169980 ⎘
Investigating materials by wave or particle radiation; Accessories, mechanical or electrical features computer simulations
X-RAY INSPECTION METHOD AND X-RAY INSPECTION APPARATUS
#2Systems and Methods for Elemental Soil Content Determination Utilizing Inelastic Neutron Scattering and Accounting for Moisture Content and Ambient Temperature
#3CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE MEASUREMENTS
#4SYSTEM AND METHOD FOR APPROXIMATING X-RAY INTENSITIES FOR A SAMPLE MEASURED BY AN X-RAY DETECTION SYSTEM
#5NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VIA X-RAY MODELLING BASED ON GROUND TRUTH MEASUREMENTS
#6DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM
#7Analysis System, Analysis Method, and Analysis Program
#8METHODS, SYSTEMS, AND STORAGE MEDIA FOR OBTAINING ENERGY SPECTRA
#9NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF SPECIMENS
#10SPECTRA DELTA METROLOGY
#11PARTICLE BEAM ANALYZER AND PARTICLE BEAM ANALYSIS METHOD
#12METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
#13DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
#14Characterizing and measuring in small boxes using XPS with multiple measurements
#15X-ray spectrometer and pulse height prediction program
#16SYSTEM AND METHOD FOR DETERMINING LOCAL FOCUS POINTS DURING INSPECTION IN A CHARGED PARTICLE SYSTEM
#17NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
#18Methods And Systems For X-Ray Scatterometry Measurements Employing A Machine Learning Based Electromagnetic Response Model
#19SYSTEM AND METHOD FOR PREDICTING THE PRESENCE OF RARE EARTH ELEMENTS
#20Method and system for non-destructive metrology of thin layers
#21X-ray inspection apparatus and X-ray inspection method
#22Characterizing and measuring in small boxes using XPS with multiple measurements
#23INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, NONTRANSITORY COMPUTER READABLE MEDIA STORING PROGRAM, AND X-RAY ANALYSIS APPARATUS
#24Quantitative analysis method, quantitative analysis program, and X-ray fluorescence spectrometer
#25MEASUREMENT DEVICE AND MEASUREMENT METHOD
#26Scan procedure generation systems and methods to generate scan procedures
#27System and method for predicting the presence of rare earth elements
#28Method and system for non-destructive metrology of thin layers
#29Scattering measurement analysis method, scattering measurement analysis device, and non-transitory computer-readable storage medium storing scattering measurement analysis program
#30Sample Component Determination Method, Sample Component Determination Apparatus, Learning Method and Computer Readable Non-transitory Recording Medium
#31FULL-VIEW-FIELD QUANTITATIVE STATISTICAL DISTRIBUTION REPRESENTATION METHOD FOR MICROSTRUCTURES of y' PHASES IN METAL MATERIAL
#32Analysis method for fine structure, and apparatus and program thereof
#33Multi-zone automatic magnetoscop inspection system
#34Method of detecting an anomaly in a single crystal structure
#35Method and system for non-destructive metrology of thin layers
#36Loosely-coupled inspection and metrology system for high-volume production process monitoring
#37Dual scan method for detecting a fibre misalignment in an elongated structure
#38A SYSTEM AND A METHOD FOR COMPOSITIONAL ANALYSIS
#39Methods and systems for real time measurement control
#40Methods for assigning a threat or safe condition to an object in an image
#41Methods for removing a background object from an image
#42Methods for reconstructing an unknown object in a scanned image
#43Methods for assigning attributes to an image of an object scanned with ionizing electromagnetic radiation
#44Methods for extending a range for assigning attributes to an object in an image
#45Method and system for non-destructive metrology of thin layers
#46METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
#47Method of analysing a drill core sample
#48OPERATION GUIDE SYSTEM FOR X-RAY ANALYSIS, OPERATION GUIDE METHOD THEREFOR, AND OPERATION GUIDE PROGRAM THEREFOR
#49Method and apparatus for the inspection of contained materials
#50Digital pore alteration methods and systems
#51X-ray fluorescence spectrometer and program used therein
#52Smart systems and methods for identification and processing of spent lithium cells
#53System and method for crack detection