ClassID:

169980

G01N2223/305 - CPC Classification

Classification description:

Investigating materials by wave or particle radiation; Accessories, mechanical or electrical features computer simulations

Recent Application in this class:
#1
20260133146
2026-05-14

X-RAY INSPECTION METHOD AND X-RAY INSPECTION APPARATUS

#2
20250321216
2025-10-16

Systems and Methods for Elemental Soil Content Determination Utilizing Inelastic Neutron Scattering and Accounting for Moisture Content and Ambient Temperature

#3
20250314487
2025-10-09

CHARACTERIZING AND MEASURING IN SMALL BOXES USING XPS WITH MULTIPLE MEASUREMENTS

#4
20250251356
2025-08-07

SYSTEM AND METHOD FOR APPROXIMATING X-RAY INTENSITIES FOR A SAMPLE MEASURED BY AN X-RAY DETECTION SYSTEM

#5
20250231132
2025-07-17

NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VIA X-RAY MODELLING BASED ON GROUND TRUTH MEASUREMENTS

#6
20250216346
2025-07-03

DETERMINATION OF LAYER PROPERTIES USING WIDENING OF AN ELECTRON BEAM

#7
20250189468
2025-06-12

Analysis System, Analysis Method, and Analysis Program

#8
20250164653
2025-05-22

METHODS, SYSTEMS, AND STORAGE MEDIA FOR OBTAINING ENERGY SPECTRA

#9
20250130185
2025-04-24

NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF SPECIMENS

#10
20250123225
2025-04-17

SPECTRA DELTA METROLOGY

#11
20250067688
2025-02-27

PARTICLE BEAM ANALYZER AND PARTICLE BEAM ANALYSIS METHOD

#12
20250052704
2025-02-13

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

#13
20240410841
2024-12-12

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

#14
20240401940
2024-12-05

Characterizing and measuring in small boxes using XPS with multiple measurements

#15
20240264098
2024-08-08

X-ray spectrometer and pulse height prediction program

#16
20240183806
2024-06-06

SYSTEM AND METHOD FOR DETERMINING LOCAL FOCUS POINTS DURING INSPECTION IN A CHARGED PARTICLE SYSTEM

#17
20240094150
2024-03-21

NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES

#18
20240060914
2024-02-22

Methods And Systems For X-Ray Scatterometry Measurements Employing A Machine Learning Based Electromagnetic Response Model

#19
20240003836
2024-01-04

SYSTEM AND METHOD FOR PREDICTING THE PRESENCE OF RARE EARTH ELEMENTS

#20
20230408430
2023-12-21

Method and system for non-destructive metrology of thin layers

#21
20230366838
2023-11-16

X-ray inspection apparatus and X-ray inspection method

#22
20230288196
2023-09-14

Characterizing and measuring in small boxes using XPS with multiple measurements

#23
20230194443
2023-06-22

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, NONTRANSITORY COMPUTER READABLE MEDIA STORING PROGRAM, AND X-RAY ANALYSIS APPARATUS

#24
20230060446
2023-03-02

Quantitative analysis method, quantitative analysis program, and X-ray fluorescence spectrometer

#25
20230024986
2023-01-26

MEASUREMENT DEVICE AND MEASUREMENT METHOD

#26
20230003671
2023-01-05

Scan procedure generation systems and methods to generate scan procedures

#27
20220252530
2022-08-11

System and method for predicting the presence of rare earth elements

#28
20220074878
2022-03-10

Method and system for non-destructive metrology of thin layers

#29
20210200922
2021-07-01

Scattering measurement analysis method, scattering measurement analysis device, and non-transitory computer-readable storage medium storing scattering measurement analysis program

#30
20210131983
2021-05-06

Sample Component Determination Method, Sample Component Determination Apparatus, Learning Method and Computer Readable Non-transitory Recording Medium

#31
20210033549
2021-02-04

FULL-VIEW-FIELD QUANTITATIVE STATISTICAL DISTRIBUTION REPRESENTATION METHOD FOR MICROSTRUCTURES of y' PHASES IN METAL MATERIAL

#32
20200333267
2020-10-22

Analysis method for fine structure, and apparatus and program thereof

#33
20200300731
2020-09-24

Multi-zone automatic magnetoscop inspection system

#34
20200225171
2020-07-16

Method of detecting an anomaly in a single crystal structure

#35
20200191734
2020-06-18

Method and system for non-destructive metrology of thin layers

#36
20200184372
2020-06-11

Loosely-coupled inspection and metrology system for high-volume production process monitoring

#37
20200158664
2020-05-21

Dual scan method for detecting a fibre misalignment in an elongated structure

#38
20200064281
2020-02-27

A SYSTEM AND A METHOD FOR COMPOSITIONAL ANALYSIS

#39
20190293578
2019-09-26

Methods and systems for real time measurement control

#40
20190219729
2019-07-18

Methods for assigning a threat or safe condition to an object in an image

#41
20190213740
2019-07-11

Methods for removing a background object from an image

#42
20190212465
2019-07-11

Methods for reconstructing an unknown object in a scanned image

#43
20190212279
2019-07-11

Methods for assigning attributes to an image of an object scanned with ionizing electromagnetic radiation

#44
20190212278
2019-07-11

Methods for extending a range for assigning attributes to an object in an image

#45
20180328871
2018-11-15

Method and system for non-destructive metrology of thin layers

#46
20180172609
2018-06-21

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

#47
20170108483
2017-04-20

Method of analysing a drill core sample

#48
20170038315
2017-02-09

OPERATION GUIDE SYSTEM FOR X-RAY ANALYSIS, OPERATION GUIDE METHOD THEREFOR, AND OPERATION GUIDE PROGRAM THEREFOR

#49
20160238543
2016-08-18

Method and apparatus for the inspection of contained materials

#50
20160093094
2016-03-31

Digital pore alteration methods and systems

#51
20090041184
2009-02-12

X-ray fluorescence spectrometer and program used therein

#52
19049826
2026-01-13

Smart systems and methods for identification and processing of spent lithium cells

#53
17454865
2024-04-02

System and method for crack detection