COMPUTATIONAL DUAL COMB BROADBAND SPECTROSCOPY METHOD AND SYSTEM

SYSTEMS AND METHODS FOR SCREENING ASYMPTOMATIC VIRUS EMITTERS

IN DEPTH POLYTYPE IDENTIFICATION IN SILICON CARBIDE

OPTICAL CONFIGURATIONS FOR HIGH RESOLUTION MICROSCOPY

LIGHT SOURCE UNIT

PROCEDURE FOR COMMISSIONING A MEASURING SYSTEM, MEASURING SYSTEM AND DATA STORAGE MEMORY

OPTICAL METROLOGY

COOLING UNIT, OBJECTIVE LENS MODULE, AND SEMICONDUCTOR INSPECTION APPARATUS

SUBSTANCE COMPONENT DETECTION APPARATUS AND METHOD

IMAGE SENSOR SYSTEM

SYSTEMS AND METHODS FOR SCREENING ASYMPTOMATIC VIRUS EMITTERS

MICROSCOPIC RAMAN DEVICE

SYSTEMS FOR INSPECTION OF SEMICONDUCTOR SUBSTRATES

Optical switch devices

Detection method of crease degree of screen and visual detection apparatus

PANORAMIC IMAGE CAPTURE FOR MULTISPECTRAL SENSOR

Optical nanostructure rejecter for an integrated device and related methods

Detection method of crease degree of screen and visual detection device

METHOD AND APPARATUS FOR IMAGING NONSTATIONARY OBJECT

OPTICAL INSPECTION USING CONTROLLED ILLUMINATION AND COLLECTION POLARIZATION

System and method for high speed inspection of semiconductor substrates

DEVICE FOR CHEMILUMINESCENCE ANALYSIS

Image sensor system

Optical inspection using controlled illumination and collection polarization

System and method for high speed inspection of semiconductor substrates

Flexible display inspection system

Gas detection device, gas detection system, and gas detection method

Optical switch devices

SYSTEMS, METHODS AND COMPUTER PROGRAM PRODUCTS FOR SKIN LIQUID LEVELS ESTIMATION

Occupant light exposure detection

Die bonding apparatus and manufacturing method for semiconductor device

Friction testing and torque sensing systems

Apparatus and method for rotating an optical objective

Panoramic image capture for multispectral sensor

Optical imaging system using lateral illumination for digital assays

Systems and methods for screening asymptomatic virus emitters

Systems and methods for screening asymptomatic virus emitters

Systems and methods for screening asymptomatic virus emitters

Structure of optical sensor having light-emitting element and plurality of light-receiving elements

OPTICAL SYSTEM FOR FLUORESCENCE IMAGING

Optical system for the spectral component analysis of non-solid media

TEST DEVICE FOR BODY FLUID ANALYSIS

Successive optical analysis system and successive optical analysis method

Image sensor system

Automatic, real-time surface-enhanced raman scattering (SERS) analysis

Method for measuring optical characteristics of a transparent article

Data acquisition apparatus

Optical fibre based microprobe

Optical nanostructure rejecter for an integrated device and related methods

Spectroscopic analysis apparatus, spectroscopic analysis method, steel strip production method, and steel strip quality assurance method

DEVICES AND METHODS TO MEASURE SMALL DISPLACEMENTS

Imaging reflectometer

PROCESS AND SYSTEM FOR MEASURING MORPHOLOGICAL CHARACTERISTICS OF FIBER LASER ANNEALED POLYCRYSTALLINE SILICON FILMS FOR FLAT PANEL DISPLAY

SPECIMEN-SAMPLE ESTIMATION APPARATUS, SPECIMEN-SAMPLE ESTIMATION METHOD, AND COMPUTER-READABLE RECORDING MEDIUM

SYSTEMS FOR FLUORESCENCE LIGHT SHEET MICROSCOPY OF LARGE SAMPLES IN HIGH REFRACTIVE INDEX SOLUTIONS

Inspection device and detector

Panoramic image capture for multispectral sensor

Imaging reflectometer

Analyzing apparatus, analyzing method, and program

Apparatus And Methods For Analyzing The Output Of Microfluidic Devices

Systems, methods, and apparatus for interference filter correction based on angle of incidence

