ClassID:

169950

G01N2223/1003 - CPC Classification

Classification description:

Investigating materials by wave or particle radiation; Different kinds of radiation or particles monochromatic

Recent Application in this class:
#1
20240241065
2024-07-18

ELEMENT DISTRIBUTION MEASURING DEVICE AND ELEMENT DISTRIBUTION MEASURING METHOD

#2
20230213439
2023-07-06

System and Method of Measuring Contaminants in a Substantially Translucent Material, Such as Water

#3
20230184700
2023-06-15

Handheld inspection device and method of inspecting an infrastructure having a structure wall supported into material

#4
20230152248
2023-05-18

Correction amount specifying apparatus, method, program, and jig

#5
20220404286
2022-12-22

PH MEASUREMENT METHOD AND PH MEASUREMENT DEVICE

#6
20220205934
2022-06-30

Non-destructive detection of surface and near surface abnormalities in a metallic product

#7
20220120561
2022-04-21

X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate

#8
20170315067
2017-11-02

Backscatter imaging systems and methods with helical motion

#9
20160377559
2016-12-29

X-ray interferometer

#10
20150362441
2015-12-17

Method for characterizing the catalyst structure in a fuel cell and fuel cell design suitable therefor

#11
20150262722
2015-09-17

XRF system having multiple excitation energy bands in highly aligned package

#12
20140198898
2014-07-17

Online monitoring of contaminants in crude and heavy fuels, and refinery applications thereof

#13
20140105363
2014-04-17

XRF system having multiple excitation energy bands in highly aligned package

#14
20130108015
2013-05-02

X-RAY INTERFEROMETER

#15
20110170666
2011-07-14

XRF system having multiple excitation energy bands in highly aligned package

#16
20100316190
2010-12-16

Phase-sensitive X-ray imager

#17
20090290681
2009-11-26

Method of bright-field imaging using X-rays

#18
17720959
2022-10-25

Multi-scan computed tomography defect detectability