169595 ⎘
Features of devices classified in; Mechanical Controlling conditions in casing
Sub-classes:BIOSENSOR SYSTEM FOR DIAGNOSIS OF FAMILIAL MEDITERRANEAN FEVER(FMF) DISEASE
#2INFRARED TRANSMISSION FLOW CELL WITH THERMAL RAMPING CAPABILITY
#3Apparatus For Detecting Target Analytes In A Sample Applied On A Diffractive Sensor
#4System and Method for Inspecting Mask
#5SEMICONDUCTOR DEVICE INSPECTION DEVICE AND SEMICONDUCTOR DEVICE INSPECTION METHOD
#6MEASURING DEVICE COMPRISING A FITTING WITH A FLOW CHANNEL AND A METHOD FOR ITS OPERATION
#7ANALYSIS OF MIXED VOLATILE COMPOUNDS
#8MOLECULAR IMAGING METHOD AND SYSTEM OF RAMAN SPECTRA BASED ON MACHINE LEARNING CASCADE
#9PLASMON RESONANCE (PR) SYSTEM, INSTRUMENT, CARTRIDGE, AND METHODS AND CONFIGURATIONS THEREOF
#10SENSOR ARRANGEMENT FOR ARRANGEMENT ON A MEASUREMENT CHAMBER, APPARATUS FOR QUALIFYING A MASK AND METHOD FOR QUALIFYING A MASK
#11OPTICAL ANALYSIS DEVICE FOR DETERMINING A CHARACTERISTIC OF A MEDIUM, HOUSING, AND SYSTEM
#12ONLINE DETECTION DEVICE AND METHOD FOR UNDERWATER ELEMENTS BASED ON LIBS TECHNOLOGY
#13Automatic photocurrent spectrum measurement system based on fourier infrared spectrometer
#14Apparatuses for analyzing the optical properties of a sample
#15Analysis of mixed volatile compounds
#16Plasmon resonance (PR) system, instrument, cartridge, and methods and configurations thereof
#17GAS MEASUREMENT DEVICE AND GAS MEASUREMENT METHOD
#18Apparatus for analyzing the optical properties of a sample
#19METHOD OF DETECTING BACTERIA
#20Sample imaging apparatus
#21OPTICAL SENSOR
#22Inspection chip and inspection system
#23Non-destructive measurement unit of the gas concentration in sealed flexible containers and automatic filling and/or packaging line using such a unit
#24CAVITATION-INDUCED EQUILIBRIUM GAS-PHASE SPECTROMETRY
#25NDIR gas sensor, gas analyzer, photosynthesis rate measuring apparatus, and photosynthesis rate measuring method
#26Optical analysis system and optical analysis method
#27Multi-mode plasma-based optical emission gas detector
#28ILLUMINATION APPARATUS, MICROSCOPE APPARATUS EQUIPPED WITH SAME, AND MICROSCOPY OBSERVATION METHOD
#29Systems and methods for pressure differential molecular spectroscopy of compressible fluids
#30System and method for forming a sealed chamber
#31HOLDING AND ROTATING APPARATUS FOR FLAT OBJECTS
#32Method and apparatus for testing of engine components
#33Chlorine dioxide gas concentration measuring apparatus
#34Microplate-reader with a controlled gas atmosphere and a corresponding method of controlling the gas atmosphere
#35Method and arrangement in connection with separate sample taken from process liquid
#36Ultrasensitive SERS flow detector
#37Cavity enhanced laser based isotopic gas analyzer
#38Fluid analyzer with modulation for liquids and gases
#39MICROSCOPE WITH DETECTOR STOP MATCHING
#40Systems and methods for pressure differential molecular spectroscopy of compressible fluids
#41Inspection and repair module
#42Infrared sensor with multiple sources for gas measurement
#43Apparatus for acquiring information from object to be measured and aquiring method therefor
#44Devices to detect a substance and methods of producing such a device
#45Cavity enhanced laser based isotopic gas analyzer
#46Infrared sensor with multiple sources for gas measurement
#47Cavity enhanced laser based isotopic gas analyzer
#48Microplate-reader with a controlled gas atmosphere, corresponding method and use of same
#49SPECIFIC COMPONENT MEASURING METHOD BY SPECTRAL MEASUREMENT
#50Interferometer system and method for its operation
#51Light source
#52Analytical equipment enclosure incorporating phase changing materials
#53Optical measurement apparatus and optical measurement method for a liquid or molten material
#54Vacuum UV based optical measuring method and system
#55Specific component measuring method by spectral measurement
#56Plasma leak monitoring method, plasma processing apparatus and plasma processing method
#57Method and apparatus for eliminating and compensating thermal transients in gas analyzer
#58Optical inspection equipment for semiconductor wafers with precleaning
#59Vacuum UV based optical measuring method and system
#60Inspection system and method for detecting defects at a materials interface
#61Elliposometer system with polarization state generator and polarization state analyzer in environmental chamber