Control interface for a machine-vision lighting device

Optical imaging system using lateral illumination for digital assays

Ellipsometer

Method of measuring a structure, inspection apparatus, lithographic system, device manufacturing method and wavelength-selective filter for use therein

Systems and methods for quantifying a gas leak

Spectrum-scanned SPR imaging detection system

Sample testing apparatus and method

Inspection-beam shaping on a sample surface at an oblique angle of incidence

Optical switch devices

Particle characterisation instrument

Light sheet microscope

Agricultural sampling apparatus and system

Image acquisition device, image acquisition method, and spatial light modulation unit

Stimulated Raman scattering microscope device and stimulated Raman scattering measurement method

Testing device, for body fluid analysis, using natural light

Surface defect detecting method and surface defect detecting apparatus

GAS DETECTION SYSTEM

Optical measuring method and apparatus, and method of manufacturing semiconductor device using the same

Uniform and scalable light-sheets generated by extended focusing

SPR detection system and method

Cell determination method, cell determination device and cell determination program

Raman spectrum inspection apparatus and security monitoring method for Raman spectrum inspection apparatus

POLARIZED LIGHT IMAGING APPARATUS AND METHODS THEREOF FOR SEPARATING LIGHT FROM A SURFACE OF A SAMPLE ITS DEEPER DIFFUSE LAYERS

Optical imaging system using lateral illumination for digital assays

Multifocal method and apparatus for stabilization of optical systems

METHOD FOR DETECTING CLARITY OF TRANSPARENT DISPLAY PANEL AND DETECTING APPARATUS THEREOF

Aperture-plate drive mechanism

Confocal inspection system having non-overlapping annular illumination and collection regions

Defect detection method and defect detection device and defect observation device provided with same

Inspection system and method for inspecting a sample by using a plurality of spaced apart beams

Methods and systems for optical-based measurement with selectable excitation light paths

Method for 2D/3D inspection of an object such as a wafer

Method of measuring a structure, inspection apparatus, lithographic system, device manufacturing method and wavelength-selective filter for use therein

Apparatus and methods for analyzing the output of microfluidic devices

Surface defect detecting method and surface defect detecting apparatus

Gas sensor with integrated optics and reference cell

Gas sensor with integrated optics and reference cell

Wafer image inspection apparatus

Optical microscopy system and method for Raman scattering with adaptive optics

Defect inspection device

INTEGRATED RAMAN SPECTROMETER AND MODULARIZED LASER MODULE

Method and a system for detection of hazardous chemicals in a non-metallic container

Automated focusing, cleaning, and multiple location sampling spectrometer system

Structured illumination device and structured illumination microscope device

Adhering detection apparatus, adhering substance detection method, storage medium, and device control system for controlling vehicle-mounted devices

Polarized light imaging apparatus and methods thereof for separating light from a surface of a sample its deeper diffuse layers

Defect detection method and defect detection device and defect observation device provided with same

Method and device for imaging 1-D nanomaterials

Laser differential confocal mapping-spectrum microscopic imaging method and device

Reflection properties measuring device and manufacturing method for polarizing plates used in same

Spectrometer for analysing the spectrum of a light beam

Production sample shaping that preserves re-normalizability

LIGHTING DEVICE AND MICROSCOPE, AND LIGHTING METHOD AND OBSERVATION METHOD

Inspection device

Defect detection method and defect detection device and defect observation device provided with same

Optomechanical accelerometer

Defect detection method and defect detection device and defect observation device provided with same

Iris Control System for Conducting the Identification of Bacteria in Biological Samples

Apparatus for and method of measuring bio-chips using uniform total internal reflection illumination

SAMPLE ANALYSIS APPARATUS AND A METHOD OF ANALYSING A SAMPLE

Apparatus for and method of measuring bio-chips using uniform total internal reflection illumination

Friction testing and torque sensing systems

Spectral edge detection

Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer