G01N2223/1006 - CPC Classification Index

ClassID:

169951 ⎘

G01N2223/1006 - CPC Classification

Classification description:

Investigating materials by wave or particle radiation; Different kinds of radiation or particles different radiations, e.g. X and alpha

Recent Application in this class:

20240319112

2024-09-26

INSPECTION SYSTEM AND METHOD

20220236199

2022-07-28

X-ray photoemission system for 3-D laminography

20220100094

2022-03-31

Quantum-limited extreme ultraviolet coherent diffraction imaging

20210333224

2021-10-28

Dual mode detection method, controller and system

20200096456

2020-03-26

Method for determining physical properties of a sample

20200090826

2020-03-19

X-ray photoemission apparatus for inspection of integrated devices

20180180761

2018-06-28

Security inspection apparatus and method

20170128029

2017-05-11

Simultaneous/single patient position X-ray and proton imaging apparatus and method of use thereof

20160274040

2016-09-22

Method for generating image data relating to an object and particle beam device for carrying out this method

#10

20150030121

2015-01-29

Coordinate measuring apparatus and method for measuring an object

#11

20140140483

2014-05-22

Method for evaluating energy loss, chipping resistance and abrasion resistance of polymeric material

#12

20140037052

2014-02-06

X-ray photoemission microscope for integrated devices

#13

20120275568

2012-11-01

Combining X-ray and VUV analysis of thin film layers

#14

20110103548

2011-05-05

Mobile aircraft inspection system

#15

20080075227

2008-03-27

Coordinate measuring apparatus and method for measuring an object

#16

20070145286

2007-06-28

Single-point measurement of high-Z additives in sheets