ClassID:

170014

G01N2223/345 - CPC Classification

Classification description:

Investigating materials by wave or particle radiation; Accessories, mechanical or electrical features mathematical transformations on beams or signals, e.g. Fourier

Recent Application in this class:
#1
20260153485
2026-06-04

METHOD FOR DETECTING HALOGENATED ORGANIC SUBSTANCES IN LANDFILL LEACHATE AND POLLUTED WATER THEREOF

#2
20250283841
2025-09-11

MEASUREMENT AND DETERMINATION OF CRYSTALLOGRAPHIC TEXTURE WITH RESPECT TO POSITION

#3
20250277758
2025-09-04

METHOD AND SYSTEM FOR FULL-FIELD QUANTITATIVE X-RAY PHASE NANOTOMOGRAPHY USING SPACE-DOMAIN KRAMERS-KRONIG RELATION

#4
20250137925
2025-05-01

DETECTION AND ANALYSIS METHOD FOR RAPID DELINEATION OF AGING STAGES OF STYRENE-BUTADIENE-STYRENE MODIFIED ASPHALT

#5
20250110070
2025-04-03

EDS CALIBRATION

#6
20230296539
2023-09-21

CORRECTION APPARATUS, SYSTEM, METHOD, AND PROGRAM

#7
20230105649
2023-04-06

DETERMINING WEATHERING INDICES BY X-RAY DIFFRACTION

#8
20210302332
2021-09-30

Determining atomic coordinates from X-ray diffraction data

#9
20210262947
2021-08-26

Method and device for acquiring tomographic image data by oversampling, and control program

#10
20210199592
2021-07-01

System and method for material characterization

#11
20210020272
2021-01-21

CHARACTERISATION OF AMPORPHOUS CONTENT OF COMPLEX FORMULATIONS BASED ON NON-NEGATIVE MATRIX FACTORISATION

#12
20190212273
2019-07-11

System and method for material characterization

#13
20190212272
2019-07-11

System and method for material characterization

#14
20180195981
2018-07-12

Material identification method

#15
20160349196
2016-12-01

Method for evaluating crosslink concentration in crosslinked rubber

#16
20160070021
2016-03-10

Depth determination in X-ray backscatter system using frequency modulated X-ray beam

#17
20140241632
2014-08-28

Imaging apparatus and image processing method

#18
20130028498
2013-01-31

Back-projection of a projection image data set with depth-dependent filtering