ClassID:

169993

G01N2223/315 - CPC Classification

Classification description:

Investigating materials by wave or particle radiation; Accessories, mechanical or electrical features monochromators

Recent Application in this class:
#1
20250362256
2025-11-27

X-RAY OPTICAL DEVICE AND X-RAY PHOTOELECTRON SPECTROSCOPY

#2
20240280515
2024-08-22

X-ray detector system with at least two stacked flat Bragg diffractors

#3
20230273134
2023-08-31

TRANSMISSION X-RAY DIFFRACTION APPARATUS AND RELATED METHOD

#4
20220357290
2022-11-10

Controlling process parameters by means of radiographic online determination of material properties when producing metallic strips and sheets

#5
20220120561
2022-04-21

X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate

#6
20190227008
2019-07-25

Wavelength dispersive X-ray fluorescence spectrometer

#7
20190196070
2019-06-27

Particle beam device, observation method, and diffraction grating

#8
20190187078
2019-06-20

X-ray detection apparatus and x-ray detection method

#9
20180259464
2018-09-13

High resolution X-ray diffraction method and apparatus

#10
20180011035
2018-01-11

Methods for manufacturing doubly bent X-ray focusing device, doubly bent X-ray focusing device assembly, doubly bent X-ray spectroscopic device and doubly bent X-ray spectroscopic device assembly

#11
20170315067
2017-11-02

Backscatter imaging systems and methods with helical motion

#12
20170234814
2017-08-17

X-ray thin film inspection device

#13
20170199135
2017-07-13

Magnetic measurement system and apparatus utilizing X-ray to measure comparatively thick magnetic materials

#14
20170191950
2017-07-06

X-ray diffractometer with multilayer reflection-type monochromator

#15
20170176356
2017-06-22

X-ray optics assembly with switching system for three beam paths, and associated X-ray diffractometer

#16
20170110212
2017-04-20

Support structure and highly aligned monochromatic X-ray optics for X-ray analysis engines and analyzers

#17
20170097311
2017-04-06

Active, variable sample concentration method and apparatus for sub-ppb measurements and exemplary X-ray analysis applications thereof

#18
20170074809
2017-03-16

X-ray small angle optical system

#19
20170010226
2017-01-12

Beam generation unit and X-ray small-angle scattering apparatus

#20
20160293284
2016-10-06

Metal grating structure for X-ray

#21
20150262722
2015-09-17

XRF system having multiple excitation energy bands in highly aligned package

#22
20150146858
2015-05-28

X-ray topography apparatus

#23
20150011024
2015-01-08

Analysis device, analysis method, film formation device, and film formation method

#24
20140105363
2014-04-17

XRF system having multiple excitation energy bands in highly aligned package

#25
20130287178
2013-10-31

X-ray beam conditioning

#26
20110170666
2011-07-14

XRF system having multiple excitation energy bands in highly aligned package