Optical disc device and recording and reproduction device

Workpiece holder for utilization in metrology system for measuring workpiece in different orientations

Dark-field optical inspection device

Method and apparatus for inspection of spherical surfaces

Photon emitter array including photon emitters with different orientations

Apparatus and methods using interference in light reflected from articles

Classification of surface features using fluoresence

Reflective surfaces for surface features of an article

Features maps of articles with polarized light

Surface features mapping

Photon emitter array

Reflective surfaces for surface features of an article

Surface features mapping

Luminous flux branching element and mask defect inspection apparatus

Object holding apparatus, and inspection apparatus

Method for inspection and detection of defects on surfaces of disc-shaped objects and computer system with a software product for carrying out the method

Sheet Wafer Defect Mitigation

Optical surface defect inspection apparatus and optical surface defect inspection method

Substrate holding apparatus, and inspection or processing apparatus

OPTICAL DISC DRIVE, OPTICAL STORAGE MEDIUM, OPTICAL STORAGE MEDIUM INSPECTION APPARATUS, AND OPTICAL STORAGE MEDIUM INSPECTION METHOD

Disk surface inspection apparatus, inspection system thereof, and inspection method thereof

Substrate holding apparatus, and inspection or processing apparatus

TEST DEVICE FOR CHARACTERIZING MATERIALS USED FOR OPTICAL STORAGE

Optical recording using a waveguide structure and a phase change medium

Optical discs for measuring analytes

Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method

Method and apparatus for inspecting a pattern shape

OPTICAL DISC ASSEMBLIES FOR PERFORMING ASSAYS

DISK INSPECTION APPARATUS AND METHOD

Method and apparatus for detecting defects on a disk surface

Edge inspection apparatus

Wafer edge inspection

Optical disc assemblies for performing assays

Apparatus and method for detecting defect of optical disc

Particulate determination method

Optical storage medium inspection method for determining if an optical storage medium is good or defective

Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method

Optical discs for measuring analytes

Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method

Optical storage medium inspection apparatus for determining whether an optical storage medium is good or defective

Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method

Optical disc drive, optical storage medium, optical storage medium inspection apparatus, and optical storage medium inspection method

Method and device for controlling the quality of thermoplastic molding compositions

Quality Testing Method for Optical Data Carriers

Spatial and spectral wavefront analysis and measurement

OPTICAL SYSTEM OF DETECTING PERIPHERAL SURFACE DEFECT OF GLASS DISK AND DEVICE OF DETECTING PERIPHERAL SURFACE DEFECT THEREOF

Substrate holding apparatus, and inspection or processing apparatus

Particle removal tool with integrated defect detection/analysis capability

Method and system for detecting of errors on optical storage media

Surface inspection by scattered light detection using dithered illumination spot

Visual Inspection Apparatus

OPTICAL DISC ASSEMBLIES FOR PERFORMING ASSAYS

Surface inspection apparatus and surface inspection method

TESTING METHOD FOR SURFACE DEFECTS ON DISC AND TESTING APPARATUS FOR THE SAME

Particulates detection method

Method and apparatus for using imperfections and irregularities in optical media for identification purposes

Apparatus and method for analysis of optical storage media

Optical stacked structure inspecting method and optical stacked structure inspecting apparatus

Optical discs for measuring analytes

Wafer edge inspection

Wafer edge inspection

Optical recording medium sample fabricating method, optical recording medium sample analyzing method. optical recording medium fabricating apparatus, and optical recording medium fabricating method

Method and apparatus for determining if an optical disk originated from a valid source

Optical disc assemblies for performing assays

Method of evaluating optical information medium

System and methods for classifying anomalies of sample surfaces

Process for enhancing dye polymer recording yields by pre-scanning coated substrate for defects

Deficiency detecting apparatus for optical disk

Robotic system for optically inspecting workpieces

Test head for optically inspecting workpieces

Test head for optically inspecting workpieces

Double sided optical inspection of thin film disks or wafers

Test head for optically inspecting workpieces comprising a lens for elongating a laser spot on the workpieces

Test head for optically inspecting workpieces

Method and apparatus for reducing or eliminating stray light in an optical test head

Optical recording using a waveguide structure and a phase change medium

Optical information device, optical storage medium, optical storage medium inspection device, and optical storage inspection method

Apparatus for handling of a disklike member, especially for handling of a wafer

Authentication system, data device, and methods for using the same

Method and apparatus for detecting foreign body on object surface, and optical disk apparatus

Method of evaluating optical information medium

Particulate determination method

Spatial and spectral wavefront analysis and measurement

Defect detection device

Multiple data layer optical discs for detecting analytes