170004 ⎘
Investigating materials by wave or particle radiation; Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object and detector fixed
Methods and systems for acquiring three-dimensional electron diffraction data
#2Method of detecting a defect and apparatus for performing the same
#3Scanning transmission electron microscope and method of image generation
#4Shifting mechanism for dual x-ray tube imaging system
#5Three-dimensional image reconstruction using transmission and scatter radiography methods
#6Imaging apparatus for monitoring objects
#7Dynamic focus adjustment with optical height detection apparatus in electron beam system
#8Dynamic focus adjustment with optical height detection apparatus in electron beam system
#9X-ray inspecting apparatus and X-ray inspecting method
#10Tomosynthesis radiographing apparatus
#11Inspection apparatus and inspection method using electron beam
#12Inspection apparatus and inspection method using electron beam
#13Backscattered electron detector, apparatus of charged-particle beam such as electron microscope comprising the same, and method thereof