169950 ⎘
Investigating materials by wave or particle radiation; Different kinds of radiation or particles monochromatic
ELEMENT DISTRIBUTION MEASURING DEVICE AND ELEMENT DISTRIBUTION MEASURING METHOD
#2System and Method of Measuring Contaminants in a Substantially Translucent Material, Such as Water
#3Handheld inspection device and method of inspecting an infrastructure having a structure wall supported into material
#4Correction amount specifying apparatus, method, program, and jig
#5PH MEASUREMENT METHOD AND PH MEASUREMENT DEVICE
#6Non-destructive detection of surface and near surface abnormalities in a metallic product
#7X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate
#8Backscatter imaging systems and methods with helical motion
#9X-ray interferometer
#10Method for characterizing the catalyst structure in a fuel cell and fuel cell design suitable therefor
#11XRF system having multiple excitation energy bands in highly aligned package
#12Online monitoring of contaminants in crude and heavy fuels, and refinery applications thereof
#13XRF system having multiple excitation energy bands in highly aligned package
#14X-RAY INTERFEROMETER
#15XRF system having multiple excitation energy bands in highly aligned package
#16Phase-sensitive X-ray imager
#17Method of bright-field imaging using X-rays
#18Multi-scan computed tomography defect detectability