G01N2201/1045 - CPC Classification Index

ClassID:

169703 ⎘

G01N2201/1045 - CPC Classification

Classification description:

Features of devices classified in; Scanning; Mechano-optical scan, i.e. object and beam moving Spiral scan

Recent Application in this class:

20240125790

2024-04-18

MULTI-SPECTRAL MICROPARTICLE-FLUORESCENCE PHOTON CYTOMETRY

20200340999

2020-10-29

Multi-spectral microparticle-fluorescence photon cytometry

20200080837

2020-03-12

Method and apparatus for characterizing objects

20190277827

2019-09-12

Recording dynamics of cellular processes

20180045570

2018-02-15

Transmission Raman spectroscopy

20170234806

2017-08-17

System and method for surface inspection

20170059485

2017-03-02

Multi-spectral microparticle-fluorescence photon cytometry

20160069794

2016-03-10

Recording dynamics of cellular processes

20130301042

2013-11-14

Defect inspection method and defect inspection apparatus

#10

20100085561

2010-04-08

System and method of two-stepped laser scattering defect inspection

#11

20090279081

2009-11-12

Defect inspection apparatus

#12

20090116707

2009-05-07

Discrete event distribution sampling apparatus and methods

#13

20080151259

2008-06-26

SYNCHRONIZED WAFER MAPPING

#14

20060256327

2006-11-16

System for Detecting Anomalies and/or Features of a Surface

#15

20060152716

2006-07-13

Double sided optical inspection of thin film disks or wafers

#16

20060038984

2006-02-23

System for detecting anomalies and/or features of a surface

#17

20050230647

2005-10-20

Method and apparatus for detecting foreign body on object surface, and optical disk apparatus

#18

16555211

2022-10-04

Method of observing objects using a spinning localized observation