169621 ⎘
Features of devices classified in; Illumination; Optics; Sources Plural sources used for calibration
Devices, Systems, and Methods for Calibration Systems
#2PIXEL DEVIATIONS
#3DIAGNOSTIC DEVICE WITH IMPROVED OPTICAL SYSTEM
#4DIVIDED-APERTURE INFRA-RED SPECTRAL IMAGING SYSTEM
#5METHOD FOR LOCALIZING OR TRACKING EMITTERS IN A SAMPLE
#6DIVIDED-APERTURE INFRA-RED SPECTRAL IMAGING SYSTEM
#7AN OPTICAL MEASUREMENT DEVICE
#8Electronic device and method of estimating bio-information using the same
#9Divided-aperture infra-red spectral imaging system
#10Divided-aperture infra-red spectral imaging system
#11Fourier transform infrared spectrometer
#12Substrate processing apparatus, substrate processing method, and method of fabricating semiconductor device using the same
#13Divided-aperture infra-red spectral imaging system
#14Method for estimating the intensity of a wave emitted by an emitting source
#15Assay devices and methods
#16Assay devices and methods
#17Imaging beam positioning apparatus and method of use thereof
#18Divided-aperture infra-red spectral imaging system
#19Detecting IC Reliability Defects
#20Assay devices and methods
#21Assay Devices and Methods
#22ASSAY DEVICES AND METHODS
#23Assay devices and methods
#24Flow sensing for determination of assay results
#25Early determination of assay results