ClassID:

170019

G01N2223/402 - CPC Classification

Classification description:

Investigating materials by wave or particle radiation; Imaging mapping distribution of elements

Recent Application in this class:
#1
20260002887
2026-01-01

X-RAY IMAGING APPARATUS

#2
20250321216
2025-10-16

Systems and Methods for Elemental Soil Content Determination Utilizing Inelastic Neutron Scattering and Accounting for Moisture Content and Ambient Temperature

#3
20250208072
2025-06-26

COMPOSITIONAL MAPPING EMPLOYING VARIABLE CHARGED PARTICLE BEAM PARAMETERS FOR IMAGING AND ENERGY-DISPERSIVE X-RAY SPECTROSCOPY

#4
20240044822
2024-02-08

METHOD OF EVALUATING CENTRAL SEGREGATION IN STEEL

#5
20240044813
2024-02-08

Screening system

#6
20240027377
2024-01-25

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

#7
20240003837
2024-01-04

SYSTEM AND METHOD FOR MAPPING CHEMICAL ELEMENTS IN A SAMPLE

#8
20230296540
2023-09-21

COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A DETERMINATION ELEMENT HAVING A SMALL ATOMIC NUMBER, IN PARTICULAR A LI FRACTION, AND CORRESPONDING DEVICE FOR PROCESSING DATA

#9
20230258587
2023-08-17

MATERIAL ANALYSIS WITH MULTIPLE DETECTORS

#10
20230184108
2023-06-15

Detecting downhole fluid composition utilizing photon emission

#11
20230137130
2023-05-04

Phase Analyzer, Sample Analyzer, and Analysis Method

#12
20230083479
2023-03-16

Scatter Diagram Display Device, Scatter Diagram Display Method, and Analyzer

#13
20220317048
2022-10-06

METHOD AND SYSTEM FOR MAPPING ELEMENTAL COMPOSITION IN DYNAMIC AND HETEROGENOUS MATERIAL

#14
20220299455
2022-09-22

METHOD FOR QUANTITATIVELY CHARACTERIZING DENDRITE SEGREGATION AND DENDRITE SPACING OF HIGH-TEMPERATURE ALLOY INGOT

#15
20220260507
2022-08-18

Method and system for analyzing prostate biopsy

#16
20220120178
2022-04-21

Detecting downhole fluid composition utilizing photon emission

#17
20210262953
2021-08-26

Radiation detection device, recording medium, and positioning method

#18
20200393389
2020-12-17

X-ray dosage mitigation for semiconductors and material inspection systems

#19
20200321188
2020-10-08

High speed/low dose multi-objective autonomous scanning materials imaging

#20
20200141841
2020-05-07

Method for measuring distribution of pores in electrode for secondary battery

#21
20200033273
2020-01-30

Photon counting X-ray CT apparatus

#22
20190285609
2019-09-19

Method for estimating abrasion resistance and fracture resistance

#23
20190172681
2019-06-06

X-ray spectroscopy in a charged-particle microscope

#24
20190162679
2019-05-30

Apparatus and method of processing data acquired in x-ray examination, and x-ray examination system equipped with the apparatus

#25
20190006146
2019-01-03

Electron probe microanalyzer and storage medium

#26
20180342087
2018-11-29

Image processing apparatus, surface analyzer, and image processing method

#27
20180328867
2018-11-15

IMPROVED METHOD PTYCHOGRAPHIC DETECTOR MAPPING

#28
20180209922
2018-07-26

Data processing apparatus and data processing method for X-ray examination, and X-ray examination system provided with the data processing apparatus

#29
20180067136
2018-03-08

Method for treating a cancer patient based on atomic therapeutic indexes and non-radiation therapy

#30
20170200290
2017-07-13

Multimodality mineralogy segmentation system and method

#31
20160061754
2016-03-03

Method and system for performing EDS analysis

#32
20160054453
2016-02-25

Photon counting X-ray CT apparatus

#33
20150377805
2015-12-31

Combined handheld XRF and OES systems and methods

#34
20150122992
2015-05-07

Sub-pixel analysis and display of fine grained mineral samples

#35
20150083909
2015-03-26

X-ray analyzer

#36
20150010127
2015-01-08

X-ray device, method, manufacturing method for structure, program, and recording medium on which program is recorded

#37
20140314201
2014-10-23

Methods and apparatuses for measuring effective atomic number of an object

#38
20130240728
2013-09-19

Method and system for improving characteristic peak signals in analytical electron microscopy

#39
20130054153
2013-02-28

METHOD AND APPARATUS FOR MATERIAL ANALYSIS BY A FOCUSED ELECTRON BEAM USING CHARACTERISTIC X-RAYS AND BACK-SCATTERED ELECTRONS

#40
20130015351
2013-01-17

Clustering of multi-modal data

#41
20120177175
2012-07-12

Dual angle radiation scanning of objects

#42
20110116605
2011-05-19

Method and apparatus for inspection of materials

#43
20090274264
2009-11-05

Computed Tomography Systems and Related Methods Involving Localized Bias

#44
20080014643
2008-01-17

Dual angle radiation scanning of objects

#45
20070211853
2007-09-13

Systems and methods for estimating presence of a material within a volume of interest using x-ray

#46
20050111619
2005-05-26

Method and apparatus for target transmitting information about a target object between a prescanner and a CT scanner

#47
20050094765
2005-05-05

Method and apparatus for transmitting information about a target object between a prescanner and a CT scanner

#48
20050053184
2005-03-10

Method and apparatus for transmitting information about a target object between a prescanner and a CT scanner

#49
18107026
2023-10-03

Diffraction analysis device and method for full-field x-ray fluorescence imaging analysis