170019 ⎘
Investigating materials by wave or particle radiation; Imaging mapping distribution of elements
X-RAY IMAGING APPARATUS
#2Systems and Methods for Elemental Soil Content Determination Utilizing Inelastic Neutron Scattering and Accounting for Moisture Content and Ambient Temperature
#3COMPOSITIONAL MAPPING EMPLOYING VARIABLE CHARGED PARTICLE BEAM PARAMETERS FOR IMAGING AND ENERGY-DISPERSIVE X-RAY SPECTROSCOPY
#4METHOD OF EVALUATING CENTRAL SEGREGATION IN STEEL
#5Screening system
#6METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
#7SYSTEM AND METHOD FOR MAPPING CHEMICAL ELEMENTS IN A SAMPLE
#8COMPUTER-ASSISTED METHOD FOR DETERMINING AN ELEMENT FRACTION OF A DETERMINATION ELEMENT HAVING A SMALL ATOMIC NUMBER, IN PARTICULAR A LI FRACTION, AND CORRESPONDING DEVICE FOR PROCESSING DATA
#9MATERIAL ANALYSIS WITH MULTIPLE DETECTORS
#10Detecting downhole fluid composition utilizing photon emission
#11Phase Analyzer, Sample Analyzer, and Analysis Method
#12Scatter Diagram Display Device, Scatter Diagram Display Method, and Analyzer
#13METHOD AND SYSTEM FOR MAPPING ELEMENTAL COMPOSITION IN DYNAMIC AND HETEROGENOUS MATERIAL
#14METHOD FOR QUANTITATIVELY CHARACTERIZING DENDRITE SEGREGATION AND DENDRITE SPACING OF HIGH-TEMPERATURE ALLOY INGOT
#15Method and system for analyzing prostate biopsy
#16Detecting downhole fluid composition utilizing photon emission
#17Radiation detection device, recording medium, and positioning method
#18X-ray dosage mitigation for semiconductors and material inspection systems
#19High speed/low dose multi-objective autonomous scanning materials imaging
#20Method for measuring distribution of pores in electrode for secondary battery
#21Photon counting X-ray CT apparatus
#22Method for estimating abrasion resistance and fracture resistance
#23X-ray spectroscopy in a charged-particle microscope
#24Apparatus and method of processing data acquired in x-ray examination, and x-ray examination system equipped with the apparatus
#25Electron probe microanalyzer and storage medium
#26Image processing apparatus, surface analyzer, and image processing method
#27IMPROVED METHOD PTYCHOGRAPHIC DETECTOR MAPPING
#28Data processing apparatus and data processing method for X-ray examination, and X-ray examination system provided with the data processing apparatus
#29Method for treating a cancer patient based on atomic therapeutic indexes and non-radiation therapy
#30Multimodality mineralogy segmentation system and method
#31Method and system for performing EDS analysis
#32Photon counting X-ray CT apparatus
#33Combined handheld XRF and OES systems and methods
#34Sub-pixel analysis and display of fine grained mineral samples
#35X-ray analyzer
#36X-ray device, method, manufacturing method for structure, program, and recording medium on which program is recorded
#37Methods and apparatuses for measuring effective atomic number of an object
#38Method and system for improving characteristic peak signals in analytical electron microscopy
#39METHOD AND APPARATUS FOR MATERIAL ANALYSIS BY A FOCUSED ELECTRON BEAM USING CHARACTERISTIC X-RAYS AND BACK-SCATTERED ELECTRONS
#40Clustering of multi-modal data
#41Dual angle radiation scanning of objects
#42Method and apparatus for inspection of materials
#43Computed Tomography Systems and Related Methods Involving Localized Bias
#44Dual angle radiation scanning of objects
#45Systems and methods for estimating presence of a material within a volume of interest using x-ray
#46Method and apparatus for target transmitting information about a target object between a prescanner and a CT scanner
#47Method and apparatus for transmitting information about a target object between a prescanner and a CT scanner
#48Method and apparatus for transmitting information about a target object between a prescanner and a CT scanner
#49Diffraction analysis device and method for full-field x-ray fluorescence imaging analysis