170001 ⎘
Investigating materials by wave or particle radiation; Accessories, mechanical or electrical features irradiation range monitor, e.g. light beam
Evaluation Method and Analyzer Apparatus
#2ELECTRON BEAM MASK INSPECTION APPARATUS
#3DISTANCE MEASUREMENT DEVICE, RADIOGRAPHY SYSTEM, OPERATION METHOD OF DISTANCE MEASUREMENT DEVICE, AND OPERATION PROGRAM
#4METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE COMPONENTS
#5METHOD FOR AUTOMATICALLY SETTING UP COMPUTED TOMOGRAPHY SCAN PARAMETERS
#6TRANSMISSION X-RAY DIFFRACTION APPARATUS AND RELATED METHOD
#7METHOD FOR QUANTITATIVELY CHARACTERIZING DENDRITE SEGREGATION AND DENDRITE SPACING OF HIGH-TEMPERATURE ALLOY INGOT
#8X-ray imaging device
#9X-ray diffraction measurement method and apparatus
#10Virtual barricade for radiation inspection of predefined paths
#11X-ray beam alignment device and method
#12System and method for correlating object information with X-ray images
#13X-ray fluorescence analyzer and measurement position adjusting method therefore
#14X-ray analyzer
#15Handling misalignment in differential phase contrast imaging
#16Diffraction analysis device and method for full-field x-ray fluorescence imaging analysis