ClassID:

169978

G01N2223/3037 - CPC Classification

Classification description:

Investigating materials by wave or particle radiation; Accessories, mechanical or electrical features calibrating, standardising standards (constitution)

Recent Application in this class:
#1
20260118287
2026-04-30

X-RAY DEVICE CALIBRATION

#2
20260110649
2026-04-23

X-RAY FLUORESCENCE SPECTROMETER

#3
20250110070
2025-04-03

EDS CALIBRATION

#4
20250085239
2025-03-13

MASS ESTIMATION METHOD AND X-RAY INSPECTION APPARATUS

#5
20240295512
2024-09-05

METHOD OF DETERMINING HAFNIUM CONTENT IN METALLIC ZIRCONIUM AND ALLOYS BASED THEREON

#6
20240159693
2024-05-16

Target for calibrating and determining the spatial resolution, SNR and/or CNR associated with an XCT system

#7
20240077437
2024-03-07

Monitoring properties of X-ray beam during X-ray analysis

#8
20240003263
2024-01-04

Calibration component for a turbomachine having representative quality indicators

#9
20230417644
2023-12-28

METHOD FOR CLASSIFYING UNKNOWN PARTICLES ON A SURFACE OF A SEMI-CONDUCTOR WAFER

#10
20230366840
2023-11-16

SYSTEM AND METHOD FOR DETERMINING MASS FRACTIONS IN A TEST SAMPLE WITH WAVE-LENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETERS

#11
20230365455
2023-11-16

GLASS COMPOSITION AND METHOD FOR PRODUCING GLASS COMPOSITION

#12
20230204526
2023-06-29

Portable XRF data screening method for heavy metal contaminated soil

#13
20230160843
2023-05-25

METHOD FOR MANUFACTURING REFERENCE PIECE FOR X-RAY MEASUREMENT OF RESIDUAL STRESS AND REFERENCE PIECE FOR X-RAY MEASUREMENT OF RESIDUAL STRESS

#14
20230152248
2023-05-18

Correction amount specifying apparatus, method, program, and jig

#15
20230060446
2023-03-02

Quantitative analysis method, quantitative analysis program, and X-ray fluorescence spectrometer

#16
20220412901
2022-12-29

Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection

#17
20220299455
2022-09-22

METHOD FOR QUANTITATIVELY CHARACTERIZING DENDRITE SEGREGATION AND DENDRITE SPACING OF HIGH-TEMPERATURE ALLOY INGOT

#18
20220260506
2022-08-18

X-ray fluorescence spectrometer

#19
20220065802
2022-03-03

Apparatus for inspecting semiconductor device and method for inspecting semiconductor device

#20
20210033547
2021-02-04

Apparatus and method for analysing and processing granular material

#21
20200393391
2020-12-17

METHOD FOR CALIBRATING A RADIOMETRIC DENSITY MEASURING APPARATUS

#22
20200386696
2020-12-10

Apparatus and method for analyzing chemical state of battery material

#23
20200225173
2020-07-16

X-ray spectrometer and chemical state analysis method using the same

#24
20200158667
2020-05-21

X-ray diffraction and X-ray spectroscopy method and related apparatus

#25
20190049421
2019-02-14

Systems and methods for multivariate analysis using multi-subsystem data

#26
20180059037
2018-03-01

Method of fabricating a reference blade for calibrating tomographic inspection, and a resulting reference blade

#27
20170329037
2017-11-16

Mobile and free-form x-ray imaging systems and methods

#28
20170168172
2017-06-15

Resolution control in X-ray fluorescence spectroscopy systems

#29
20170160257
2017-06-08

Multi-sensor analysis of complex geologic materials

#30
20170153189
2017-06-01

Method and system for analyzing an object by diffractometry using a scattering spectrum and a transmission spectrum

#31
20170108424
2017-04-20

X-ray fluorescence spectrometer and X-ray fluorescence analyzing method

#32
20160320321
2016-11-03

Method for rapid analysis of gold

#33
20160252468
2016-09-01

Detecting gaps between fasteners and openings

#34
20150338262
2015-11-26

Radiometric measuring arrangement and method for detection of accretion formation in a radiometric measuring arrangement

#35
20150198727
2015-07-16

Method of making a standard

#36
20140166936
2014-06-19

Liquid mixture used to test and validate test devices

#37
20140126693
2014-05-08

Method and device for identifying a material by the spectral analysis of electromagnetic radiation passing through said material

#38
20140032131
2014-01-30

Automated EDS standards calibration

#39
20120321045
2012-12-20

Compositions, methods of use and systems for analysis of silicon levels in petroleum materials

#40
20120241611
2012-09-27

Electron microscope

#41
20110012014
2011-01-20

Spectral detector calibration

#42
20100308221
2010-12-09

Calibration standards for electron microscopes and electron column tools

#43
20100288032
2010-11-18

Processes to create discrete corrosion defects on substrates and establish corrosion NDI test standards

#44
20100288031
2010-11-18

Processes to create discrete corrosion defects on substrates and establish corrosion NDI test standards

#45
20090242766
2009-10-01

Transmission electron microscope having electron spectroscope

#46
20090166551
2009-07-02

Systems and methods for reducing a degradation effect on a signal

#47
20080073521
2008-03-27

Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatus

#48
20070220946
2007-09-27

Processes to create discrete corrosion defects on substrates and establish corrosion NDI test standards

#49
18401182
2024-04-09

Ore component analysis device and method

#50
17454865
2024-04-02

System and method for crack detection

#51
17431771
2022-05-10

Methods for detecting stability of X-ray photoelectron spectrometer