WAFER INSPECTION APPARATUS

SCANNING DEVICE

VISION INSPECTION APPARATUS AND VISION INSPECTION METHOD

MICROSCOPE WITH SPATIAL IMAGING AND BEAM HOMOGENIZER

SCANNING DIFFRACTION BASED OVERLAY SCATTEROMETRY

Hyperspectral Imaging Apparatus

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

SYSTEMS AND METHODS FOR MULTICOLOR IMAGING

WIRE MELTING TRACE PHOTOGRAPHING APPARATUS, APPARATUS AND METHOD OF DETERMINING ELECTRIC WIRE-MELTING TRACE BASED ON DEEP LEARNING

OPTICAL INSPECTION SYSTEMS WITH PULSED LIGHT SOURCES AND PULSE MULTIPLEXING

ADJUSTMENT METHOD OF INSPECTION APPARATUS FOCUS POSITION, AND PATTERN INSPECTION APPARATUS

System and method for optical mapping of semiconductor wafers at cryogenic temperatures under transmission geometry

LASER INDUCED BREAKDOWN SPECTROSCOPY FOR GEOLOGICAL ANALYSIS

DEFECT INSPECTION DEVICE

CAVITY ENHANCED OPTICAL MICROSCOPY

Surface Sensing Systems and Methods for Imaging a Scanned Surface of a Sample Via Sum-Frequency Vibrational Spectroscopy

Inspecting machine for leather and inspection method applicable to said machine

METHOD AND SENSOR FOR TESTING VALUE DOCUMENTS

Systems and methods for multicolor imaging

EDGE PORTION MEASURING APPARATUS AND METHOD FOR MEASURING EDGE PORTION

Hybrid Optical Parametrically-Oscillating Emitter

SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD

CONTINUOUS SCANNING OPTICAL ASSEMBLY AND METHOD OF USE THEREOF

METHOD FOR ASSESSING THE QUALITY OF A COMPONENT OF OPTICAL MATERIAL

Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopy

Systems and methods for multicolor imaging

Defect inspection device and defect inspection method

Scanning scatterometry overlay measurement

Systems and methods for multicolor imaging

MICROSCOPE WITH SPATIAL IMAGING AND BEAM HOMOGENIZER

Multi-modal imaging systems and methods

Process tool and an inspection method

Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopy

Multiplexed Single Molecule Analyzer

Far-field optical super-resolution microscopy method

Spectral imaging apparatus and methods

Weld scanner for real-life bridge and scanning method thereof

System and method for high speed FOD detection

SPECTROSCOPY APPARATUS AND METHODS

Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopy

Method and device for high throughput imaging

Method, apparatus and software for detection and localization of hidden defects in optically diffuse media

Apparatus and method for fluorescence molecular tomography

Surface sensing systems and methods for imaging a scanned surface of a sample via sum-frequency vibrational spectroscopy

System and method for high speed FOD detection

DNA sequencing with reagent recycling on wiregrid

Transmission Raman spectroscopy

Reducing measurement variation to optical measuring of sample material

Illumination unit for digital pathology scanning

Image capture for large analyte arrays

Magnet assisted stage for vibration and heat reduction in wafer scanning

Skinning of ceramic honeycomb bodies

WAVEGUIDE-BASED DETECTION SYSTEM WITH SCANNING LIGHT SOURCE

Method of inspecting surface and method of inspecting photomask using the same

APPARATUS AND METHOD FOR INSPECTION OF A MID-LENGTH SUPPORTED STEERING COLUMN ASSEMBLY

Apparatus and method for inspection of an end region supported steering column assembly

System and method for high speed FOD detection

MAGNETIC DISK INSPECTION DEVICE AND MAGNETIC DISK INSPECTION METHOD

Panel inspection apparatus and method

TDI sensor in a darkfield system

Method and system for optically inspecting a manufactured part at a single inspection station having a measurement axis

Fluorescence detection device

X-ray analyzer

Skinning of ceramic honeycomb bodies

Detection system based on modulation of line structured laser image of glass

Tomographic scanning apparatus

DNA sequencing with reagent recycling on wiregrid

Surface scanning inspection system with independently adjustable scan pitch

Multi-channel fluorescence detecting module and nucleic acid analysis system having the same

Optical analysis device, optical analysis method and computer program for optical analysis using single light-emitting particle detection

Image capture for large analyte arrays

Surface inspecting apparatus and surface inspecting method

Large particle detection for multi-spot surface scanning inspection systems

Surface scanning inspection system with adjustable scan pitch

Apparatus for high-throughput suspension measurements

Surface inspecting apparatus and method for calibrating same

Surface inspecting apparatus and surface inspecting method

Examining apparatus

OPTICAL MEASURING DEVICE AND CALIBRATION DEVICE

Enhanced instrumentation and method for optical measurement of samples

Defect inspection apparatus

FLUORESCENCE-LIFETIME-BASED TOMOGRAPHY

Laser confocal microarray scanner

Instrumentation and Method Adapted For Optical Measurement of an Amplified Luminescent Proximity Homogeneous Assay

Methods for determining corrosion products on substrates using infrared imaging

Sensitive sensing based on optical nonlinear wave mixing

Infrared imaging for evaluation of corrosion test coupons

Double sided optical inspection of thin film disks or wafers

Optical fiber cable take-up mechanism for scanning sensors

Method and apparatus for multi-mode spectral imaging

Scanning optical system

Multiple superposition detection system and method for capacitor appearance defects based on visual detection

Overlay measuring device and method for controlling focus and program therefor