SECONDARY EMISSION COMPENSATION IN X-RAY SOURCES

RADIO/MICROWAVE FREQUENCY SENSOR FOR ANALYZING AGRICULTURAL EQUIPMENT

Analysis System, Analysis Method, and Analysis Program

PARTICLE BEAM ANALYZER AND PARTICLE BEAM ANALYSIS METHOD

METHOD FOR EVALUATING SUITABILITY OF NEGATIVE ELECTRODE ACTIVE MATERIAL

CRYSTAL STRUCTURE ANALYSIS METHOD, CRYSTAL STRUCTURE ANALYSIS DEVICE, AND CRYSTAL STRUCTURE ANALYSIS PROGRAM

ELECTROMAGNETIC IMAGING CALIBRATION METHOD

SYSTEM AND PROCESS FOR DETERMINING THE WATER EQUIVALENT CONTENT OF A SNOWPACK

X-ray inspection apparatus and X-ray inspection method

IMPROVEMENTS IN GAMMA-ACTIVATION ANALYSIS MEASUREMENTS

Full beam metrology for x-ray scatterometry systems

Systems and methods of comparative computed tomography (CT) for qualification of commercial grade items

X-ray collimator and related X-ray inspection apparatus

Diffraction device and method for non-destructive testing of internal crystal orientation uniformity of workpiece

Industrial x-ray workpiece measuring system and method for operating same

Characterizing a sample by material basis decomposition

Apparatus and method for analysing and processing granular material

System and method for high-resolution high contrast x-ray ghost diffraction

Apparatus and method for analyzing chemical state of battery material

Period-coded containers with a traceable material composition

Analysis method for fine structure, and apparatus and program thereof

Full beam metrology for x-ray scatterometry systems

Systems and methods of generating physical component qualification data using computed tomography (CT)

Systems and methods of comparative computed tomography (CT) for qualification of commercial grade items

X-ray inspection device

Sorting materials using pattern recognition, such as upgrading nickel laterite ores through electromagnetic sensor-based methods

Encoding information in chemical concentrations

X-ray phase contrast imaging with fourier transform determination of grating displacement

Full beam metrology for X-ray scatterometry systems

System and method for real-time isotope identification

Defect inspection device, display device, and defect classification device

Optical geometry calibration devices, systems, and related methods for three dimensional x-ray imaging

X-ray diffractometer with multilayer reflection-type monochromator

Evaluating system performance with sparse principal component analysis and a test statistic

Sorting materials using pattern recognition, such as upgrading nickel laterite ores through electromagnetic sensor-based methods

Using 3D computed tomography to analyze shaped charge explosives

Characterizing a sample by material basis decomposition

System for detecting counterfeit goods and method of operating the same

Scanning method

Radiometric measuring arrangement and method for detection of accretion formation in a radiometric measuring arrangement

Management system for X-ray detector and X-ray diagnosis apparatus

Apparatus and methods for determination of the half value layer of X-ray beams

Nondestructive identification method and nondestructive identification device

Method and apparatus of tilted illumination observation

X-ray imaging apparatus and method with an X-ray interferometer