Method and System for Detecting a Material

DEVICE FOR MEASURING ELEMENTAL AND MOLECULAR PROPERTIES WITH HYBRID ELECTROMAGNETIC WAVES

INSPECTION DEVICE, INSPECTION ELEMENT, AND INSPECTION METHOD

PATTERNED X-RAY EMITTING TARGET

METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREASED THROUGHPUT

INFORMATION PROCESSING SYSTEM AND PHASE ANALYSIS SYSTEM

Dynamic Data Driven Detector Tuning for Improved Investigation of Samples in Charged Particle Systems

Screening system

Rotational X-ray inspection system and method

Parameterizing x-ray scattering measurement using slice-and-image tomographic imaging of semiconductor structures

SYSTEMS AND METHODS FOR INSPECTION PORTALS

SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION

CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD

Spot-size control in reflection-based and scatterometry-based X-ray metrology systems

X-RAY COMPUTED TOMOGRAPHY APPARATUS AND IMAGE GENERATION METHOD

Patterned x-ray emitting target

X-ray examination device

Sample inspection system comprising a beam former to project a polygonal shell beam

Through-tubing, cased-hole sealed material density evaluation using gamma ray measurements

Edge phase effects removal using wavelet correction and particle classification using combined absorption and phase contrast

X-ray imaging apparatus and method

Method for diffraction pattern acquisition

Non-destructive inspection system comprising neutron radiation source and neutron radiation method

Combined scanning x-ray generator, composite inspection apparatus, and inspection method for hybrid

Defect detection device, defect detection method, and defect observation device

Charged Particle Beam System and Overlay Shift Amount Measurement Method

Method of examining a sample using a charged particle microscope

Method and devices for determining metrology sites

X-ray imaging system and method of x-ray imaging

Dark field tensor tomography method, specimen holder and device

Hybrid inspection system

X-ray spectrometer system

X-ray inspection device

CT apparatus, CT imaging method, and storage medium

X-ray transmission spectrometer system

Method of X-ray nano-radiography and nanotomography and a device for executing this method

Method for characterizing a sample combining an X-ray characterization technique and a secondary ionization mass spectrometry characterization technique

Neutron detector and method for detecting neutrons

Detection system and method

Method and system for analyzing an object by diffractometry using a scattering spectrum and a transmission spectrum

Method of analyzing an object in two stages using a transmission spectrum then a scattering spectrum

Method and apparatus for estimation of heat value using dual energy x-ray transmission and fluorescence measurements

Moving pet gantry

Monochromatic attenuation contrast image generation by using phase contrast CT

Combined handheld XRF and OES systems and methods

X-ray imaging system and image processing method

X-ray topography apparatus

Focused ion beam apparatus, method for observing cross-section of sample by using the same, and storage medium

Composite charged particle beam apparatus

DUAL-PARTICLE IMAGING SYSTEM FOR STANDOFF SNM DETECTION IN HIGH-BACKGROUND-RADIATION ENVIRONMENTS

Method and system for deriving molecular interference functions from XRD profiles

Methods, a processor, and a system for improving an accuracy of identification of a substance

Systems and methods for reducing a degradation effect on a signal

Systems and methods for identifying a substance

Multiple Scatter Correction

Apparatus for inspecting objects using coded beam

Scatter correction

Diffraction analysis device and method for full-field x-ray fluorescence imaging analysis

Inspection tool, inspection tool operating method, and non-transitory computer readable medium