method

Lithographic apparatus and method

Apparatus and method for detecting contamination within a lithographic apparatus

Lithographic apparatus and method

Lithographic apparatus having a monitoring device for detecting contamination

Sensor for monitoring the immediate vicinity of a motor vehicle

Devices and methods for inspecting optical elements with a view to contamination

Wafer edge inspection

Surface inspection apparatus and method thereof

Optical sample characterization system

Method for characterizing defects on semiconductor wafers

Apparatus and method for analysis of optical storage media

Device for detecting contamination of lens in exposure device

Semiconductor device manufacturing system

EXPOSURE METHOD, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD

Inspection method and inspection apparatus

Method and apparatus for detecting defects on a wafer

Defect inspection apparatus

Flow optical analysis for peristaltic and other rotary pumps

Method and system for in situ spectroscopic evaluation of an object

Method and apparatus for imager quality testing

Outer surface-inspecting method, master patterns used therefor, and outer surface-inspecting apparatus equipped with such a master pattern

Evanescent nanosensor using an optical resonator

Method of classifying defects and apparatus for performing the method

Arc/spark optical emission spectroscopy correlated with spark location

SEMICONDUCTOR MANUFACTURING DEVICE AND PARTICLE MONITORING METHOD

Illumination system for optical inspection

Photoluminescence imaging with preferential detection of photoluminescence signals emitted from a specified material layer of a wafer or other workpiece

Differential wavelength photoluminescence for non-contact measuring of contaminants and defects located below the surface of a wafer or other workpiece

Method and its apparatus for inspecting particles or defects of a semiconductor device

Method and apparatus for detecting defects

Fluid contamination analyzer and a sample cell therefor

Detection method and apparatus metal particulates on semiconductors

System for Detecting Anomalies and/or Features of a Surface

Bacteria sensor and method

Defect inspection method and defect inspection system using the method

Wafer edge inspection

Particle inspection apparatus and method, exposure apparatus, and device manufacturing method

Window fog detecting apparatus

Method of evaluating optical information medium

Optical Scanning System for Surface Inspection

Particle detection method

Method and apparatus for inspecting foreign particle defects

Manufacturing inspection/analysis system analyzing device, analyzing device control program, storage medium storing analyzing device control program, and method for manufacturing inspection and analysis

Information handling system including dust detection

Backside contamination inspection device

Device for scanning a yarn with a light beam

Method for inspecting pattern defect and device for realizing the same

Method of measuring a level of contamination in a chemical solution and systems thereof

Bacteria sensor and method

Process for structuring a surface layer

Test head for optically inspecting workpieces

Method and apparatus for detecting defects

Particle detecting method and storage medium storing program for implementing the method

Particle detection system implemented with an immersed optical system

Method of detecting foreign objects for display panel fabrication

Use of laser reflection pickup unit for detection of small particles on a relatively smooth and reflective surface

Method and its apparatus for inspecting particles or defects of a semiconductor device

Methods and systems for determining a presence of macro and micro defects on a specimen

Particle detection device, lithographic apparatus and device manufacturing method

Particle detection device, lithographic apparatus and device manufacturing method

Method and apparatus for detecting defects

Combined high speed optical profilometer and ellipsometer

Apparatus and method for detection of contaminant particles or component defects

Wave interrogated near field array system and method for detection of subwavelength scale anomalies

Scanning apparatus and scanning methods for inspecting a surface of a semiconductor wafer

System for detecting anomalies and/or features of a surface

Apparatus and method for testing defects

Apparatus and method for testing defects

Monitoring an optical element of a processing head of a machine for thermal processing of a workpiece

Apparatus and method for detecting human fecal contamination on hands and other objects using an illumination imaging device

Inspection system with oblique viewing angle

Foreign matter inspection apparatus and method

Method and kits to detect beryllium by fluorescence

Method of detecting protrudent adhered matters and method of making spark plug using the same

Particle monitoring device and processing apparatus including same

Particle detecting system and method of detecting particles using the same

Method and its apparatus for inspecting particles or defects of a semiconductor device

Method and apparatus for detecting defects

Method for checking a nozzle for a laser beam machine

Method and apparatus for imager die package quality testing

Resonator method and system for distinguishing characteristics of surface features or contaminants

Forensic light using semiconductor light source

Method and apparatus for detecting foreign body on object surface, and optical disk apparatus

Dark field inspection system

Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process

Sample inspection system

monitoring on an ion implanter

Surface inspection apparatus and method thereof

Method of evaluating optical information medium

Sample inspection system

Method and apparatus for detecting contaminants on a window surface of a viewing system utilizing light

Method and apparatus for inspecting defects

Method and apparatus for illuminating a substrate during inspection

Pixel based machine for patterned wafers

Pixel based machine for patterned wafers

Particulate determination method

Method for identifying contaminants

Scanning system for inspecting anamolies on surfaces

Method and apparatus for detecting, monitoring, and quantifying changes in a visual image over time

Apparatus on a spinning preparation for detecting foreign objects of plastic material

Backside contamination inspection device

Particle detection method

Optical system for detecting anomalies and/or features of surfaces

Scanning system for inspecting anomalies on surfaces

Systems and method for identifying foreign objects and debris (FOD) and defects during fabrication of a composite structure

Method and its apparatus for inspecting particles or defects of a semiconductor device

Method and apparatus for locating/sizing contaminants on a polished planar surface of a dielectric or semiconductor material

Surface fouling detection

System and methods for detecting and cleaning contaminants from an imaging optical path

Vacuum airflow filtering for biological sensing

Removable smart sequestration coatings for hazardous metals

Imaging device blemish detection test enclosure

Surface fouling detection

Device and method for measuring effect of soiling on photovoltaic device

Device and method for measuring effect of soiling on photovoltaic device

Device and method for measuring effect of soiling on photovoltaic device

Soil imaging probe and method of processing soil image to detect hydrocarbon contamination

Detection system for gas turbine engine

Foreign substance analysis system

On-wing component wear analysis with fluid quality sensing

System and method for validating cleanliness of a surface

Optical fiber connector inspector with two-dimensional scanning function

Corrosion proxy material integrated sensor devices for distributed sensing of early corrosion onset and corrosion quantification

Active multi-spectral sensor

Soil imaging probe and method of processing soil image to detect hydrocarbon contamination

System and method for monitoring life of automobile oil

Non-destructive evaluation of water ingress in photovoltaic modules

Particle measurement mask and particle managing method

Systems and methods for detecting the presence of a contaminant

Multi-surface optical inspector

Method and apparatus for determining the cleanliness of a lens in an optical disc drive