TRANSMISSION X-RAY DIFFRACTION APPARATUS AND RELATED METHOD

Device and method for measuring short-wavelength characteristic X-ray diffraction based on array detection

Apparatus for inspecting semiconductor device and method for inspecting semiconductor device

X-ray inspection device

Measurement of crystallite size distribution in polycrystalline materials using two-dimensional X-ray diffraction

Apparatus and method for inducing high-speed variable-tilt wobble motions

Integrated reciprocal space mapping for simultaneous lattice parameter refinement using a two-dimensional X-ray detector

Method of determining surface orientation of single crystal wafer

Apparatus and method for detecting backlash and slip

Method for characterization of a spherically bent crystal for Kα X-ray imaging of laser plasmas using a focusing monochromator geometry